1 |
Hyperhomocysteinemia in Patients with Polypoidal Choroidal Vasculopathy: A Case Control Study |
2014-10-22 |
2 |
Conductivity enhancement of multiwalled carbon nanotube thin film via thermal compression method |
2014-08-29 |
3 |
Functionalized Carbon Nanotube Thin Films as the pH Sensing Membranes of Extended-Gate Field-Effect Transistors on the Flexible Substrates |
2014-07-01 |
4 |
Planar junctionless poly-Si thin-film transistors with single gate and double gate |
2014-06-01 |
5 |
A Novel Control Strategy of Circulating Currents in Paralleled Single-Phase Boost Converters With Different Power Sharing for Microgrid Applications |
2014-03-01 |
6 |
Enhanced efficiency of the dye-sensitized solar cells by excimer laser irradiated carbon nanotube network counter electrode |
2014-02-03 |
7 |
Superior bipolar resistive switching characteristics of Cu-TiO2 based RRAM cells |
2014-01-01 |
8 |
Laser-unzipped carbon nanotube based glucose sensor for separated structure of enzyme modified field effect transistor |
2013-12-15 |
9 |
Improving the stability and reproducibility of the carbon nanotube gas ionization sensor by Co-Ti/Ti co-deposited catalyst layer |
2013-12-01 |
10 |
Low repetition rate and broad frequency tuning from a grating-coupled passively mode-locked quantum dot laser |
2013-11-18 |
11 |
Investigation of quantum dot passively mode-locked lasers with excited-state transition |
2013-11-04 |
12 |
High-Performance Programmable Metallization Cell Memory With the Pyramid-Structured Electrode |
2013-10-01 |
13 |
Oxygen Plasma Functionalized Multiwalled Carbon Nanotube Thin Film as A pH Sensing Membrane of Extended-Gate Field-Effect Transistor |
2013-10-01 |
14 |
High-performance resistive switching characteristics of programmable metallization cell with oxidized Cu-Ti electrodes |
2013-09-30 |
15 |
Pillar Height Dependence of Field-Emission Properties in an Array of Carbon Nanotube Pillars |
2013-08-01 |
16 |
Effects of crystallization mechanism on the electrical characteristics of green continuous-wave-laser-crystallized polycrystalline silicon thin film transistors |
2013-07-29 |
17 |
Effect of arrangement of carbon nanotube pillars on its gas ionization characteristics |
2013-06-01 |
18 |
The mechanism of the surface morphology transformation for the carbon nanotube thin film irradiated via excimer laser |
2013-05-06 |
19 |
Short-Term External Buckling With Pneumatic Retinopexy for Retinal Detachment With Inferior Retinal Breaks |
2013-04-01 |
20 |
Coaxial-structured ZnO/silicon nanowires extended-gate field-effect transistor as pH sensor |
2013-02-01 |
21 |
High-performance polycrystalline silicon thin-film transistors prepared via the laser crystallization of the prepatterned channel layer on the bottom-gate structure |
2013-02-01 |
22 |
A novel technique to fabricate 28 nm p-MOSFETs possessing gate oxide integrity on an embedded SiGe channel without silicon surface passivation |
2012-12-12 |
23 |
High-Performance Polycrystalline-Silicon Nanowire Thin-Film Transistors With Location-Controlled Grain Boundary via Excimer Laser Crystallization |
2012-11-01 |
24 |
A Novel pH Sensor of Extended-Gate Field-Effect Transistors With Laser-Irradiated Carbon-Nanotube Network |
2012-11-01 |
25 |
High-performance vertically stacked bottom-gate and top-gate polycrystalline silicon thin-film transistors for three-dimensional integrated circuits |
2012-11-01 |
26 |
An Extended-Gate Field-Effect Transistor With Low-Temperature Hydrothermally Synthesized SnO2 Nanorods as pH Sensor |
2012-10-01 |
27 |
High Sensitivity of Dry-Type Nanowire Sensors With High-k Dielectrics for pH Detection via Capillary Atomic Force Microscope Tip Coating Technique |
2012-09-01 |
28 |
A Novel Polysilicon Field-Enhanced Nanowire Thin-Film Transistor with the TiN-Hafnia-Nitride-Vacuum-Silicon (THNVAS) Structure for Nonvolatile Memory Applications |
