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戴亞翔

戴亞翔 Tai, Ya-Hsiang

電子郵件／E-mail：yhtai@mail.nctu.edu.tw

服務單位／Department：電機學院 ／ 顯示科技研究所

著作期間／Publish Period：1993-08-01 - 2014-09-01

著作統計／Statistics

Article（85）
Books（2）
Patents（15）
Plan（13）
Proceedings Paper（30）
Thesis（59）

Article

序號
No.		 標題
Title		 著作日期
Date
1 Ultrahigh Sensitivity Self-Amplification Phototransistor Achieved by Automatic Energy Band Lowering Behavior 2014-09-01
2 Temperature-Dependent Instability of Bias Stress in InGaZnO Thin-Film Transistors
 2014-06-01
3 On the Origin of Anomalous OffCurrent Under Hot Carrier Stress in p-Channel DDDMOS Transistors With STI Structure
 2014-06-01
4 Dependence of the Noise Behavior on the Drain Current for Thin Film Transistors
 2014-02-01
5 Improvement mechanism of resistance random access memory with supercritical CO2 fluid treatment
 2014-01-01
6 The Time Response of the On-Current for the Amorphous In-Ga-Zn-O Thin Film Transistor to the Illumination Pulse
 2014-01-01
7 Reduction of defect formation in amorphous indium-gallium-zinc-oxide thin film transistors by N2O plasma treatment
 2013-11-28
8 Abnormal threshold voltage shift under hot carrier stress in Ti1-xNx/HfO2 p-channel metal-oxide-semiconductor field-effect transistors
 2013-09-28
9 N2O plasma treatment suppressed temperature-dependent sub-threshold leakage current of amorphous indium-gallium-zinc-oxide thin film transistors
 2013-09-01
10 Characterization of environment-dependent hysteresis in indium gallium zinc oxide thin film transistors
 2013-09-01
11 Test and Analysis of the ESD Robustness for the Diode-Connected a-IGZO Thin Film Transistors
 2013-08-01
12 Abnormal sub-threshold swing degradation under dynamic hot carrier stress in HfO2/TiN n-channel metal-oxide-semiconductor field-effect-transistors
 2013-07-08
13 Origin of Hopping Conduction in Graphene-Oxide-Doped Silicon Oxide Resistance Random Access Memory Devices
 2013-05-01
14 Charge Quantity Influence on Resistance Switching Characteristic During Forming Process
 2013-04-01
15 Low Temperature Improvement Method on Zn:SiOx Resistive Random Access Memory Devices
 2013-04-01
16 Large-Area Capacitive Active Touch Panel Using the Method of Pulse Overlapping Detection
 2013-03-01
17 Characteristics and Mechanisms of Silicon-Oxide-Based Resistance Random Access Memory
 2013-03-01
18 Hole injection-reduced hot carrier degradation in n-channel metal-oxide-semiconductor field-effect-transistors with high-k gate dielectric
 2013-02-18
19 Investigation of Lateral Trap Position by Random Telegraph Signal Analysis in Moderate Inversion in n-Channel MOSFETs
 2013-01-01
20 Origin of Hopping Conduction in Sn-Doped Silicon Oxide RRAM With Supercritical CO2 Fluid Treatment
 2012-12-01
21 Bipolar Resistive RAM Characteristics Induced by Nickel Incorporated Into Silicon Oxide Dielectrics for IC Applications
 2012-12-01
22 Boosted Gain of the Differential Amplifier Using the Second Gate of the Dual-Gate a-IGZO TFTs
 2012-12-01
23 The suppressed negative bias illumination-induced instability in In-Ga-Zn-O thin film transistors with fringe field structure
 2012-11-26
24 High-stability oxygen sensor based on amorphous zinc tin oxide thin film transistor
 2012-06-25
25 Active matrix touch sensor detecting time-constant change implemented by dual-gate IGZO TFTs
 2012-06-01
26 Suppress temperature instability of InGaZnO thin film transistors by N2O plasma treatment, including thermal-induced hole trapping phenomenon under gate bias stress
 2012-04-30
27 Abnormal Subthreshold Leakage Current at High Temperature in InGaZnO Thin-Film Transistors
 2012-04-01
28 Asymmetric Carrier Conduction Mechanism by Tip Electric Field in WSiOX Resistance Switching Device
 2012-03-01
29 Three-Transistor AMOLED Pixel Circuit With Threshold Voltage Compensation Function Using Dual-Gate IGZO TFT
 2012-03-01
30 Silicon introduced effect on resistive switching characteristics of WO(X) thin films 2012-01-09
31 Oxygen-Adsorption-Induced Anomalous Capacitance Degradation in Amorphous Indium-Gallium-Zinc-Oxide Thin-Film-Transistors under Hot-Carrier Stress
 2012-01-01
32 The Deterioration of a-IGZO TFTs Owing to the Copper Diffusion after the Process of the Source/Drain Metal Formation
 2012-01-01
33 Study of Resistive Switching Characteristics on a Temperature-Sensitive FeOx-Transition Layer in a TiN/SiO2/FeOx/Fe Structure
 2012-01-01
34 Surface states related the bias stability of amorphous In-Ga-Zn-O thin film transistors under different ambient gasses
 2011-12-30
35 Paraffin wax passivation layer improvements in electrical characteristics of bottom gate amorphous indium-gallium-zinc oxide thin-film transistors
 2011-12-30
36 Gap-Type a-Si TFTs for Front Light Sensing Application
 2011-12-01
37 Effect of Lateral Body Terminal on Silicon-Oxide-Nitride-Oxide-Silicon Thin-Film Transistors
 2011-10-01
38 On-Current Decrease After Erasing Operation in the Nonvolatile Memory Device With LDD Structure
 2011-08-01
39 Gap-Type a-Si TFTs for Backlight Sensing Application
 2011-08-01
40 Environment-dependent thermal instability of sol-gel derived amorphous indium-gallium-zinc-oxide thin film transistors
 2011-04-11
