1 |
Optimization of gefitinib analogues with potent anticancer activity |
2014-11-15 |
2 |
Grain growth in electroplated (111)-oriented nanotwinned Cu |
2014-10-15 |
3 |
A 4n-move self-stabilizing algorithm for the minimal dominating set problem using an unfair distributed daemon |
2014-10-01 |
4 |
Effect of grain orientations of Cu seed layers on the growth of < 111 >-oriented nanotwinned Cu |
2014-08-19 |
5 |
Toward epitaxially grown two-dimensional crystal hetero-structures: Single and double MoS2/graphene hetero-structures by chemical vapor depositions |
2014-08-18 |
6 |
Formation of Sn-rich phases via the decomposition of Cu6Sn5 compounds during current stressing |
2014-06-01 |
7 |
Low-temperature direct copper-to-copper bonding enabled by creep on highly (111)-oriented Cu surfaces |
2014-05-01 |
8 |
Formation of nearly void-free Cu3Sn intermetallic joints using nanotwinned Cu metallization |
2014-04-28 |
9 |
Experimental and simulation analysis of concave-down resistance curve during electromigration in solder joints |
2014-02-28 |
10 |
CR108, a novel vitamin K3 derivative induces apoptosis and breast tumor inhibition by reactive oxygen species and mitochondrial dysfunction |
2013-12-15 |
11 |
Temperature-dependent failure mechanism of SnAg solder joints with Cu metallization after current stressing: Experimentation and analysis |
2013-09-21 |
12 |
Single-hidden-layer feed-forward quantum neural network based on Grover learning |
2013-09-01 |
13 |
Microstructure control of unidirectional growth of eta-Cu6Sn5 in microbumps on < 1 1 1 > oriented and nanotwinned Cu |
2013-08-01 |
14 |
Anisotropic grain growth and crack propagation in eutectic microstructure under cyclic temperature annealing in flip-chip SnPb composite solder joints |
2013-07-01 |
15 |
Effect of Geometric Nanostructures on the Absorption Edges of 1-D and 2-D TiO2 Fabricated by Atomic Layer Deposition |
2013-05-08 |
16 |
Eliminate Kirkendall voids in solder reactions on nanotwinned copper |
2013-03-01 |
17 |
Transition from flip chip solder joint to 3D IC microbump: Its effect on microstructure anisotropy |
2013-01-01 |
18 |
Analysis of bump resistance and current distribution of ultra-fine-pitch microbumps |
2013-01-01 |
19 |
Concentration Gradient of Ni in Reduced SnAg Thickness in Ni/SnAg/Cu Microbumps during Solid-State Aging |
2013-01-01 |
20 |
Effect of the surface-plasmon-exciton coupling and charge transfer process on the photoluminescence of metal-semiconductor nanostructures |
2013-01-01 |
21 |
Novel EBSD preparation method for Cu/Sn microbumps using a focused ion beam |
2012-12-01 |
22 |
Asymmetrical growth of Cu6Sn5 intermetallic compounds due to rapid thermomigration of Cu in molten SnAg solder joints |
2012-10-01 |
23 |
Fabrication and Characterization of (111)-Oriented and Nanotwinned Cu by Dc Electrodeposition |
2012-10-01 |
24 |
Electromigration Failure Mechanism in Sn-Cu Solder Alloys with OSP Cu Surface Finish |
2012-09-01 |
25 |
Unidirectional Growth of Microbumps on (111)-Oriented and Nanotwinned Copper |
2012-05-25 |
26 |
Precipitation of large Ag3Sn intermetallic compounds in SnAg2.5 microbumps after multiple reflows in 3D-IC packaging |
2012-05-15 |
27 |
Thermomigration of Ti in flip-chip solder joints |
2012-05-01 |
28 |
The effect of a concentration gradient on interfacial reactions in microburaps of Ni/SnAg/Cu during liquid-state soldering |
2012-05-01 |
29 |
Kinetic study of the intermetallic compound formation between eutectic Sn-3.5Ag alloys and electroplated Ni metallization in flip-chip solder joints |
2012-04-01 |
30 |
Influence of Cu column under-bump-metallizations on current crowding and Joule heating effects of electromigration in flip-chip solder joints |
2012-02-15 |
31 |
Facile Fabrication of TiO(2) Nanorod Arrays for Gas Sensing using Double-Layered Anodic Oxidation Method |
2012-01-01 |
32 |
Core-Shell Ni-NiO Nano Arrays for UV Photodetection without an External Bias |
2012-01-01 |
33 |