2012-07-01 |
29 |
High-Performance Bottom-Gate Poly-Si Polysilicon-Oxide-Nitride-Oxide-Silicon Thin Film Transistors Crystallized by Excimer Laser Irradiation for Two-Bit Nonvolatile Memory Applications |
2012-07-01 |
30 |
The pH Sensing Characteristics of the Extended-Gate Field-Effect Transistors of Multi-Walled Carbon-Nanotube Thin Film Using Low-Temperature Ultrasonic Spray Method |
2012-07-01 |
31 |
High-Performance Polycrystalline Silicon Thin-Film Transistors with Two-Dimensional Location Control of the Grain Boundary via Excimer Laser Crystallization |
2012-07-01 |
32 |
Effect of the Annealing Ambient on the Electrical Characteristics of the Amorphous InGaZnO Thin Film Transistors |
2012-07-01 |
33 |
Field Emission Properties of Carbon Nanotube Arrays on the Thickness-Controlled Flexible Substrate by the Pattern Transfer Process |
2012-07-01 |
34 |
High-Performance ZnO Thin-Film Transistors with Location-Controlled Crystal Grains Fabricated by Low-Temperature Hydrothermal Method |
2012-07-01 |
35 |
Memory characteristics of laser-crystallized polycrystalline-silicon silicon-oxide-nitride-oxide-silicon thin-film transistor with location-controlled grain boundary perpendicular to the channel |
2012-06-11 |
36 |
A Novel Scheme for Fabricating CMOS Inverters With Poly-Si Nanowire Channels |
2012-06-01 |
37 |
High-Performance Excimer-Laser-Crystallized Polycrystalline Silicon Thin-Film Transistors with the Pre-Patterned Recessed Channel |
2012-06-01 |
38 |
Reliability improvement of InGaZnO thin film transistors encapsulated under nitrogen ambient |
2012-04-09 |
39 |
A Novel SONOS Memory With Recessed-Channel Poly-Si TFT via Excimer Laser Crystallization |
2012-04-01 |
40 |
Gate-all-around polycrystalline-silicon thin-film transistors with self-aligned grain-growth nanowire channels |
2012-02-27 |
41 |
Low threshold current and widely tunable external cavity lasers with chirped multilayer InAs/InGaAs/GaAs quantum-dot structure |
2012-02-13 |
42 |
Analysis of Relative Intensity Noise Spectra for Uniformly and Chirpily Stacked InAs-InGaAs-GaAs Quantum Dot Lasers |
2012-02-01 |
43 |
Field-Emission Characteristics of Zinc Oxide Nanowires Using Low-Temperature Supercritical Carbon Dioxide Fluid Method |
2012-01-01 |
44 |
The Strained-SiGe Relaxation Induced Underlying Si Defects Following the Millisecond Annealing for the 32 nm PMOSFETs |
2012-01-01 |
45 |
The Boundary of a WTO Member's Obligation to Comply with Art. 31(f) of the TRIPS Agreement - A Critical Review of Granting a Compulsory License on Philips CD-R Patents by Taiwan |
2012-01-01 |
46 |
pH Sensing Characteristics of Extended-Gate Field-Effect Transistor Based on Al-Doped ZnO Nanostructures Hydrothermally Synthesized at Low Temperatures |
2011-11-01 |
47 |
Gate-All-Around Poly-Si TFTs With Single-Crystal-Like Nanowire Channels |
2011-09-01 |
48 |
Novel Dielectric-Engineered Trapping-Charge Poly-Si-TFT Memory With a TiN-Alumina-Nitride-Vacuum-Silicon Structure |
2011-08-01 |
49 |
The Effects of Nanometal-Induced Crystallization on the Electrical Characteristics of Bottom-Gate Poly-Si Thin-Film Transistors |
2011-07-01 |
50 |
Effect of Oxygen Annealing on the Ultraviolet Photoresponse of p-NiO-Nanoflower/n-ZnO-Nanowire Heterostructures |
2011-07-01 |
51 |
Field-Emission Characteristics of Al-Doped ZnO Nanostructures Hydrothermally Synthesized at Low Temperature |
2011-07-01 |
52 |
Passivation-Induced Subthreshold Kink Effect of Ultrathin-Oxide Low-Temperature Polycrystalline Silicon Thin Film Transistors |
2011-07-01 |
53 |
A Novel Coaxial-Structured Amorphous-Silicon p-i-n Solar Cell With Al-Doped ZnO Nanowires |
2011-07-01 |
54 |
High Field-Emission Stability of Offset-Thin-Film Transistor-Controlled Al-Doped Zinc Oxide Nanowires |
2011-04-01 |
