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彭文理

彭文理 Pearn, Wen Lea

電子郵件／E-mail：Roller@cc.nctu.edu.tw

服務單位／Department：管理學院 ／ 工業工程與管理學系

著作期間／Publish Period：1992 - 2014-11-01

著作統計／Statistics

Article（179）
Others（2）
Plan（26）
Thesis（110）

Article

序號
No.		 標題
Title		 著作日期
Date
1 Product Acceptance Determination for Processes with Multiple Independent Lines 2014-11-01
2 Capability Assessment for Weibull In-Cell Touch Panel Manufacturing Processes With Variance Change
 2014-05-01
3 Analytic Solution to Product Acceptance Determination for Gold Bumping Process With Multiple Manufacturing Lines
 2013-11-01
4 Supplier Selection Critical Decision Values for Processes with Multiple Independent Lines
 2013-10-01
5 Assessing Profitability of a Newsboy-Type Product with Normally Distributed Demand Based on Multiple Samples
 2013-09-17
6 A Close Form Solution for the Product Acceptance Determination Based on the Popular Index C-pk
 2013-07-01
7 Supplier Selection for Processes with Multiple Characteristics Based on Testing Capability Index C-pk 2013-07-01
8 Analysis of an infinite multi-server queue with an optional service
 2013-06-01
9 Yield-Related Process Capability Indices for Processes of Multiple Quality Characteristics
 2013-06-01
10 Measuring PPM Non-conformities for Processes with Asymmetric Tolerances
 2013-04-01
11 The burn-in test scheduling problem with batch dependent processing time and sequence dependent setup time
 2013-03-15
12 A heuristic algorithm for the optimization of a retrial system with Bernoulli vacation
 2013-03-01
13 A Note on "Capability Assessment for Processes with Multiple Characteristics: A Generalization of the Popular Index Cpk"
 2013-03-01
14 An Extension of the Product Acceptance Determination for One-Sided Process with Multiple Characteristics
 2013-03-01
15 Supplier Selection for Multiple-Characteristics Processes with One-Sided Specifications 2013-03-01
16 Profitability evaluation for newsboy-type product with normally distributed demand
 2013-01-01
17 Profitability evaluation for newsboy-type product with normally distributed demand
 2013-01-01
18 A wind turbine evaluation model under a multi-criteria decision making environment
 2012-12-01
19 Precision Tool Condition Monitoring for Grinding Wheel in IC Manufacturing of Silicon Wafer 2012-11-01
20 An Effective Powerful Test for Supplier Selection Evaluation with Multiple Characteristics 2012-07-01
21 Implementation of Evaluating Process Capability Index C-pk for Processes with Multiple Characteristics 2012-07-01
22 An Effective Procedure for Calculating Weibull Production Yield with Mean Shift 2012-05-01
23 Measuring the Manufacturing Yield for Processes With Multiple Manufacturing Lines
 2012-05-01
24 Production yield measure for multiple characteristics processes based on S-pk(T) under multiple samples
 2012-03-01
25 ANALYTICAL METHOD FOR ACCURACY ANALYSIS OF THE RANDOMIZED T-POLICY QUEUE 2012-03-01
26 A batch arrival queue under randomised multi-vacation policy with unreliable server and repair
 2012-01-01
27 Cycle time estimation for semiconductor final testing processes with Weibull-distributed waiting time
 2012-01-01
28 Optimal production run time for two-stage production system with imperfect processes and allowable shortages
 2011-12-01
29 Capability Assessment for Processes with Multiple Characteristics: A Generalization of the Popular Index C(pk) 2011-12-01
30 An Effective Test for Supplier Selection Evaluation with Multiple Characteristics 2011-11-01
31 An Integrated Multi-Criteria Decision Making Model for Evaluating Wind Farm Performance
 2011-11-01
32 Process Capability Evaluation for Square Bumps with Mean Shift 2011-09-01
33 The Interrelationship Between N-policy M/G/1/K and F-policy G/M/1/K Queues with Startup Time 2011-09-01
34 Accessing Manufacturing Yield for Gamma Wafer Sawing Processes in COG Packaging
 2011-08-01
35 Product selection for newsboy-type products with normal demands and unequal costs
 2011-08-01
36 Comparative analysis of a randomized N-policy queue: An improved maximum entropy method
 2011-08-01
37 The performance measures and randomized optimization for an unreliable server M([x])/G/1 vacation system 2011-07-01
38 Algorithmic analysis of the multi-server system with a modified Bernoulli vacation schedule
 2011-05-01
39 Efficient Tool Replacement Procedure Based on Yield Evaluation 2011-05-01
40 Group selection for production yield among k manufacturing lines
 2011-04-01