41 Anomalous on-current and subthreshold swing improvement in low-temperature polycrystalline-silicon thin-film transistors under Gate bias stress
 2011-03-21
42 Generalized Hot-Carrier Degradation and Its Mechanism in Poly-Si TFTs Under DC/AC Operations
 2011-03-01
43 Charge-Trapping-Induced Parasitic Capacitance and Resistance in SONOS TFTs Under Gate Bias Stress
 2011-03-01
44 Improving Resistance Switching Characteristics with SiGeO(x)/SiGeON Double Layer for Nonvolatile Memory Applications 2011-01-01
45 H(2)O-Assisted O(2) Adsorption in Sol-Gel Derived Amorphous Indium Gallium Zinc Oxide Thin Film Transistors 2011-01-01
46 Influence of H(2)O Dipole on Subthreshold Swing of Amorphous Indium-Gallium-Zinc-Oxide Thin Film Transistors 2011-01-01
47 Transient Effect Assisted NBTI Degradation in p-Channel LTPS TFTs under Dynamic Stress
 2011-01-01
48 Carrier Transport and Multilevel Switching Mechanism for Chromium Oxide Resistive Random-Access Memory 2011-01-01
49 Bias-induced oxygen adsorption in zinc tin oxide thin film transistors under dynamic stress
 2010-06-28
50 An Empirical Defect-Related Photo Leakage Current Model for LTPS TFTs Based on the Unit Lux Current
 2010-05-01
51 Characterization of the Channel-Shortening Effect on P-Type Poly-Si TFTs
 2010-03-01
52 Analysis of Anomalous Capacitance Induced by TAGIDL in p-Channel LTPS TFTs
 2010-01-01
53 Degradation of Low Temperature Polycrystalline Silicon Thin Film Transistors under Negative Bias Temperature Instability Stress with Illumination Effect
 2010-01-01
54 Thermal analysis on the degradation of poly-silicon TFTs under AC stress
 2009-08-15
55 Degradation Mechanism of Poly-Si TFTs Dynamically Operated in OFF Region
 2009-03-01
56 Photosensitivity Analysis of Low-Temperature Poly-Si Thin-Film Transistor Based on the Unit-Lux-Current
 2009-01-01
57 Dependence of Photosensitive Effect on the Defects Created by DC Stress for LTPS TFTs
 2008-12-01
58 The Linear Combination Model for the Degradation of Amorphous Silicon Thin Film Transistors under Drain AC Stress
 2008-08-01
59 Novel gate-all-around poly-Si TFTs with multiple nanowire channels
 2008-08-01
60 Characterization of poly-Si TFT variation using interdigitated method
 2008-08-01
61 Variation and mismatch effects of the low-temperature poly-Si TFTs on the circuit for the X-ray active matrix sensor
 2008-05-01
62 Reduction of photoleakage current in polycrystalline silicon thin-film transistor using NH(3) plasma treatment on buffer layer
 2008-04-14
63 Elimination of photoleakage current in poly-Si TFTs using a metal-shielding structure 2008-01-01
64 A new pixel circuit compensating for brightness variation in lagre size and high resolution AMOLED displays
 2007-12-01
65 A statistical model for simulating the effect of UPS TFT device variation for SOP applications
 2007-12-01
66 Statistical study on the temperature dependence of the turn-on characteristics for p-type LTPS TFTs
 2007-08-01
67 Investigation of source-follower type analog buffer using low temperature poly-Si TFTs
 2007-03-01
68 Degradation of the capacitance-voltage behaviors of the low-temperature polysilicon TFTs under DC stress
 2007-01-01
69 Analysis of poly-Si TFT degradation under gate pulse stress using the slicing model
 2006-12-01
70 Threshold-voltage-compensation methods for AMOLED pixel and analog buffer circuits 2006-09-01
71 New pixel circuits for driving active matrix organic light emitting diodes
 2006-02-01
72 Degradation of capacitance-voltage characteristics induced by self-heating effect in poly-si TFTs 2006-01-01
73 A source-follower type analog buffer using poly-Si TFTs with large design windows
 2005-11-01
74 Effects of channel width on electrical characteristics of polysilicon TFTs with multiple nanowire channels
 2005-10-01
75 A New Pixel Circuit for Driving Organic Light-Emitting Diode With Low Temperature Polycrystalline Silicon Thin-Film Transistors
 2005-09-01
76 Improvement of reliability for polycrystalline thin-film transistors using self-aligned fluorinated silica glass spacers 2005-01-01
77 Enhanced performance of poly-Si thin film transistors using fluorine ions implantation 2005-01-01
78 High-performance polycrystalline silicon thin-film transistor with multiple nanowire channels and lightly doped drain structure
 2004-05-10
79 A distributed charge storage with GeO2 nanodots
 2004-04-05
80 Reducing threshold voltage shifts in amorphous silicon thin film transistors by hydrogenating the gate nitride prior to amorphous silicon deposition 1997-09-01
81 Effects of the rear interface states and fixed charges on the electrical characteristics of thin film transistors with thin amorphous silicon layers
 1996-06-01
82 Electrical properties of amorphous silicon films with different thicknesses in metal/insulator/semiconductor structures
 1996-05-01
83 ANOMALOUS BIAS-STRESS-INDUCED UNSTABLE PHENOMENA OF HYDROGENATED AMORPHOUS-SILICON THIN-FILM TRANSISTORS 1995-10-23
84 INSTABILITY MECHANISMS FOR THE HYDROGENATED AMORPHOUS-SILICON THIN-FILM TRANSISTORS WITH NEGATIVE AND POSITIVE BIAS STRESSES ON THE GATE ELECTRODES 1995-07-03
85 CHARACTERISTICS OF POLYCRYSTALLINE SILICON THIN-FILM TRANSISTORS WITH THIN OXIDE NITRIDE GATE STRUCTURES
 1993-08-01