55 |
Zinc Oxide Thin-Film Transistors with Location-Controlled Crystal Grains Fabricated by Low-Temperature Hydrothermal Method |
2011-04-01 |
56 |
Photoresponse of hydrothermally grown lateral ZnO nanowires |
2010-10-01 |
57 |
Study of ultra-shallow p(+)n junctions formed by excimer laser annealing |
2010-09-01 |
58 |
Field emission characteristics of carbon nanotubes post-treated with high-density Ar plasma |
2010-01-15 |
59 |
The evolutionary process and collaboration in supply chains |
2010-01-01 |
60 |
A New Charge-Trap-Engineered Memory Device with Silicon-Oxide-Nitride-Vacuum-Silicon (SONVAS) Structure for LTPS-TFT-Based Applications |
2010-01-01 |
61 |
Self-patterning of high-performance thin film transistors |
2009-08-01 |
62 |
High oriented ZnO films by sol-gel and chemical bath deposition combination method |
2009-05-05 |
63 |
Fabrication of Novel Three-Step Drift-Doped Low-Temperature Polycrystalline Silicon Lateral Double-Diffusion Metal-Oxide-Semiconductor Using Excimer Laser Crystallization |
2009-03-01 |
64 |
A Novel LTPS-TFT-Based Charge-Trapping Memory Device with Field-Enhanced Nanowire Structure |
2009-01-01 |
65 |
Effect of Sn-doped on microstructural and optical properties of ZnO thin films deposited by sol-gel method |
2008-12-01 |
66 |
Novel gate-all-around poly-Si TFTs with multiple nanowire channels |
2008-08-01 |
67 |
Formation of thin-film transistors with a polycrystalline hetero-structure channel layer |
2008-08-01 |
68 |
Ferroelectricity and negative temperature coefficient of resistance in pulsed-laser-deposited (Pb, Sr) TiO(3) films |
2008-04-21 |
69 |
Structural and electrical investigation of laser annealed (Pb,Sr)TiO3 thin films |
2008-01-01 |
70 |
Carbon-nanotube-based field emission devices with a self-focusing gate structure |
2008-01-01 |
71 |
臺灣科技產業運用中國涉外仲裁機制之策略研究 |
2008 |
72 |
Polycrystalline silicon thin-film transistors with location-controlled crystal grains fabricated by excimer laser crystallization |
2007-11-12 |
73 |
High-performance short-channel double-gate low-temperature polysilicon thin-film transistors using excimer laser crystallization |
2007-11-01 |
74 |
A quasi-planar thin film field emission diode |
2007-11-01 |
75 |
Crystallinity and electrical properties of (Pb,Sr)TiO3 films enhanced by laser-assisted low-thermal-budget annealing |
2007-10-01 |
76 |
Dependence of ferroelectric characteristics on the deposition temperature of (Pb,Sr)TiO3 films |
2007-10-01 |
77 |
Effects of accumulated laser pulses on (Pb,Sr)TiO(3) films post-excimer laser annealed at low temperatures |
2007-08-01 |
78 |
The reliability improvements of carbon nanotubes emitters by utilizing an Fe-Ti codeposited catalyst |
2007-08-01 |
79 |
Cation-mediated effects on zinc oxide films formed by chemical bath deposition |
2007-07-01 |
80 |
Growth and field emission characteristics of carbon nanotubes using Co/Cr/Al multilayer catalyst |
2007-07-01 |
81 |
High-performance self-aligned bottom-gate low-temperature poly-silicon thin-film transistors with excimer laser crystallization |
2007-07-01 |
82 |
Investigation of source-follower type analog buffer using low temperature poly-Si TFTs |
2007-03-01 |
83 |
Wavelength switching transition in quantum dot lasers |
2007-02-19 |
84 |
Field emission improvement through structure of intermixture of long and short carbon nanotubes |
2007-02-01 |
85 |
Improvement of luminescent uniformity via synthesizing the carbon nanotubes on a Fe-TiCo-deposited catalytic layer |
2007-02-01 |
86 |
Characteristics of low-temperature pulse-laser-deposited (Pb,Sr)TiO3 films in metal/ferroelectric/silicon structure |
2007-01-07 |
87 |
Study on carbon nanotubes synthesized at low temperatures using multilayerd catalytic films |
2007-01-01 |
88 |
Pillar-shaped carbon nanotubes by Ti-Fe codeposition |
2007-01-01 |