The Differences in Optical Characteristics of TiO2 and TiO2/AAO Nanotube Arrays Fabricated by Atomic Layer Deposition |
2012-01-01 |
34 |
Growth Mechanism of Self-Assembled TiO2 Nanorod Arrays on Si Substrates Fabricated by Ti Anodization |
2012-01-01 |
35 |
The Effect of Geometric Structure on Photoluminescence Characteristics of 1-D TiO2 Nanotubes and 2-D TiO2 Films Fabricated by Atomic Layer Deposition |
2012-01-01 |
36 |
Side Wall Wetting Induced Void Formation due to Small Solder Volume in Microbumps of Ni/SnAg/Ni upon Reflow |
2012-01-01 |
37 |
為環境信託開啟新視野:論私部門從事土地保育的法律工具類型 |
2012 |
38 |
Inhibiting the consumption of Cu during multiple reflows of Pb-free solder on Cu |
2011-11-01 |
39 |
TiO(2-x) nanoparticles synthesized using He/Ar thermal plasma and their effectiveness on low-concentration mercury vapor removal |
2011-10-01 |
40 |
Coupled microstructural and magnetic transition in Co-doped Ni nano-arrays |
2011-10-01 |
41 |
Innovative methodologies of circuit edit by focused ion beam (FIB) on wafer-level chip-scale-package (WLCSP) devices |
2011-10-01 |
42 |
Magnetic properties of electroless-deposited Ni and Ni-NiO core-shell nano-arrays |
2011-08-01 |
43 |
Magnetostructural phase transition in electroless-plated Ni nanoarrays |
2011-06-01 |
44 |
Effect of Si-die dimensions on electromigration failure time of flip-chip solder joints |
2011-05-16 |
45 |
Constructing independent spanning trees for locally twisted cubes |
2011-05-13 |
46 |
Thermomigration of Cu-Sn and Ni-Sn intermetallic compounds during electromigration in Pb-free SnAg solder joints |
2011-04-01 |
47 |
7-Chloro-6-piperidin-1-yl-quinoline-5,8-dione (PT-262), a novel ROCK inhibitor blocks cytoskeleton function and cell migration |
2011-04-01 |
48 |
Ultraviolet Photoresponse of TiO(2) Nanotube Arrays Fabricated by Atomic Layer Deposition |
2011-01-01 |
49 |
Growth Mechanism of TiO(2) Nanotube Arrays in Nanopores of Anodic Aluminum Oxide on Si Substrates by Atomic Layer Deposition |
2011-01-01 |
50 |
Ultrafast Initial Growth Rate of Self-Assembled TiO(2) Nanorod Arrays Fabricated by Ti Anodization |
2011-01-01 |
51 |
Solution structure and phospho-PmrA recognition mode of PmrD from Klebsiella pneumoniae |
2010-12-01 |
52 |
Effect of Al-Trace Width on the Electromigration Failure Time of Flip-Chip Solder Joints |
2010-10-01 |
53 |
Measurement of electromigration activation energy in eutectic SnPb and SnAg flip-chip solder joints with Cu and Ni under-bump metallization |
2010-09-01 |
54 |
Covalent linkage of nanodiamond-paclitaxel for drug delivery and cancer therapy |
2010-08-06 |
55 |
Easy Process and Performance Improvement for Top-Emission Organic Light-Emitting Diodes by Using UV Glue as the Insulation Layer on Copper Substrate |
2010-07-01 |
56 |
Direct probe of heterojunction effects upon photoconductive properties of TiO(2) nanotubes fabricated by atomic layer deposition |
2010-06-04 |
57 |
Blocking hillock and whisker growth by intermetallic compound formation in Sn-0.7Cu flip chip solder joints under electromigration |
2010-05-01 |
58 |
All-to-all personalized exchange in generalized shuffle-exchange networks |
2010-03-28 |
59 |
Fabrication and Characteristics of Self-Aligned ZnO Nanotube and Nanorod Arrays on Si Substrates by Atomic Layer Deposition |
2010-01-01 |
60 |
Catalytic Behaviors in Modulating Enzymatic Activity through Different-sized Gold Nanoparticles |
2010-01-01 |
61 |
Gate-to-drain capacitance verifying the continuous-wave green laser crystallization n-TFT trapped charges distribution under dc voltage stress |
2009-12-21 |
62 |
Nonuniform and Negative Marker Displacements Induced by Current Crowding During Electromigration in Flip-Chip Sn-0.7Cu Solder Joints |
2009-12-01 |
63 |
Superparamagnetic and ferromagnetic Ni nanorod arrays fabricated on Si substrates using electroless deposition |
2009-10-14 |
64 |
Trend transformation of drain-current degradation under drain-avalanche hot-carrier stress for CLC n-TFTs |
2009-08-01 |
65 |
