Fast full-wave characterization of arbitrary planar microstrip geometries
| dc.citation.epage | 688 | en_US |
| dc.citation.spage | 685 | en_US |
| dc.contributor.author | Hsieh, RC | en_US |
| dc.contributor.author | Kuo, JT | en_US |
| dc.contributor.department | 電信工程研究所 | zh_TW |
| dc.contributor.department | Institute of Communications Engineering | en_US |
| dc.date.accessioned | 2014-12-08T15:27:29Z | |
| dc.date.available | 2014-12-08T15:27:29Z | |
| dc.date.issued | 1997 | en_US |
| dc.description.abstract | A very fast computation method is proposed for the mixed potential integral equation (MPIE) analysis of microstrip elements in a multilayered medium. The fast Hankel transform (FHT) algorithm is employed in this method to calculate the spatial-domain Green's function. Calculated results for some microstrip filters are compared with measurements. | en_US |
| dc.identifier.isbn | 962-442-117-X | en_US |
| dc.identifier.journal | 1997 ASIA-PACIFIC MICROWAVE CONFERENCE PROCEEDINGS, VOLS I-III | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/19753 | |
| dc.identifier.wosnumber | WOS:000072506400170 | |
| dc.language.iso | en_US | en_US |
| dc.title | Fast full-wave characterization of arbitrary planar microstrip geometries | en_US |
| dc.type | Proceedings Paper | en_US |
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