89 |
Transparent ZnO thin film transistor fabricated by sol-gel and chemical bath deposition combination method |
2007-01-01 |
90 |
Polarization degradation and breakdown of pulse-laser-deposited (Pb,Sr)TiO3 films at low temperatures |
2007-01-01 |
91 |
Periodically lateral silicon grains fabricated by excimer laser irradiation with a-Si spacers for LTPS TFTs |
2007-01-01 |
92 |
Structural and electrical investigations of pulse-laser-deposited (Pb,Sr)TiO3 films at various oxygen partial pressures |
2007-01-01 |
93 |
Properties of carbon nanotubes via a thin Ti capping layer on the pretreated catalyst |
2007-01-01 |
94 |
Study on fatigue and breakdown properties of Pt/(Pb,Sr)TiO3/Pt capacitors |
2006-11-22 |
95 |
Threshold-voltage-compensation methods for AMOLED pixel and analog buffer circuits |
2006-09-01 |
96 |
New pixel circuits for driving active matrix organic light emitting diodes |
2006-02-01 |
97 |
A poly-Si thin-film transistor with the in situ vacuum gaps under the T-shaped-gated electrode |
2006-01-01 |
98 |
A source-follower type analog buffer using poly-Si TFTs with large design windows |
2005-11-01 |
99 |
A New Pixel Circuit for Driving Organic Light-Emitting Diode With Low Temperature Polycrystalline Silicon Thin-Film Transistors |
2005-09-01 |
100 |
Fabrication and characterization of lateral field emission device based on carbon nanotubes |
2005-04-01 |
101 |
Improved field-emission properties of carbon nanotube field-emission arrays by controlled density growth,of carbon nanotubes |
2005-01-01 |
102 |
High-performance poly-Si thin film transistors crystallized by excimer laser irradiation with a-Si spacer structure |
2005-01-01 |
103 |
Growth and characterization of tungsten carbide nanowires by thermal annealing of sputter-deposited WCx films |
2004-09-20 |
104 |
Fabrication of trench-gate power MOSFETs by using a dual doped body region |
2004-07-01 |
105 |
Investigation of a 450 V rating silicon-on-insulator lateral-double-diffused-metal-oxide-semiconductor fabrication by 12/25/5/40 V bipolar-complementary metal-oxide-semiconductor double-diffused metal-oxide-semiconductor process on bulk silicon substrate |
2004-07-01 |
106 |
Novel low-temperature polycrystalline-silicon power devices with very-low on-resistance using excimer laser-crystallization |
2004-01-01 |
107 |
Lateral superjunction reduced surface field structure for the optimization of breakdown and conduction characteristics, in a high-voltage lateral double diffused metal oxide field effect transistor |
2003-12-01 |
108 |
Characterizing trench-gate power metal-oxide-semiconductor field effect transistor with multi-layer dielectrics at the trench bottom |
2003-11-01 |
109 |
Modeling and design of the high performance step SOI-LIGBT power devices by partition mid-point method |
2003-10-01 |
110 |
Thickness dependence of microstructure of laterally crystallized poly-Si thin films and electrical characteristics of low-temperature poly-Si TFTs |
2003-08-01 |
111 |
Role of extrinsic atoms on the morphology and field emission properties of carbon nanotubes |
2003-06-16 |
112 |
Dependence of polarization on temperature coefficient resistance of (Ba, Sr)TiO3 thin films post-treated by RTA |
2003-04-01 |
113 |
The effects of post excimer laser annealing on (Ba,Sr)TiO3 thin films at low substrate temperatures |
2003-04-01 |
114 |
A novel germanium doping method for fabrication of high-performance p-channel poly-Si1-xGex TFT by excimer laser crystallization |
2003-04-01 |
115 |
Comparison of p-side down and p-side up GaN light-emitting diodes fabricated by laser lift-off |
2003-02-15 |
116 |
Effects of post-oxygen plasma treatment on Pt/(Ba,Sr)TiO3/Pt capacitors at low substrate temperatures |
2003-02-01 |
117 |
Low temperature radio-frequency-sputtered (Ba, Sr)TiO3 films on Pt/TiN/Ti/Si substrates with various oxygen/argon mixing ratios |