Books

序號
No.		 標題
Title		 著作日期
Date
1 國立交通大學光電工程學系戴亞翔教師升等送審著作論文集 2011
2 TFT-LCD面板的驅動與設計 2006

Patents

序號
No.		 標題
Title		 著作日期
Date
1 主動式Ｘ光感測電路及其感測方法
 2014-06-11
2 一種應用於顯示器之長時間照光電流衰退現象的校正方法
 2014-06-11
3 一種主動式觸控感測電路裝置
 2014-06-01
4 主動式Ｘ光感測電路及其感測方法
 2013-11-16
5 液晶顯示面板及其掃描線補償電路
 2013-09-21
6 一種主動式觸控感測電路裝置
 2012-11-16
7 一種應用於顯示器之長時間照光電流衰退現象的校正方法
 2012-08-16
8 具環境光感測功能之液晶顯示器及其方法
 2012-02-21
9 畫素驅動電路及其驅動方法與應用
 2012-01-21
10 画素駆動回路とその駆動方法 2011-11-25
11 液晶顯示面板及其掃描線補償電路
 2011-06-01
12 具環境光感測功能之液晶顯示器及其方法
 2009-06-01
13 LCD with ambient light sense function and method thereof
 2009-05-28
14 畫素驅動電路及其驅動方法與應用
 2008-10-16
15 画素駆動回路とその駆動方法、及びそれを用いた液晶表示装置 2007-10-18

