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氮化鎵電晶體的製作方法

dc.citation.patentcountryTWNzh_TW
dc.citation.patentnumber201220405zh_TW
dc.contributor.author張翼en_US
dc.contributor.author張嘉華en_US
dc.contributor.author林岳欽en_US
dc.date.accessioned2014-12-16T06:12:08Z
dc.date.available2014-12-16T06:12:08Z
dc.date.issued2012-05-16en_US
dc.description.abstract本發明提供一種氮化鎵電晶體的製作方法,包含一準備步驟、一開口形成步驟、一離子佈値步驟、一介電層形成步驟、一源/汲極沉積步驟,及一閘極沉積步驟,首先準備一含N型氮化鎵系半導體材料的半導體磊晶層,於該半導體磊晶層上形成一定義出一開口的遮覆層,接著對該半導體磊晶層進行P型離子佈値,於該半導體磊晶層形成一摻雜區,再於該半導體磊晶層表面沉積一層由高介電常數材料構成的介電層,之後於該半導體磊晶層表面對應該摻雜區兩側形成一源極及一汲極,再於對應該摻雜區上方的介電層表面形成一閘極,即可完成該氮化鎵電晶體的製作。zh_TW
dc.identifier.govdocH01L021/335zh_TW
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/103452
dc.language.isozh_TWen_US
dc.title氮化鎵電晶體的製作方法zh_TW
dc.typePatentsen_US

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