2003-02-01 |
118 |
Controlling steps during early stages of the aligned growth of carbon nanotubes using microwave plasma enhanced chemical vapor deposition |
2002-10-01 |
119 |
Improvement of field emission characteristics of carbon nanotubes by excimer laser treatment |
2002-10-01 |
120 |
An investigation of bias temperature instability in hydrogenated low-temperature polycrystalline silicon thin film transistors |
2002-09-01 |
121 |
Integrated tungsten chemical mechanical polishing process characterization for via plug interconnection in ultralarge scale integrated circuits |
2002-08-01 |
122 |
Investigation of inductively coupled plasma gate oxide on low temperature polycrystalline-silicon TFTs |
2002-06-01 |
123 |
A novel laser-processed self-aligned gate-overlapped LDD poly-Si TFT |
2002-03-01 |
124 |
Effects of CH4/SiH4 flow ratio and microwave power on the growth of beta-SiC on Si by ECR-CVD using CH4/SiH4/Ar at 200 degrees C |
2002-02-22 |
125 |
Fabrication of low-temperature poly-Si thin film transistors with self-aligned graded lightly doped drain structure |
2002-01-01 |
126 |
Generalized interconnect delay time and crosstalk models: I. Applications of interconnect optimization design |
2001-12-01 |
127 |
Generalized interconnect delay time and crosstalk models: II. Crosstalk-induced delay time deterioration and worst crosstalk models |
2001-12-01 |
128 |
Low turn-on voltage field emission triodes with selective growth of carbon nanotubes |
2001-11-01 |
129 |
A comparative study of Ar and H-2 as carrier gases for the growth of SiC films on Si(100) by electron cyclotron resonance chemical vapor deposition at low temperature |
2001-11-01 |
130 |
Effects of excimer laser dopant activation on low temperature polysilicon thin-film transistors with lightly doped drains |
2001-11-01 |
131 |
Fabrication and characterization of low turn-on voltage carbon nanotube field emission triodes |
2001-08-01 |
132 |
High-performance low-temperature poly-Si TFTs crystallized by excimer laser irradiation with recessed-channel structure |
2001-06-01 |
133 |
Fabrication and characterization of carbon nanotube triodes |
2001-05-01 |
134 |
Integration of thin film transistor controlled carbon nanotubes for field emission devices |
2001-04-01 |
135 |
Effect of temperature and illumination on the instability of a-Si : H thin-film transistors under AC gate bias stress |
2001-04-01 |
136 |
Field emission properties of two-layer structured SiCN films |
2001-03-15 |
137 |
Effect of rapid-thermal-annealed TiN barrier layer on the Pt/BST/Pt capacitors prepared by RF magnetron co-sputter technique at low substrate temperature |
2001-01-01 |
138 |
Low-temperature process to improve the leakage current of (Ba, Sr)TiO3 films on Pt/TiN/Ti/Si substrates |
2000-12-15 |
139 |
Properties of Mg activation in thermally treated GaN : Mg films |
2000-12-01 |
140 |
Effect of rapid thermal annealed TiN barrier layer on BST capacitors prepared by RF magnetron cosputter system at low substrate temperatures |
2000-12-01 |
141 |
Enhancement in field emission of silicon microtips by bias-assisted carburization |
2000-11-01 |
142 |
Turnaround phenomenon of threshold voltage shifts in amorphous silicon thin film transistors under negative bias stress |
2000-10-01 |
143 |
Field-emission properties of aligned carbon nanotubes |
2000-09-15 |
144 |
The instability mechanisms of hydrogenated amorphous silicon thin film transistors under AC bias stress |
2000-07-01 |
145 |
Field emission from quasi-aligned SiCN nanorods |
2000-05-01 |
146 |
High current density field emission from arrays of carbon nanotubes and diamond-clad Si tips |
2000-05-01 |
147 |
Improved contact performance of GaN film using Si diffusion |
2000-04-03 |
148 |