Plan

序號
No.		 標題
Title		 著作日期
Date
1 氧化物半導體薄膜電晶體透明感測電路之研究 2014
2 雙閘極氧化物半導體薄膜電晶體應用於X光主動感測陣列之研究 2013
3 利用偵測RC時間延遲改變之主動式觸控面板 2013
4 雙閘極氧化物半導體薄膜電晶體應用於X光主動感測陣列之研究 2012
5 利用偵測RC時間延遲改變之主動式觸控面板 2012
6 雙閘極氧化物半導體薄膜電晶體應用於X光主動感測陣列之研究 2011
7 非晶矽薄膜電晶體作為光感測元件及電路之研究(II)
 2010
8 非晶矽薄膜電晶體作為光感測元件及電路之研究
 2009
9 低溫複晶矽薄膜電晶體電容特性及模型之研究 2007
10 高效率智慧型面板之研究---子計畫四：智慧型面板內建電路設計(III) 2006
11 奈米碳管功率放大器研究
 2005
12 高效率智慧型面板之研究-子計畫四：智慧型面板內建電路設計(II)
 2005
13 高效率智慧型面板之研究---子計畫四---智慧型面板內建電路設計(I)
 2004

Proceedings Paper

序號
No.		 標題
Title		 著作日期
Date
1 CAMERA FREE 3-DIMENSIONAL VIRTUAL TOUCH DISPLAY WITH MULTI-USER IDENTIFICATION 2012-01-01
2 Effects of Post-Deposition Annealing Atmosphere and Duration on Sol-Gel Derived Amorphous Indium-Zinc-Oxide Thin Film Transistors
 2011-01-01
3 The Impact of Active Layer Pre-Treatment on Bias Stress Stability of Sol-gel Derived Amorphous Indium-Gallium-Zinc-Oxide Thin Film Transistor
 2011-01-01
4 Formation and nonvolatile memory characteristics of W nanocrystals by in-situ steam generation oxidation
 2010-12-30
5 Improvement of the performance of ZnO TFTs by low-temperature supercritical fluid technology treatment
 2009-12-25
6 Self-Modulated Amorphous Front and Back Light Sensors with Wide Dynamic Range 2009-01-01
7 Characterization of device degradation of poly-Si TFTs under dynamic operation with drain biased 2008-01-01
8 Improving electrical performance of the scaled low-temperature poly-Si thin film transistors using vacuum encapsulation technique 2008-01-01
9 Advanced gate-all-around fin-like poly-Si TFTs with multiple nanowire channels 2008-01-01
10 Analysis of P-type poly-Si TFT degradation under dynamic gate voltage stress using the slicing model 2007-01-01
11 Estimation of the effect of channel shortening for P-type poly-Si TFTs under AC stress 2007-01-01
12 Dynamic stress effects on the reliability of poly-Si TFT 2007-01-01
13 A low temperature polycrystalline silicon thin film transistor phase locked loop circuit used for clock regeneration 2007-01-01
14 Highly reliable integrated amorphous silicon thin film transistors gate driver 2007-01-01
15 Capacitance-voltage behaviors of the LTPS TFTs before and after DC stress explained by the slicing model 2007-01-01
16 Study on electrical degradation of p-type low-temperature polycrystalline silicon thin film transistors with C-V measurement analysis
 2006-11-25
17 Statistical study on the states in the low-temperature poly-silicon films with thin film transistors
 2006-11-25
18 Source-Follower Type Analog Buffer Using Low Temperature Poly-Si TFTs for AMLCDs 2006-01-01
19 Damage effect of fluorine implantation on PECVD alpha-SiOC barrier dielectric
 2005-08-01
20 New analog buffer circuit using low temperature polycrystalline thin film transistors for active matrix displays 2005-01-01
21 A new voltage driving pixel circuit for active matrix organic light emitting diodes 2005-01-01
22 A new pixel circuit for driving organic light emitting diodes with low temperature polycrystalline thin film transistors 2005-01-01
23 A new evaluation method of the threshold voltage for a low temperature poly-silicon thin film transistor in a source follower configuration 2005-01-01
24 Evaluation of the operation for the shift register circuit implemented by low temperature poly-Si thin-film transistors 2005-01-01
25 A novel analogue buffer using poly-Si TFTs for active matrix displays 2005-01-01
26 Diverse instability behaviors for n-channel low-temperature polycrystalline silicon thin film transistors 2005-01-01
27 New pixel circuits for driving organic light emitting diodes with low temperature polycrystalline Si thin film transistors 2005-01-01
28 Statistical study on the temperature dependence of the turn-on characteristics for p-type LTPS TFTs 2005-01-01
29 High performance and high reliability polysilicon thin-film transistors with multiple nano-wire channels 2004-01-01
30 Process-related instability mechanisms for the hydrogenated amorphous silicon thin film transistors 1995-01-01