Video-assisted thoracoscopic surgery (VATS) for the treatment of hepatic hydrothorax: report of twelve cases |
2009-07-01 |
66 |
Improved upper and lower bounds on the optimization of mixed chordal ring networks |
2009-06-15 |
67 |
The Inductance Enhancement Study of Spiral Inductor Using Ni-AAO Nanocomposite Core |
2009-05-01 |
68 |
Effect of bump size on current density and temperature distributions in flip-chip solder joints |
2009-05-01 |
69 |
Thermomigration in Pb-free SnAg solder joint under alternating current stressing |
2009-03-02 |
70 |
Chest wall abscess due to Prevotella bivia |
2009-03-01 |
71 |
Electromigration in Sn-Cu intermetallic compounds |
2009-01-15 |
72 |
Direct measurement of hot-spot temperature in flip-chip solder joints with Cu columns under current stressing using infrared microscopy |
2009-01-01 |
73 |
INVESTIGATION OF JOULE HEATING EFFECT IN VARIOUS STAGES OF FAILURE IN FLIP-CHIP SOLDER JOINTS UNDER ACCELERATED ELECTROMIGRATION |
2009-01-01 |
74 |
Effects of electromigration on grain rotation behavior of SnAg solders |
2009-01-01 |
75 |
Effect of Passivation Opening Design on Electromigration Reliability Issue in Flip-Chip Solder Joints |
2009-01-01 |
76 |
Electrical characterization of fine-pitch compliant bumps |
2009-01-01 |
77 |
Constructing independent spanning trees for hypercubes and locally twisted cubes |
2009-01-01 |
78 |
Shape Effect of Passivation Opening on the Electric Behavior in Flip-chip SnAg Solder Joints under Electromigration |
2009-01-01 |
79 |
Optimal Design of Passivation/UBM Openings for Reducing Current Crowding Effect Under Electromigration of Flip-chip Solder Joint |
2009-01-01 |
80 |
All-to-All Personalized Exchange Algorithms in Generalized Shuffle-exchange Networks |
2009-01-01 |
81 |
In-situ Observation of the Failure Induced by Thermomigration of Interstitial Cu in Pb-free Flip Chip Solder Joints |
2009-01-01 |
82 |
「胚胎植入前基因診斷」之憲法問題 |
2009 |
83 |
Magnetic bead-based DNA detection with multi-layers quantum dots labeling for rapid detection of Escherichia coli O157:H7 |
2008-12-01 |
84 |
Failure induced by thermomigration of interstitial Cu in Pb-free flip chip solder joints |
2008-09-22 |
85 |
Direct measurement of hot-spot temperature in flip-chip solder joints under current stressing using infrared microscopy |
2008-08-01 |
86 |
Effect of migration and condensation of pre-existing voids on increase in bump resistance of flip chips on flexible substrates during electromigration |
2008-07-01 |
87 |
Electromigration-induced Pb and Sn whisker growth in SnPb solder stripes |
2008-07-01 |
88 |
Designating eukaryotic orthology via processed transcription units |
2008-06-01 |
89 |
The effect of pre-aging on the electromigration of flip-chip SnAg solder joints |
2008-06-01 |
90 |
Metal loaded zeolite adsorbents for phosphine removal |
2008-03-05 |
91 |
Classification and medical diagnosis using wavelet-based fuzzy neural networks |
2008-03-01 |
92 |
Enhanced green laser activation by antireflective gate structures in panel transistors |
2008-02-11 |
93 |
Effect of polyethylene glycol additives on pulse electroplating of SnAg solder |
2008-02-01 |
94 |
Hierarchical tensor approximation of multidimensional visual data |
2008-01-01 |
95 |
Effect of plasma processing gas composition on the nitrogen-doping status and visible light photocatalysis of TiO2 |
2007-10-25 |
96 |
Relieving hot-spot temperature during electromigration in solder and current crowding effects bumps by using Cu columns |
2007-10-01 |
97 |
Effect of void propagation on bump resistance due to electromigration in flip-chip solder joints using Kelvin structure |
2007-09-24 |
98 |
Enhanced hole mobility and reliability of panel epi-like silicon transistors using backside green laser activation |
2007-09-01 |
99 |
Relieving Sn whisker growth driven by oxidation on Cu leadframe by annealing and reflowing treatments |
2007-08-15 |
100 |
Preparation of N-doped TiO2 photocatalyst by atmospheric pressure plasma process for VOCs decomposition under UV and visible light sources |
