Evaluation of the operation for the shift register circuit implemented by low temperature poly-Si thin-film transistors
| dc.citation.epage | 455 | en_US |
| dc.citation.spage | 453 | en_US |
| dc.contributor.author | Liou, Hung-Guang | en_US |
| dc.contributor.author | Tai, Ya-Hsiang | en_US |
| dc.contributor.department | 光電工程學系 | zh_TW |
| dc.contributor.department | Department of Photonics | en_US |
| dc.date.accessioned | 2014-12-08T15:25:30Z | |
| dc.date.available | 2014-12-08T15:25:30Z | |
| dc.date.issued | 2005 | en_US |
| dc.description.abstract | In this paper, the LTPS TFT shift register circuit is simulated with Monte Carlo method to evaluate the effects due to the non-uniformity in the LTPS TFT characteristics. A computationally efficient method has been presented for the estimation of the power distribution and the yield in the presence of device variations. | en_US |
| dc.identifier.isbn | 978-957-28522-2-4 | en_US |
| dc.identifier.journal | IDMC 05: PROCEEDINGS OF THE INTERNATIONAL DISPLAY MANUFACTURING CONFERENCE 2005 | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/17902 | |
| dc.identifier.wosnumber | WOS:000259399200122 | |
| dc.language.iso | en_US | en_US |
| dc.title | Evaluation of the operation for the shift register circuit implemented by low temperature poly-Si thin-film transistors | en_US |
| dc.type | Proceedings Paper | en_US |
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