Development of dielectric composite with X7R characteristic

dc.citation.epage	314	en_US
dc.citation.spage	311	en_US
dc.contributor.author	Lee, WH	en_US
dc.contributor.author	Ou, KH	en_US
dc.contributor.author	Tsai, TL	en_US
dc.contributor.department	電子工程學系及電子研究所	zh_TW
dc.contributor.department	Department of Electronics Engineering and Institute of Electronics	en_US
dc.date.accessioned	2014-12-08T15:26:53Z
dc.date.available	2014-12-08T15:26:53Z
dc.date.issued	2001	en_US
dc.description.abstract	A dielectric composite having K-value in excess of 10000 with Y5R characteristics (-55 similar to +125 degreesC, +/- 15%) has been successfully developed which in corporate two (Ba, Ca)(Ti,Zr)O-3-based ceramic with different Curie temperature as the principal components. A stacking alternately technique during screen printing and a usual cofiring with inner electrode technique are utilised to prepared this kind of multilayer product. In this study, it is determined that a proportion of high-T-c and low T-c materials and location of their Curie temperature could control and improve the change of the dielectric constant (K) over a temperature range from -55 to +125 degreesC.	en_US
dc.identifier.isbn	3-540-67318-0	en_US
dc.identifier.journal	PROCEEDINGS OF THE FIRST CHINA INTERNATIONAL CONFERENCE ON HIGH-PERFORMANCE CERAMICS	en_US
dc.identifier.uri	https://ir.lib.nycu.edu.tw/handle/11536/19120
dc.identifier.wosnumber	WOS:000171631000079
dc.language.iso	en_US	en_US
dc.title	Development of dielectric composite with X7R characteristic	en_US
dc.type	Proceedings Paper	en_US

Files

Now showing 1 - 1 of 1