41 Decision-making in a single-period inventory environment with fuzzy demand
 2011-03-01
42 Two Tests for Supplier Selection Based on Process Yield 2011-03-01
43 An effective powerful test for one-sided supplier selection problem
 2011-01-01
44 Multi-server retrial queue with second optional service: algorithmic computation and optimisation
 2011-01-01
45 Optimal management for infinite capacity N-policy M/G/1 queue with a removable service station
 2011-01-01
46 Economic design of (x)over-bar-control charts for continuous flow process with multiple assignable causes
 2010-11-01
47 Estimating and testing process accuracy with extension to asymmetric tolerances
 2010-08-01
48 The randomized vacation policy for a batch arrival queue
 2010-06-01
49 Comparison of two randomized policy M/G/1 queues with second optional service, server breakdown and startup
 2010-06-01
50 Measuring Manufacturing Yield for Gold Bumping Processes Under Dynamic Variance Change
 2010-04-01
51 Process Selection for Higher Production Yield Based on Capability Index S(pk) 2010-04-01
52 RANDOMIZED POLICY OF A POISSON INPUT QUEUE WITH J VACATIONS
 2010-03-01
53 Procedure of the convolution method for estimating production yield with sample size information
 2010-01-01
54 Measuring production yield for processes with multiple characteristics
 2010-01-01
55 Photolithography Control in Wafer Fabrication Based on Process Capability Indices With Multiple Characteristics
 2009-08-01
56 Sample size determination for production yield estimation with multiple independent process characteristics
 2009-08-01
57 Fast and effective algorithms for the liquid crystal display module (LCM) scheduling problem with sequence-dependent setup time
 2009-07-01
58 An Effective Scheduling Approach for Maximizing Polyimide Printing Weighted Throughput in Cell Assembly Factories
 2009-07-01
59 Statistical Approach for Cycle Time Estimation in Semiconductor Packaging Factories
 2009-07-01
60 Optimization of the T policy M/G/1 queue with server breakdowns and general startup times
 2009-06-01
61 Select better suppliers based on manufacturing precision for processes with multivariate data
 2009-01-01
62 Minimising makespan on parallel batch processing machines with non-identical ready time and arbitrary job sizes
 2009-01-01
63 An Improved Approach for Estimating Product Performance Based on the Capability Index C(pmk) 2009-01-01
64 A comparison of methods for estimating loss-based capability index
 2009-01-01
65 Capability adjustment or gamma processes with mean shift consideration in implementing Six Sigma program
 2008-12-01
66 A recursive method for the F-policy G/M/1/K queueing system with an exponential startup time
 2008-06-01
67 A variables sampling plan based on C-pmk for product acceptance determination
 2008-01-16
68 Optimal randomized control policy of an unreliable server system with second optional service and startup
 2008-01-01
69 Bootstrap approach for supplier selection based on production yield
 2008-01-01
70 Testing process precision for truncated normal distributions
 2007-12-01
71 Optimal control of an M/G/1/K queueing system with combined F policy and startup time
 2007-11-01
72 Optimal control of the N policy M/G/1 queueing system with server breakdowns and general startup times
 2007-10-01
73 Estimating and testing process precision with presence of gauge measurement errors
 2007-10-01
74 Tool replacement policy for one-sided processes with low fraction defective 2007-08-01
75 Measuring process capability based on Cpmk with gauge measurement errors
 2007-08-01
76 Optimal tool replacement for processes with low fraction defective
 2007-08-01
77 Due-date assignment for wafer fabrication under demand variate environment
 2007-05-01
78 Scheduling integrated circuit assembly operations on die bonder
 2007-04-01
79 An effective decision making method for product acceptance
 2007-02-01
80 Estimating process yield based on S-pk for multiple samples
 2007-01-01
81 On the sampling distributions of the estimated process loss indices with asymmetric tolerances
 2007-01-01
82 Multivariate capability indices: Distributional and inferential properties
 2007-01-01
83 Optimal management for a finite M/M/R queueing system with two arrival modes
 2007-01-01
84 A comparison of two methods for transforming non-normal manufacturing data
 2007-01-01
85 Accuracy analysis of the percentile method for estimating non normal manufacturing quality
 2007-01-01
