An efficient test and diagnosis scheme for the feedback type of analog circuits with minimal added circuits
| dc.citation.epage | 1119 | en_US |
| dc.citation.spage | 1119 | en_US |
| dc.contributor.author | Lin, JW | en_US |
| dc.contributor.author | Lee, CL | en_US |
| dc.contributor.author | Chen, JE | en_US |
| dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
| dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
| dc.date.accessioned | 2014-12-08T15:26:33Z | |
| dc.date.available | 2014-12-08T15:26:33Z | |
| dc.date.issued | 2002 | en_US |
| dc.identifier.isbn | 0-7695-1472-3 | en_US |
| dc.identifier.journal | DESIGN, AUTOMATION AND TEST IN EUROPE CONFERENCE AND EXHIBITION, 2002 PROCEEDINGS | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/18846 | |
| dc.identifier.wosnumber | WOS:000176953300206 | |
| dc.language.iso | en_US | en_US |
| dc.title | An efficient test and diagnosis scheme for the feedback type of analog circuits with minimal added circuits | en_US |
| dc.type | Proceedings Paper | en_US |
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