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DESIGN FOR DIAGNOSABILITY AND DIAGNOSTIC STRATEGIES OF WSI ARRAY ARCHITECTURES

dc.citation.epage217en_US
dc.citation.spage208en_US
dc.contributor.authorWANG, KCen_US
dc.contributor.authorTSENG, WDen_US
dc.contributor.department資訊工程學系zh_TW
dc.contributor.departmentDepartment of Computer Scienceen_US
dc.date.accessioned2014-12-08T15:27:51Z
dc.date.available2014-12-08T15:27:51Z
dc.date.issued1994en_US
dc.identifier.isbn0-7803-1849-8en_US
dc.identifier.issn1063-2204en_US
dc.identifier.journalINTERNATIONAL CONFERENCE ON WAFER SCALE INTEGRATION: IEEE 1994 PROCEEDINGS SIXTH ANNUALen_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/20107
dc.identifier.wosnumberWOS:A1994BA36U00020
dc.language.isoen_USen_US
dc.titleDESIGN FOR DIAGNOSABILITY AND DIAGNOSTIC STRATEGIES OF WSI ARRAY ARCHITECTURESen_US
dc.typeProceedings Paperen_US

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