86 Measuring process performance based on expected loss with asymmetric tolerances
 2006-12-01
87 Measuring production yield for processes with multiple quality characteristics
 2006-11-01
88 One-sided process capability assessment in the presence of measurement errors
 2006-11-01
89 Bayesian approach for measuring EEPROM process capability based on the one-sided indices C-PU and C-PL
 2006-11-01
90 Precision measures for processes with multiple manufacturing lines
 2006-10-01
91 Production quality and yield assurance for processes with multiple independent characteristics
 2006-09-01
92 Quality yield measure for processes with asymmetric tolerances
 2006-08-01
93 Tool replacement for production with a low fraction of defectives
 2006-06-15
94 Multiple-process performance analysis chart based on process loss indices
 2006-06-10
95 Variables sampling plans with PPM fraction of defectives and process loss consideration 2006-04-01
96 Measuring production performance of different product mixes in semiconductor fabrication 2006-03-01
97 Critical acceptance values and sample sizes of a variables sampling plan for very low fraction of detectives
 2006-01-01
98 Testing process capability based on C-pm in the presence of random measurement errors
 2005-12-01
99 Testing manufacturing performance based on capability index C-pm
 2005-12-01
100 Approximate solutions for the Maximum Benefit Chinese Postman Problem
 2005-10-20
101 A Bayesian approach to obtain a lower bound for the C-pm capability index
 2005-10-01
102 A Bayesian approach for assessing process precision based on multiple samples
 2005-09-16
103 A service level model for the control wafers safety inventory problem
 2005-09-01
104 The integrated circuit packaging scheduling problem (ICPSP): A case study 2005-09-01
105 Monitoring manufacturing quality for multiple Li-BPIC processes based on capability index C-pmk
 2005-06-15
106 Maximum entropy analysis to the N policy M/G/1 queueing system with server breakdowns and general startup times
 2005-06-06
107 Cost benefit analysis of series systems with warm standby components and general repair time
 2005-06-01
108 Product mix optimization for semiconductor manufacturing based on AHP and ANP analysis
 2005-06-01
109 Assessing process performance based on the incapability index C-pp 2005-06-01
110 Analytic network process (ANP) approach for product mix planning in semiconductor fabricator
 2005-04-18
111 Control wafers inventory management in the wafer fabrication photolithography area
 2005-04-01
112 A linear programming model for the control wafers downgrading problem
 2005-02-01
113 Capability testing based on CPM with multiple samples
 2005-02-01
114 Process capabitity assessment for index C-pk based on bayesian approach
 2005-01-01
115 Capability measure for asymmetric tolerance non-normal processes applied to speaker driver manufacturing
 2005-01-01
116 Measuring manufacturing capability for couplers and wavelength division multiplexers
 2005-01-01
117 Bootstrap approach for estimating process quality yield with application to light emitting diodes
 2005-01-01
118 Procedures for testing manufacturing precision C(p)based on ((X)over-bar, R) or ((X)over-bar, S) control chart samples
 2005-01-01
119 Testing process performance based on capability index C-pk with critical values 2004-12-01
120 Quality-yield measure for production processes with very low fraction defective
 2004-12-01
121 Algorithms for the wafer probing scheduling problem with sequence-dependent set-up time and due date restrictions 2004-11-01
122 Distributional and inferential properties of the process loss indices
 2004-11-01
123 Procedure for supplier selection based on C-pm applied to super twisted nematic liquid crystal display processes
 2004-07-01
124 C-pm MPPAC for manufacturing quality control applied to the precision voltage reference process
 2004-07-01
125 Lower confidence bounds for C-PU and C-PL based on multiple samples with application to production yield assurance
 2004-06-15
126 Optimal management of the N-policy M/E-k/1 queuing system with a removable service station: a sensitivity investigation
 2004-06-01
127 Accuracy analysis of the estimated process treld based onS(pk)
 2004-06-01
128 On the distributional properties of the estimated process accuracy index C-a 2004-06-01
129 C-pm MPPAC for manufacturing quality control applied to precision voltage reference process
 2004-05-01
130 A case study on the multistage IC final testing scheduling problem with reentry
 2004-04-18