W ohmic contact for highly doped n-type GaN films |
2000-04-01 |
149 |
Fabrication and characterization of various carbon-clad silicon microtips with ultra-small tip radii |
2000-02-01 |
150 |
Thin-film transistors with polycrystalline silicon films prepared by two-step rapid thermal annealing |
2000-01-15 |
151 |
Suppression of boron penetration for p(+) stacked poly-Si gates by using inductively coupled N-2 plasma treatment |
1999-10-01 |
152 |
Effects of rapid thermal annealing on cobalt silicided p(+) poly-Si gates fabricated by BF2+ implantation into bilayered CoSi/a-Si films |
1999-07-01 |
153 |
Effects of O-2- and N2O-plasma treatments on properties of plasma-enhanced-chemical-vapor-deposition tetraethylorthosilicate oxide |
1999-07-01 |
154 |
Effects of CoSi2 on p(+) polysilicon gates fabricated by BF2+ implantation into CoSi amorphous Si bilayers |
1998-10-01 |
155 |
Excellent low-pressure-oxidized Si3N4 films on roughened poly-si for high-density DRAM's |
1998-09-01 |
156 |
Effects of helicon-wave-plasma etching on the charging damage of aluminum interconnects |
1998-07-01 |
157 |
A novel process to form cobalt silicided p(+) poly-Si gates by BF2+ implantation into bilayered CoSi/a-Si films and subsequent anneal |
1998-07-01 |
158 |
A novel two-step etching to suppress the charging damages during metal etching employing helicon wave plasma |
1998-06-01 |
159 |
Characterization of GaN epitaxial layers on SiC substrates with AlxGa1-xN buffer layers |
1997-12-18 |
160 |
Charging damages to gate oxides in a helicon O-2 plasma |
1997-12-01 |
161 |
Effects of RCA clean-up procedures on the formation of roughened poly-Si electrodes for high-density DRAMs' capacitors |
1997-11-01 |
162 |
The instability characteristics of amorphous silicon thin film transistors with various interfacial and bulk defect states |
1997-10-01 |
163 |
Growth and characterizations of GaN on SiC substrates with buffer layers |
1997-09-01 |
164 |
Reducing threshold voltage shifts in amorphous silicon thin film transistors by hydrogenating the gate nitride prior to amorphous silicon deposition |
1997-09-01 |
165 |
The oxidation mechanism of low-pressure dry oxidation of nitrides for memory devices |
1997-09-01 |
166 |
The electrical characteristics of the amorphous silicon thin film transistors with dual intrinsic layers |
1997-08-01 |
167 |
Mobility enhancements in AlGaN/GaN/SiC with stair-step and graded heterostructures |
1997-05-12 |
168 |
Plasma passivation effects on polycrystalline silicon thin-film transistors utilizing nitrous oxide plasma |
1997-04-01 |
169 |
Deposition of polycrystalline beta-SiC films on Si substrates at room temperature |
1997-01-13 |
170 |
Effects of NH3 plasma passivation on N-channel polycrystalline silicon thin-film transistors |
1997-01-01 |
171 |
Au/Ge/Pd ohmic contacts to n-GaAs with the Mo/Ti diffusion barrier |
1996-12-01 |
172 |
Enhanced metalorganic chemical vapor deposition titanium nitride film fabricated using tetrakis-dimethylamino-titanium for barrier metal application in sub-half-micron technology |
1996-08-01 |
173 |
A novel technology to reduce the antenna charging effects during polysilicon gate electron-cyclotron-resonance etching |
1996-07-01 |
174 |
Effects of the rear interface states and fixed charges on the electrical characteristics of thin film transistors with thin amorphous silicon layers |
1996-06-01 |
175 |
Excellent emission characteristics of tunneling oxides formed using ultrathin silicon films for flash memory devices |
1996-06-01 |
176 |
Fabrication and characterization of the Pd-silicided emitters for field-emission devices |
1996-06-01 |
177 |
Electrical properties of amorphous silicon films with different thicknesses in metal/insulator/semiconductor structures |
1996-05-01 |
178 |
Enhanced electron emission from phosphorus-doped diamond-clad silicon field emitter arrays |
