A fast and sensitive built-in current sensor for IDDQ testing
| dc.citation.epage | 58 | en_US |
| dc.citation.spage | 56 | en_US |
| dc.contributor.author | Lu, CW | en_US |
| dc.contributor.author | Lee, CL | en_US |
| dc.contributor.author | Chen, JE | en_US |
| dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
| dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
| dc.date.accessioned | 2014-12-08T15:27:37Z | |
| dc.date.available | 2014-12-08T15:27:37Z | |
| dc.date.issued | 1996 | en_US |
| dc.identifier.isbn | 0-8186-7655-8 | en_US |
| dc.identifier.journal | 1996 IEEE INTERNATIONAL WORKSHOP ON IDDQ TESTING, DIGEST OF PAPERS | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/19867 | |
| dc.identifier.wosnumber | WOS:A1996BG63C00011 | |
| dc.language.iso | en_US | en_US |
| dc.title | A fast and sensitive built-in current sensor for IDDQ testing | en_US |
| dc.type | Proceedings Paper | en_US |
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