2007-06-01 |
101 |
An efficient code generation algorithm for non-orthogonal DSP architecture |
2007-06-01 |
102 |
Node-pancyclicity and edge-pancyclicity of hypercube variants |
2007-04-15 |
103 |
Thermomigration in flip-chip SnPb solder joints under alternating current stressing |
2007-04-09 |
104 |
Study of B -> K-0(*)(1430)l(l)over-bar decays |
2007-04-01 |
105 |
Fabrication of ordered Ta(2)O(5) nanodots using an anodic aluminum oxide template on Si substrate |
2007-04-01 |
106 |
An effective and efficient code generation algorithm for uniform loops on non-orthogonal DSP architecture |
2007-03-01 |
107 |
Mechanism of electromigration-induced failure in flip-chip solder joints with a 10-mu m-thick Cu under-bump metallization |
2007-03-01 |
108 |
Electromigration issues in lead-free solder joints |
2007-03-01 |
109 |
Stress analysis of spontaneous Sn whisker growth |
2007-03-01 |
110 |
Effect of Al-trace degradation on Joule heating during electromigration in flip-chip solder joints |
2007-02-19 |
111 |
Stability of continuous-wave laser-crystallized epilike silicon transistors |
2007-02-12 |
112 |
Three-dimensional thermoelectrical simulation in flip-chip solder joints with thick underbump metallizations during accelerated electromigration testing |
2007-02-01 |
113 |
Low-temperature growth of ZnO nanorods in anodic aluminum oxide on Si substrate by atomic layer deposition |
2007-01-15 |
114 |
Effects of current crowding and Joule heating on reliability of solder joints |
2007-01-01 |
115 |
Study of electromigration of flip-chip solder joints using Kelvin probes |
2007-01-01 |
116 |
Continuous generation of TiO2 nanoparticles by an atmospheric pressure plasma-enhanced process |
2007-01-01 |
117 |
Effects of supercritical fluids activation on carbon nanotube field emitters |
2007-01-01 |
118 |
Fabrication of anodic aluminum oxide film on large-area glass substrate |
2007-01-01 |
119 |
Investigation of void nucleation and propagation during electromigration of flip-chip solder joints using x-ray microscopy |
2006-12-25 |
120 |
Characterization and field-emission properties of carbon nanotube arrays in nanoporous alumina template and on blank Si substrate |
2006-11-15 |
121 |
Hermetic packaging using eutectic SnPb solder and Cr/Ni/Cu metallurgy layer |
2006-11-01 |
122 |
Effect of al trace dimension on electromigration failure time of flip-chip solder joints |
2006-09-01 |
123 |
An efficient algorithm to find a double-loop network that realizes a given L-shape |
2006-08-14 |
124 |
Geometrical effect of bump resistance for flip-clip solder joints: Finite-element modeling and experimental results |
2006-08-01 |
125 |
Study of electromigration in eutectic SnPb solder stripes using the edge displacement method |
2006-08-01 |
126 |
Study of void formation due to electromigration in flip-chip solder joints using Kelvin bump probes |
2006-07-17 |
127 |
Effect of three-dimensional current and temperature distributions on void formation and propagation in flip-chip solder joints during electromigration |
2006-07-10 |
128 |
Interfacial reaction and shear strength of Pb-free SnAg2.5Cu0.86b0.5 and SnAg3.0Cu0.5Sb0.2 solder bumps on Au/Ni(P) metallization |
2006-06-29 |
129 |
Trap-state density in continuous-wave laser-crystallized single-grainlike silicon transistors |
2006-06-05 |
130 |
Critical length of electromigration for eutectic SnPb solder stripe |
2006-05-01 |
131 |
Aging influence of poly(ethylene glycol) suppressors of Cu electrolytes on gaps filling |
2006-05-01 |
132 |
Temperature and current-density distributions in flip-chip solder joints with Cu traces |
2006-05-01 |
133 |
Effect of Al-trace dimension on Joule heating and current crowding in flip-chip solder joints under accelerated electromigration |
2006-04-24 |
134 |
Redistribution of Pb-rich phase during electromigration in eutectic SnPb solder stripes |
2006-03-01 |
135 |