131 Sensitivity analysis of the optimal management policy for a queuing system with a removable and non-reliable server
 2004-03-01
132 Normal approximation to the distribution of the estimated yield index S-pk
 2004-02-01
133 The C ''(pk) index for asymmetric tolerances: Implications and inference
 2004-01-01
134 Measuring process yield based on the capability index C-pm
 2004-01-01
135 Measuring manufacturing capability based on lower confidence bounds of C-pmk applied to current transmitter process
 2004-01-01
136 Cost benefit analysis of series systems with warm standby components
 2003-11-01
137 Distributional and inferential properties of the estimated precision C-p based on multiple samples
 2003-11-01
138 Lower confidence bounds with sample size information for C-pm applied to production yield assurance
 2003-10-15
139 On the Maximum Benefit Chinese Postman Problem
 2003-08-01
140 Manufacturing capability control for multiple power-distribution switch processes based on modified C-pk MPPAC
 2003-06-01
141 A reliable procedure for testing linear regulators with one-sided specification limits based on multiple samples
 2003-04-01
142 An algorithm for calculating the lower confidence bounds of C-PU and C-PL with application to low-drop-out linear regulators
 2003-03-01
143 Capability measures for m-dependent stationary processes
 2003-03-01
144 Capability measures for processes with multiple characteristics
 2003-03-01
145 A Bayesian-like estimator of the process capability index C-pmk
 2003-01-01
146 Job order releasing and throughput planning for multi-priority orders in wafer fabs
 2003-01-01
147 Testing process capability for one-sided specification limit with application to the voltage level translator
 2002-12-01
148 Maximum entropy analysis to the N policy M/G/1 queueing system with a removable server
 2002-12-01
149 A practical implementation of the incapability index C-pp 2002-12-01
150 A note on the interval estimation of C-pk with asymmetric tolerances
 2002-12-01
151 The wafer probing scheduling problem (WPSP) 2002-08-01
152 Testing process performance based on the yield: an application to the liquid-crystal display module
 2002-08-01
153 A multiprocess performance analysis chart based on the incapability index C-pp: an application to the chip resistors
 2002-07-01
154 Computer program for calculating the p-value in testing process capability index C-pmk
 2002-07-01
155 On the distribution of the estimated process yield index S-pk
 2002-03-01
156 Estimated incapability index: Reliability and decision making with sample information
 2002-03-01
157 Minimizing the total machine workload for the wafer probing scheduling problem
 2002-02-01
158 A case study on the wafer probing scheduling problem
 2002-01-01
159 Capability indices for processes with asymmetric tolerances
 2001-09-01
160 On the reliability of the estimated incapability index
 2001-07-01
161 Estimating process capability index C"(pmk) for asymmetric tolerances: Distributional properties
 2001-01-01
162 Estimating capability index C-pk for processes with asymmetric tolerances
 2000-01-01
163 Improved solutions for the Chinese postman problem on mixed networks
 1999-07-01
164 Making decisions in assessing process capability index C-pk
 1999-07-01
165 New generalization of process capability index C-pk
 1998-12-01
166 Improved solutions for the traveling purchaser problem
 1998-11-01
167 Distributional and inferential properties of the process accuracy and process precision indices
 1998-01-01
168 Capability indices for non-normal distributions with an application in electrolytic capacitor manufacturing
 1997-12-01
169 An application of non-normal process capability indices
 1997-11-01
170 The asymptotic distribution of the estimated process capability index (C)over-tilde(pk)
 1997-01-01
171 The performance of process capability index C-s on skewed distributions
 1997-01-01
172 A Bayesian-like estimator of C-pk 1996-01-01
173 ALGORITHMS FOR THE RURAL POSTMAN PROBLEM
 1995-10-01
174 ESTIMATING PROCESS CAPABILITY INDEXES FOR NONNORMAL PEARSONIAN POPULATIONS
 1995-09-01
175 ALGORITHMS FOR THE CHINESE POSTMAN PROBLEM ON MIXED NETWORKS
 1995-05-01
176 SOLVABLE CASES OF THE K-PERSON CHINESE POSTMAN PROBLEM 1994-11-01
177 ALGORITHMS FOR THE WINDY POSTMAN PROBLEM 1994-07-01
178 SOME PROCESS CAPABILITY INDEXES ARE MORE RELIABLE THAN ONE MIGHT THINK
 1993-01-01
179 DISTRIBUTIONAL AND INFERENTIAL PROPERTIES OF PROCESS CAPABILITY INDEXES 1992-10-01

