Failure analysis of a MEMS micro-injector printing head
| dc.citation.epage | + | en_US |
| dc.citation.spage | 112 | en_US |
| dc.citation.woscount | 0 | en_US |
| dc.contributor.author | Lee, In-Yao | en_US |
| dc.contributor.author | Hsu, Tsung-Ping | en_US |
| dc.contributor.author | Wang, Wai W. | en_US |
| dc.contributor.author | Chiu, Yi | en_US |
| dc.contributor.author | Tang, Hua-Kun | en_US |
| dc.contributor.author | Tseng, Fan-Chung | en_US |
| dc.contributor.author | Lee, Kelvin | en_US |
| dc.contributor.department | 電控工程研究所 | zh_TW |
| dc.contributor.department | Institute of Electrical and Control Engineering | en_US |
| dc.date.accessioned | 2017-04-21T06:49:06Z | |
| dc.date.available | 2017-04-21T06:49:06Z | |
| dc.date.issued | 2007 | en_US |
| dc.identifier.isbn | 978-1-4244-1014-9 | en_US |
| dc.identifier.journal | IPFA 2007: PROCEEDINGS OF THE 14TH INTERNATIONAL SYMPOSIUM ON THE PHYSICAL & FAILURE ANALYSIS OF INTEGRATED CIRCUITS | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/135666 | |
| dc.identifier.wosnumber | WOS:000251130700021 | en_US |
| dc.language.iso | en_US | en_US |
| dc.title | Failure analysis of a MEMS micro-injector printing head | en_US |
| dc.type | Proceedings Paper | en_US |
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