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新式結構與高介電常數閘極介電層在複晶矽薄膜電晶體之應用(II)

dc.contributor.author雷添福en_US
dc.contributor.authorLEI TAN-FUen_US
dc.contributor.department國立交通大學電子工程學系及電子研究所zh_TW
dc.date.accessioned2014-12-13T10:48:43Z
dc.date.available2014-12-13T10:48:43Z
dc.date.issued2009en_US
dc.description.sponsorship行政院國家科學委員會zh_TW
dc.identifier.govdocNSC98-2221-E009-004zh_TW
dc.identifier.urihttps://www.grb.gov.tw/search/planDetail?id=1902016&docId=315104en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/101429
dc.language.isozh_TWen_US
dc.title新式結構與高介電常數閘極介電層在複晶矽薄膜電晶體之應用(II)zh_TW
dc.titleThe Study of New Structure and High-K Gate Dielectric for Poly-Si TFTs Application(II)en_US
dc.typePlanen_US

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