METHOD FOR ANALYZING AND SEARCHING 3D MODELS
| dc.citation.patentcountry | USA | en_US |
| dc.citation.patentnumber | 20170147609 | en_US |
| dc.contributor.author | I-Chen LIN | en_US |
| dc.contributor.author | Jun-Yang LIN | en_US |
| dc.contributor.author | Mei-Fang SHE | en_US |
| dc.contributor.author | Wen-Hsiang TSAI | en_US |
| dc.date.accessioned | 2019-04-11T05:42:44Z | |
| dc.date.available | 2019-04-11T05:42:44Z | |
| dc.date.issued | 2017-05-25 | en_US |
| dc.description.abstract | A method for analyzing and searching 3D models includes steps of obtaining data global features and data local features of data images by globally analyzing and locally analyzing data images of 3D models respectively; obtaining searching global features and searching local features by globally analyzing and locally analyzing searching images respectively; obtaining corresponding data global features and corresponding data local features based on the search global features and the searching local feature; and obtaining corresponding data images based on the corresponding data global features and the corresponding data local features. | en_US |
| dc.identifier.govdoc | G06F017/30 | en_US |
| dc.identifier.govdoc | G06K009/52 | en_US |
| dc.identifier.govdoc | G06K009/46 | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/151277 | |
| dc.language.iso | en_US | en_US |
| dc.title | METHOD FOR ANALYZING AND SEARCHING 3D MODELS | en_US |
| dc.type | Patents | en_US |