Others

序號
No.		 標題
Title		 著作日期
Date
1 An overview of theory and practice on process capability indices for quality assurance
 2009-02-01
2 An algorithm for calculating the lower confidence bounds of C-PU and C-PL with application to low-drop-out linear regulators (vol 43, pg 495, 2003)
 2003-08-01

Plan

序號
No.		 標題
Title		 著作日期
Date
1 考慮顧客猶豫及違約行為下具有部分故障與單次休假之排隊系統最佳化策略研究 2014
2 M/M/S排隊系統含有不可靠服務者及可控制的維修策略之最佳管理 2013
3 M/M/S機器修理系統含有同步休假及多個門檻之最佳管理 2012
4 含有多個服務者與第二種選擇服務排隊系統之理論與最佳化分析 2011
5 M/M/S機器修理系統含有同步休假及多個門檻之最佳管理 2011
6 含有多個服務者與第二種選擇服務排隊系統之理論與最佳化分析 2010
7 M/M/S機器修理系統含有同步休假及多個門檻之最佳管理 2010
8 在排隊系統裡控制到達與控制服務之理論與實務應用研究---子計畫一：探討有限容量F方策M/G/1排隊系統之操作特性與敏感度分析
 2009
9 含有多個服務者與第二種選擇服務排隊系統之理論與最佳化分析 2009
10 應用六倍標準差方法評估製程在變異數會變動情況下的製程能力(I)
 2008
11 在排隊系統裡控制到達與控制服務之理論與實務應用研究---子計畫一：探討有限容量F方策M/G/1排隊系統之操作特性與敏感度分析 2008
12 在排隊系統裡控制到達與控制服務之理論與實務應用研究---子計畫一：探討有限容量F方策M/G/1排隊系統之操作特性與敏感度分析 2007
13 多變量製程能力指標之推論 2006
14 低不良率生產下的工具汰換 2005
15 考慮量規測量誤差的單邊規格製程能力測量方法 2005
16 護理人員排程問題模式之建立與演算法之研究(III) 2004
17 對於超低不良率生產製程的品質良率評估方法之研究 2004
18 護理人員排程問題模式之建立與演算法之研究(II)
 2003
19 製程能力指標Cpk之計量值允收抽樣計畫 2003
20 護理人員排程問題模式之建立與演算法之研究(I) 2002
21 晶圓製造廠爐管區控檔片之多迴圈網路模式
 2002
22 具實用性及交期導向之IC封裝廠排程演算法則之設計與應用
 2001
23 晶圓製造廠爐管區控檔片之單迴圈網路模式
 2001
24 具應用性與優異性之晶圓針測排程問題演算法設計研究
 2000
25 電子資訊產業供應鏈管理---IC製造業前置時間管理之研究(III)
 2000
26 改良型的C/sub pmk/具有非對稱規格區間的製程能力指標
 1999