1996-05-01 |
179 |
Excellent Au/Ge/Pd ohmic contacts to n-type GaAs using Mo/Ti as the diffusion barrier |
1996-04-01 |
180 |
High-performance An/Ti/Ge/Pd ohmic contacts on n-Type In0.5Ga0.5P |
1996-04-01 |
181 |
Characterization of anodic aluminum oxide film and its application to amorphous silicon thin film transistors |
1996-02-01 |
182 |
Antenna charging effects on the electrical characteristics of polysilicon gate during electron cyclotron resonance etching |
1996-02-01 |
183 |
Characterization and fabrication of chimney-shaped metal field emitters |
1996-01-01 |
184 |
Growth of SiC films on Si(100) by electron cyclotron resonance chemical vapor deposition using SiH4/CH4/H-2 |
1995-12-01 |
185 |
THE EFFECTS OF NH3 PLASMA PASSIVATION ON POLYSILICON THIN-FILM TRANSISTORS |
1995-11-01 |
186 |
ANOMALOUS BIAS-STRESS-INDUCED UNSTABLE PHENOMENA OF HYDROGENATED AMORPHOUS-SILICON THIN-FILM TRANSISTORS |
1995-10-23 |
187 |
SIMULATION OF THE ELECTRICAL CHARACTERISTICS OF FIELD-EMISSION TRIODES WITH VARIOUS GATE STRUCTURES |
1995-10-01 |
188 |
LOW-TEMPERATURE ACTIVATION AND RECRYSTALLIZATION OF B+-IMPLANTED AND BF2+-IMPLANTED LPCVD AMORPHOUS-SI FILMS |
1995-10-01 |
189 |
MICROCRYSTALLINE SIC FILMS GROWN BY ELECTRON-CYCLOTRON-RESONANCE CHEMICAL-VAPOR-DEPOSITION AT LOW-TEMPERATURES |
1995-10-01 |
190 |
EFFECTS OF POSTETCHING TREATMENTS ON ELECTRICAL CHARACTERISTICS OF THERMAL OXIDES ON REACTIVE-ION-ETCHED SILICON SUBSTRATES |
1995-09-01 |
191 |
NOVEL TECHNIQUE TO FORM PT-SILICIDED SHALLOW P(+)N JUNCTIONS USING LOW-TEMPERATURE PROCESSES |
1995-09-01 |
192 |
INSTABILITY MECHANISMS FOR THE HYDROGENATED AMORPHOUS-SILICON THIN-FILM TRANSISTORS WITH NEGATIVE AND POSITIVE BIAS STRESSES ON THE GATE ELECTRODES |
1995-07-03 |
193 |
CHARACTERIZATION OF H-2/N-2 PLASMA PASSIVATION PROCESS FOR POLY-SI THIN-FILM TRANSISTORS (TFTS) |
1995-06-01 |
194 |
NOVEL TUNNELING DIELECTRIC PREPARED BY OXIDATION OF ULTRATHIN RUGGED POLYSILICON FOR 5-V-ONLY NONVOLATILE MEMORIES |
1995-06-01 |
195 |
A NEW ANALYTICAL EXPRESSION FOR THE INTERFACE INDEX OF METAL SCHOTTKY CONTACTS ON SEMICONDUCTORS |
1995-05-01 |
196 |
LOW-TEMPERATURE FORMATION OF SHALLOW P(+)N JUNCTIONS BY BF2+ IMPLANTATION INTO THIN PD2SI FILMS ON SI SUBSTRATES |
1995-05-01 |
197 |
IMPROVEMENT OF THIN OXIDES THERMALLY GROWN ON THE REACTIVE-ION-ETCHED SILICON SUBSTRATES |
1995-05-01 |
198 |
EFFECTS OF POLYSILICON ELECTRON-CYCLOTRON-RESONANCE ETCHING ON ELECTRICAL CHARACTERISTICS OF GATE OXIDES |
1995-05-01 |
199 |
HIGH-PERFORMANCE SUPERTHIN OXIDE/NITRIDE/OXIDE STACKED DIELECTRICS FORMED BY LOW-PRESSURE OXIDATION OF ULTRATHIN NITRIDE |
1995-04-01 |
200 |
HIGH-PERFORMANCE NITRIDED OXIDES FABRICATED BY VERY-LOW-PRESSURE NITRIDATION TECHNIQUE |
1995-04-01 |
201 |
EFFECTS OF COBALT SILICIDATION ON THE ELECTRICAL CHARACTERISTICS OF SHALLOW P(+)N JUNCTIONS FORMED BY BF2+ IMPLANTATION INTO THIN POLYCRYSTALLINE SI FILMS |
1995-03-01 |
202 |
ENERGY-DEPENDENCE OF THE ELECTRON-CAPTURE CROSS-SECTION OF GAP STATES IN UNDOPED A-SI-H FILMS |
1995-02-15 |
203 |
ELECTRICAL CHARACTERISTICS OF THIN-FILM TRANSISTORS WITH DOUBLE-ACTIVE-LAYER STRUCTURE |
1995-02-01 |
204 |
EFFECT OF SIH4/CH4 FLOW RATIO ON THE GROWTH OF BETA-SIC ON SI BY ELECTRON-CYCLOTRON-RESONANCE CHEMICAL-VAPOR-DEPOSITION AT 500-DEGREES-C |
1995-01-09 |
205 |
SILICIDE-CAUSED ANOMALOUS REVERSE CURRENT-VOLTAGE CHARACTERISTICS OF COSI2 SHALLOW P(+)N JUNCTIONS |
1995-01-01 |
206 |
A NEW FABRICATION TECHNOLOGY FOR FIELD-EMISSION TRIODES WITH EMITTER-GATE SEPARATION OF 0.18-MU-M |
1995-01-01 |
207 |
NOVEL STRUCTURE FOR MEASURING THE DENSITY-OF-STATE DISTRIBUTION OF HIGH-RESISTIVITY SEMICONDUCTOR-FILMS BY ISOTHERMAL CAPACITANCE TRANSIENT SPECTROSCOPY |
1994-12-01 |
208 |
SUPERTHIN O/N/O STACKED DIELECTRICS FORMED BY OXIDIZING THIN NITRIDES IN LOW-PRESSURE OXYGEN FOR HIGH-DENSITY MEMORY DEVICES |
