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Designing an optimal wiring topology for electromigration avoidance

dc.citation.patentcountryUSAzh_TW
dc.citation.patentnumber08402420zh_TW
dc.contributor.authorJiang Hui-Ruen_US
dc.contributor.authorChang Hua-Yuen_US
dc.contributor.authorChang Chih-Longen_US
dc.date.accessioned2014-12-16T06:14:03Z
dc.date.available2014-12-16T06:14:03Z
dc.date.issued2013-03-19en_US
dc.description.abstractA method for designing an optimal wiring topology for electromigration avoidance is disclosed. The wiring topology includes multiple sources, multiple sinks and multiple wires. The method includes the following steps: A feasible wire, a wire of the shortest length connecting each pair of source and sink, is calculated, and the capacity of each feasible wire is decided. An initial feasible topology is found. A flow network is created based on the initial topology. Negative cycles are iteratively checked and removed until no more negative cycles.zh_TW
dc.identifier.govdocG06F017/50zh_TW
dc.identifier.govdocG06F011/22zh_TW
dc.identifier.govdocG06F009/455zh_TW
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/104497
dc.language.isozh_TWen_US
dc.titleDesigning an optimal wiring topology for electromigration avoidancezh_TW
dc.typePatentsen_US

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