Thesis

序號
No.		 標題
Title		 著作日期
Date
1 雙邊規格下不同附加條件之製程能力量測 2013
2 在非常態製程之下修正後彈性能力指標Cjkp*的估計 2013
3 修正後百分位數之非常態製程下能力指標CNpk*的估計 2013
4 修正後權重變異數指標之非常態製程下能力指標Cpk*(WV)的估計 2013
5 在偏態製程下修正後製程能力指標Cs*的估計 2013
6 IC預燒測試廠生產排程問題之研究 2012
7 Optimal Tool Replacement For Processes With Multiple Characteristics Based On Capability Index 2012
8 雙邊規格CNpk信賴下界複式抽樣計算方法 2012
9 單邊規格下不同附加條件之製程能力量測 2012
10 單邊規格CNPU信賴下界複式抽樣計算法 2012
11 雙邊規格多條生產線製程之允收抽樣計畫 2012
12 具有多項異常原因之 X-bar管制圖經濟設計
 2011
13 衡量報童類型產品的獲利能力之可達成能力指標及其應用
 2011
14 具有第二次可選擇服務、服務者選擇休假之多個服務者排隊分析
 2011
15 TFT LCD產業 - LCD與EPD產品組合的決定 2011
16 太陽能廠電池段製程主生產排程規劃系統之構建 2011
17 The Construction of Solution Methods for the TFT-LCD Material Allocation Problem 2011
18 具工單等級之液晶注入排程問題研究 2011
19 雙邊規格製程能力指標Spk的信賴下界 2011
20 雙邊規格多品質特性製程能力指標CpkT的信賴下界 2011
21 單邊規格多品質特性製程能力指標CpuT的信賴下限 2011
22 考量整備時間與工件動態到達之單機延遲時間分析模型
 2010
23 單邊規格多品質特性製程之抽樣計畫 2010
24 單邊規格多品質特性製程能力量測 2010
25 多品質特性雙邊規格的供應商選擇問題:一個高檢定力有效的檢定方法 2010
26 太陽能廠晶錠－晶圓製程主生產排程規劃系統之構建 2010
27 太陽能模組裝配廠主生產排程規劃系統之構建 2010
28 對於雙邊規格多品質特性供應商選擇問題的檢定方法 2010
29 具隨機假期策略之M[x]/G/1排隊系統分析
 2009
30 考慮非中心卡方製程的製程平均發生偏移下之製程能力調整
 2009
31 U型曲線之實驗研究 2009
32 以實驗比較推式系統與拉式系統在配銷環境之績效
 2009
33 以實驗驗證管理之觀念與方法為庫存績效不佳之主要原因 2009
34 以實驗驗證專案凍結機制對交期績效的影響 2009
35 S-DBR與CCPM的緩衝管理於不同環境之影響
 2009
36 探討企業導入豐田生產系統之困境以台灣工具機為例 2009
37 具有第二次可選擇服務、服務者故障和啟動時間特徵之M/G/1排隊系統 2009
38 多變量製程能力指標之研究
 2008
39 多品質特性製程的製程能力指標 CpkT 的分布和推論
 2008
40 考慮韋伯製程變異數發生變動下之製程能力調整
 2008
41 考慮Gamma製程變異數發生變動下之製程能力調整
 2008
42 考慮常態製程變異發生偏移下之製程能力調整
 2008
43 考慮多品質特性製程之計量抽樣計劃
 2008
44 良率指標Spk的抽樣性質與樣本資訊下估計良率的精準度
 2008
45 製程能力指標Yq/Y複式抽樣之信賴下限
 2008
46 考慮韋伯製程平均發生偏移下之製程能力調整
 2007
47 在N方策和T方策下具故障及啟動服務者M/G/1排隊之研究
 2007
48 M/G/1/K與G/M/1/K排隊含啟動時間的F方策與N方策之相互關係
 2007
49 考慮量測誤差下的製程能力指標
 2006
50 多工單等級之平行機台排程問題研究－以IC封裝廠為例
 2006
51 多變量製程能力指標:分佈和推論之性質
 2006
52 An Application of Response Surface Methodology to Improve TFT-LCD Color Filter Process Capability 2006