Infrared microscopy of hot spots induced by Joule heating in flip-chip SnAg solder joints under accelerated electromigration |
2006-01-09 |
136 |
Relieving the current crowding effect in flip-chip solder joints during current stressing |
2006-01-01 |
137 |
Roles of additives in damascene copper electropolishing |
2006-01-01 |
138 |
Metallurgical reactions of Sn-3.5Ag solder with various thicknesses of electroplated Ni/Cu under bump metallization |
2005-10-01 |
139 |
Measurement of electromigration parameters of lead-free SnAg3.5 solder using U-groove lines |
2005-10-01 |
140 |
Microstructural evolution during electromigration in eutectic SnAg solder bumps |
2005-09-01 |
141 |
Electromigration in pb-free SnAg3.8Cu0.7 solder stripes |
2005-08-01 |
142 |
Study of electromigration in thin tin film using edge displacement method |
2005-07-01 |
143 |
Threshold current density of electromigration in eutectic SnPb solder |
2005-05-16 |
144 |
A two-level scheduling method: an effective parallelizing technique for uniform nested loops on a DSP multiprocessor |
2005-02-15 |
145 |
Two-additive electrolytes for superplanarizing damascene Cu metals |
2005-01-01 |
146 |
Cross interactions on interfacial compound formation of solder bumps and metallization layers during reflow |
2004-12-01 |
147 |
Thermal gradient in solder joints under electrical-current stressing |
2004-11-01 |
148 |
Electromigration failure mechanisms for SnAg3.5 solder bumps on Ti/Cr-Cu/Cu and Ni(P)/Au metallization pads |
2004-10-15 |
149 |
Microstructure evolution during electromigration in eutectic SnPb solder bumps |
2004-08-01 |
150 |
Tin whisker growth driven by electrical currents |
2004-06-15 |
151 |
Electromigration at the high-Pb-eutectic SnPb solder interface |
2004-02-01 |
152 |
Abnormal and regioselective Wacker oxidation of 1,5-dienes |
2003-09-01 |
153 |
A release combined scheduling scheme for non-uniform dependence loops |
2002-03-01 |
154 |
Enhanced dopant activation and elimination of end-of-range defects in BF2+-implanted silicon-on-insulator by high-density current |
2001-12-10 |
155 |
Design of a scalable multiprocessor architecture and its simulation |
2001-09-01 |
156 |
A complete fault diagnostic system for automated vehicles operating in a platoon |
2001-07-01 |
157 |
Effects of construction on laterally loaded pile groups |
2001-05-01 |
158 |
An optimized three region partitioning technique to maximize parallelism of nested loops with non-uniform dependences |
2001-05-01 |
159 |
ODCHP: a new effective mechanism to maximize parallelism of nested loops with non-uniform dependences |
2001-03-15 |
160 |
Enchanced linked-based cache coherence protocols with a hardware mechanism to reduce the migratory sharing overhead |
2000-12-01 |
161 |
Lane changing with look-down reference systems on automated highways |
2000-09-01 |
162 |
Lateral control of commercial heavy vehicles |
2000-01-01 |
163 |
A fault-tolerant object service on CORBA |
1999-11-01 |
164 |
New distributed arithmetic algorithm and its application to IDCT |
1999-08-01 |
165 |
Grouping memory consistency model for parallel-multithreaded shared-memory multiprocessor systems |
1999-03-01 |
166 |
A new relaxed memory consistency model for shared-memory multiprocessors with parallel-multithreaded processing elements |
1998-12-01 |
167 |
A performance study of cache coherence protocols and write coaches for parallel-multithreaded shared-memory multiprocessors |
1998-01-01 |
168 |
New program model for program partitioning on NUMA multiprocessor systems |
1996-11-01 |
169 |
Exploiting communication complexity for Boolean matching |
1996-10-01 |
170 |
A loop partition technique for reducing cache bank conflict in multithreaded architecture |
1996-01-01 |
171 |
A PRECISION EXPERIMENT ON ELECTRONS, PHOTONS AND MUONS AT LHC |
1993-02-01 |
172 |
A CLASS OF ADDITIVE MULTIPLICATIVE GRAPH FUNCTIONS |
1987-05-01 |
173 |
The heterojunction effects of TiO2 nanotubes fabricated by atomic layer deposition on photocarrier transportation direction |
1970-01-01 |