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I/O clustering in design cost and performance optimization for flip-chip design

dc.citation.epage567en_US
dc.citation.spage562en_US
dc.contributor.authorChen, HMen_US
dc.contributor.authorLiu, IMen_US
dc.contributor.authorWong, MDFen_US
dc.contributor.authorShao, MZen_US
dc.contributor.authorHuang, LDen_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.date.accessioned2014-12-08T15:25:42Z
dc.date.available2014-12-08T15:25:42Z
dc.date.issued2004en_US
dc.description.abstractI/O placement has always been a concern in modern IC design. Due to flip-chip technology, I/O can be placed throughout the whole chip without long wires from the periphery of the chip. However, because of I/O placement constraints in design cost and performance, I/O buffer planning becomes a pressing problem. During the early stages of circuits and packaging co-design, I/O layout should be evaluated to optimize design cost and to avoid product failures. In this paper, our objective is to better an existing/initial standard cell placement by I/O clustering, considering design cost reduction and signal integrity preservation. We formulate it as a minimum cost flow problem minimizing alphaW + betaD, where W is the I/O wirelength of the placement and D is the total voltage drop in the power network. The experimental results on some MCNC benchmarks show that our method achieves better timing performance and averagely over 30% design cost reduction when compared with the conventional design rule of thumb popularly used by circuit designers.en_US
dc.identifier.isbn0-7695-2231-9en_US
dc.identifier.issn1063-6404en_US
dc.identifier.journalIEEE INTERNATIONAL CONFERENCE ON COMPUTER DESIGN: VLSI IN COMPUTERS & PROCESSORS, PROCEEDINGSen_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/18123
dc.identifier.wosnumberWOS:000225189200091
dc.language.isoen_USen_US
dc.titleI/O clustering in design cost and performance optimization for flip-chip designen_US
dc.typeProceedings Paperen_US

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