53 考慮韋伯製程平均發生偏移下之製程能力評估方法
 2006
54 製程能力指標Cpm估計方法之比較 2006
55 製程能力指標Cpk估計方法之比較 2006
56 製程能力指標應用於低不良率製程的工具汰換問題 2006
57 依據製程能力指標Spk應用複式抽樣方法於供應商選擇
 2006
58 依據製程能力指標 Cpmk 應用複式抽樣方法於供應商選擇
 2006
59 依據品質良率指標Yq應用複式抽樣方法於供應商選擇
 2006
60 屬性的排序對消費者產品選擇的影響 2006
61 製程能力指標應用於多品質特性及工具磨耗之製程
 2005
62 考慮製程平均發生偏移下之製程能力評估
 2005
63 依據產品良率應用複式抽樣方法選擇供應商 2004
64 對稱與非對稱規格製程準確性之估計與檢定
 2004
65 產品品質良率與製程損失指標
 2003
66 晶圓製造廠產品組合最佳化之設定 2003
67 越野尋蹤問題之演算法應用於最大效益中國郵差問題
 2003
68 製程能力指標於供應商決策之應用
 2003
69 應用改善式啟發解與基因演算法求解晶圓針測排程問題之最大完成時間最小化
 2003
70 利用貝氏方法評估製程能力
 2003
71 多階段再回流晶圓針測排程問題之整合性解法 2002
72 多階段IC封裝排程問題--以演算法為基礎之解決方案 2002
73 Optimal Parameters on IRED Wire Bonding Process Capability : Power, Time 2002
74 記憶體IC最終測試廠主生產規劃系統之構建 2002
75 單 邊 製 程 限 制 下 選 擇 較 好 的 供 應 廠 商 2002
76 Cycle Time Estimation with Consideration of Transportation between Process Steps in Wafer Fabrication 2001
77 晶圓廠針測區多工單等級生產規劃系統之設計 2001
78 運用網路方法於晶圓針測排程規劃之研究 2000
79 製程能力指標估計式的分配與統計推論 2000
80 預測週期和預測方式對長鞭效應的影響 2000
81 半導體產業一元化代工服務(Turn Key Service)之研究 2000
82 多廠規劃下訂單分派模式之構建 2000
83 IC設計公司產能分派模式之構建 2000
84 IC 最終測試廠排程問題 2000
85 晶圓針測廠等效平行機台排程問題之研究：模式、演算法與應用 2000
86 非對稱規格區間之製程能力指標的統計性質 1999
87 晶圓製造廠多工單等級下之產能互換機制設計 1999
88 多工單等級下晶圓廠生產週期時間估算模式 1999
89 Accuracy Analysis of the Estimated Process capability Indices 1999
90 晶圓製造廠多工單等級下生產規劃模式之構建 1999
91 晶圓製造廠縮短特定訂單週期時間之研究 1999
92 The Design of Inventory Control Model for Dummy/Control Wafers at the Furnace Area in the Wafer Fab 1999
93 IC 封裝廠排程問題 1999
94 IC設計公司批次追蹤系統之研究 1999
95 一些估計非常態製程能力指標的績效評估 1998
96 製程能力弱度指標的管制圖 1997
97 製程能力弱度指標的實務應用 1997
98 非常態製程的能力指標 1997
99 製程能力指標Cpmk的應用 1996
100 風向郵差與混向郵差問題演算法的探討 1996
101 混向郵差問題解之改進 1996
102 購買者旅行問題 1995
103 多郵差在有向網路中之運輸問題 1995
104 混合網路上的多郵差問題 1995
105 製程能力指標 1995
106 鄉村型郵差問題之演算法則 1994
107 多個銷售員旅行問題之演算法 1993
108 多郵差的中國郵差問題之演算法 1993
109 風向郵差問題之演算法 1992
110 混合型網路上的中國郵差問題之近似演算法 1992
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