1994-11-01 |
209 |
FORMATION OF SHALLOW P(+)N JUNCTIONS BY BF2+ IMPLANTATION INTO THIN POLYCRYSTALLINE SI FILMS |
1994-09-15 |
210 |
GRAIN-GROWTH OF LASER-RECRYSTALLIZED POLYCRYSTALLINE AND AMORPHOUS-SILICON FILMS |
1994-09-15 |
211 |
REVERSE ANNEALING OF ARSENIC-IMPLANTED LOW-PRESSURE CHEMICAL-VAPOR-DEPOSITION (LPCVD) AMORPHOUS-SILICON FILMS |
1994-09-01 |
212 |
A SILICIDATION-INDUCED PROCESS CONSIDERATION FOR FORMING SCALE-DOWN SILICIDED JUNCTION |
1994-09-01 |
213 |
EFFECTS OF VACANCIES ON THE ELECTRICAL CHARACTERISTICS OF METAL GAAS SCHOTTKY CONTACTS A QUANTITATIVE MODEL |
1994-09-01 |
214 |
LOW-TEMPERATURE FORMATION OF PALLADIUM SILICIDED SHALLOW P(+)N JUNCTIONS USING IMPLANT THROUGH METAL TECHNOLOGY |
1994-06-01 |
215 |
NOVEL PHENOMENON OF THE AL-1 WT-PERCENT-SI CONTACTS ON THE NF3/AR POST-ETCHING-TREATED N-SI SUBSTRATES |
1993-09-15 |
216 |
THE PROCESS LIMITATION FOR FORMING TI SILICIDED SHALLOW JUNCTION BY BF(2)+ IMPLANTATION INTO THIN POLYCRYSTALLINE SI FILMS AND SUBSEQUENT TI SILICIDATION |
1993-08-30 |
217 |
CHARACTERISTICS OF POLYCRYSTALLINE SILICON THIN-FILM TRANSISTORS WITH THIN OXIDE NITRIDE GATE STRUCTURES |
1993-08-01 |
218 |
SHALLOW N(+)P JUNCTION FORMATION BY IMPLANTING P+ IONS INTO THIN CO FILMS AND LASER PROCESSING |
1993-01-01 |
219 |
A NEW OXIDATION-RESISTANT COSI2 PROCESS FOR SELF-ALIGNED SILICIDATION (SALICIDE) TECHNOLOGY |
1993-01-01 |
220 |
ACTIVATION MECHANISM OF IMPLANTED BORON IN A SI SUBSTRATE |
1992-12-01 |
221 |
FORMATION OF SELF-ALIGNED TISI2 P+-N JUNCTIONS BY IMPLANTING BF2+ IONS THROUGH THIN TI OR SIO2 FILM ON SI SUBSTRATE RAPID THERMAL ANNEALING |
1992-10-01 |
222 |
CHARACTERIZATION OF SILICIDED SHALLOW N+P JUNCTIONS FORMED BY P+ IMPLANTATION INTO THIN TI FILMS ON SI SUBSTRATES |
1992-10-01 |
223 |
CONVENTIONAL FURNACE AND RAPID THERMAL ANNEALING OF COBALT FILMS ON SI(111) |
1992-09-15 |
224 |
THE PROCESS WINDOW OF A-SI/TI BILAYER METALLIZATION FOR AN OXIDATION-RESISTANT AND SELF-ALIGNED TISI2 PROCESS |
1992-08-01 |
225 |
FILM THICKNESS EFFECT ON THE EPITAXIAL-GROWTH OF COSI2 ON SI(111) |
1992-07-30 |
226 |
NOVEL EFFECTS OF HEATING RATE ON THE ACTIVATION RECRYSTALLIZATION OF BORON-IMPLANTED SI SUBSTRATES |
1992-07-01 |
227 |
FORMATION OF P(+)N JUNCTIONS BY SI(+)+B(+) IMPLANTATION AND LASER ANNEALING |
1992-04-27 |
228 |
FORMATION OF SHALLOW P+N JUNCTIONS BY IMPLANTING BF2+ IONS INTO THIN COBALT FILMS ON SILICON SUBSTRATES |
1992-04-01 |
229 |
THE REVERSE ANNEAL OF JUNCTION CHARACTERISTICS IN FORMING SHALLOW P+-N JUNCTION BY BF-2(+) IMPLANTATION INTO THIN CO FILMS ON SI SUBSTRATE |
1992-04-01 |
230 |
NOVEL ANNEALING SCHEME FOR FABRICATING HIGH-QUALITY TI-SILICIDED SHALLOW N+P JUNCTION BY P+ IMPLANTATION INTO THIN TI FILMS ON SI SUBSTRATE |
1992-03-30 |
231 |
INFLUENCE OF IMPLANT CONDITION ON THE TRANSIENT-ENHANCED DIFFUSION OF ION-IMPLANTED BORON IN SILICON |
1992-03-15 |
232 |
EFFECTS OF RAPID THERMAL ANNEALING ON THE FORMATION OF SHALLOW P+N JUNCTION BY IMPLANTING BF2+ IONS INTO THIN METAL-FILMS ON SI SUBSTRATE .1. THIN TITANIUM FILMS |
1992-02-01 |
233 |
EFFECTS OF RAPID THERMAL ANNEALING ON THE FORMATION OF SHALLOW P+N JUNCTION BY IMPLANTING BF2+ IONS INTO THIN METAL-FILMS ON SI SUBSTRATE .2. THIN COBALT FILMS |
1992-02-01 |
234 |
PREPARATION OF FINE-GRAINED BATIO3 |
1991-06-01 |
235 |
EXCELLENT THERMAL-STABILITY OF COBALT ALUMINUM-ALLOY SCHOTTKY CONTACTS ON GAAS SUBSTRATES |
1990-07-01 |
236 |
THE EFFECT OF GATE ELECTRODES USING TUNGSTEN SILICIDES AND OR POLYSILICON ON THE DIELECTRIC CHARACTERISTICS OF VERY THIN OXIDES |
1990-03-01 |
237 |
CROSS-SECTIONAL TRANSMISSION ELECTRON-MICROSCOPE STUDY OF THE GROWTH-KINETICS OF HEXAGONAL MOSI2 ON (001)SI |
1987-03-15 |
238 |
GROWTH OF SINGLE-CRYSTALLINE COSI2 ON (111) SI IN SOLID-PHASE EPITAXY REGIME BY A NON-ULTRAHIGH VACUUM METHOD |
1987-01-26 |