Simultaneous two-dimensional nanometric-scale position monitoring by probing a two-dimensional photonic crystal plate
| dc.citation.epage | 0 | en_US |
| dc.citation.spage | 0 | en_US |
| dc.citation.volume | 7609 | en_US |
| dc.citation.woscount | 0 | en_US |
| dc.contributor.author | Hsu, Kuei-Chu | en_US |
| dc.contributor.author | Chen, Chii-Chang | en_US |
| dc.contributor.author | Chan, Chia-Hua | en_US |
| dc.contributor.author | Chung, Pei-Fang | en_US |
| dc.contributor.author | Lai, Yinchieh | en_US |
| dc.contributor.department | 光電工程學系 | zh_TW |
| dc.contributor.department | Department of Photonics | en_US |
| dc.date.accessioned | 2019-04-03T06:47:44Z | |
| dc.date.available | 2019-04-03T06:47:44Z | |
| dc.date.issued | 2010-01-01 | en_US |
| dc.description.abstract | Simultaneous two-dimensional nanometric-scale position monitoring can be achieved in a simple interferometric setup by real-time probing a hexagonal photonic crystal glass substrate. The minimum detectable translational movement is determined by the period of photonic crystal array, and can be as high as 8 nm in the present work. | en_US |
| dc.identifier.doi | 10.1117/12.839187 | en_US |
| dc.identifier.isbn | 978-0-8194-8005-7 | en_US |
| dc.identifier.issn | 0277-786X | en_US |
| dc.identifier.journal | PHOTONIC AND PHONONIC CRYSTAL MATERIALS AND DEVICES X | en_US |
| dc.identifier.uri | http://dx.doi.org/10.1117/12.839187 | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/146274 | |
| dc.identifier.wosnumber | WOS:000283790200031 | en_US |
| dc.language.iso | en_US | en_US |
| dc.subject | Times Roman | en_US |
| dc.subject | image area | en_US |
| dc.subject | acronyms | en_US |
| dc.subject | references | en_US |
| dc.title | Simultaneous two-dimensional nanometric-scale position monitoring by probing a two-dimensional photonic crystal plate | en_US |
| dc.type | Proceedings Paper | en_US |