Thesis

序號
No.		 標題
Title		 著作日期
Date
1 具有自動評分功能的類別圖考試系統 2013
2 大尺寸之脈衝重疊偵測主動觸控面板的實作研究
 2013
3 偏壓以及照光下 非晶氧化銦鎵鋅薄膜電晶體之雜訊行為研究 2013
4 以全數位資料驅動操作之液晶顯示器畫素電路
 2013
5 非晶氧化銦鎵鋅薄膜電晶體對動態光照及正向偏壓之時間響應的研究 2013
6 保護層應用在非晶態銦鎵鋅氧薄膜電晶體 之電性物理機制研究 2013
7 銅製程對非晶矽氧化銦鎵鋅薄膜電晶體特性影響之研究
 2012
8 應用於主動畫素感測器 之元件的雜訊分析與補償方法
 2012
9 使用雙閘極IGZO電晶體之新型電路 2012
10 脈衝光照及正向偏壓下對非晶氧化銦鎵鋅薄膜電晶體時間響應之研究 2012
11 用於主動式矩陣產品陣列測試技術之開發程序 2012
12 主動陣列觸控面板與光感測器之畫素電路研究
 2012
13 薄膜電晶體之光電特性研究 2011
14 提升三維多點互動系統使用者辨識能力之多圖騰演算法開發 2011
15 利用少數TFT實行元件特性變異補償之主動式光感測電路研究 2011
16 高精細X光圖像感測器之主動畫素電路的研究 2011
17 低溫複晶矽薄膜電晶體背光下之單位光通量漏電流特性分析
 2010
18 低溫多晶矽薄膜電晶體元件特性應用於光感測器之研究 2010
19 以閘極間隙型非晶矽薄膜電晶體實現內建光學式觸控面板之可行性研究
 2010
20 具有臨界電壓補償功能雙閘極IGZO TFT電路之研究
 2010
21 利用雙閘極氧化銦鎵鋅薄膜電晶體實現主動式觸控偵測電路之研究
 2010
22 利用脈衝重疊偵測之主動觸控面板的研究
 2010
23 新穎性SONOS非揮發性記憶體物理機制與研究 2008
24 多晶矽薄膜電晶體在關閉區閘極脈衝電壓操作下的劣化行為研究
 2008
25 具有高感測範圍之非晶矽薄膜電晶體光感測器
 2008
26 低溫複晶矽薄膜電晶體之單位光通量漏電流特性分析
 2008
27 非晶矽薄膜電晶體開電流光敏感度用於背光感測之研究
 2008
28 具真空間隙之T型閘極低溫多晶矽薄膜電晶體之研究 2008
29 多晶矽薄膜電晶體的空間與時間變動性探討
 2008
30 低壓降線性穩壓電路的靜電放電防護應用
 2007
31 N型複晶矽薄膜電晶體在閘極開區域脈衝電壓及汲極直流偏壓下的劣化研究
 2007
32 低溫複晶矽薄膜電晶體在閘極關閉區脈衝電壓及汲極直流偏壓下的劣化研究
 2007
33 非晶矽薄膜電晶體在汲極直流或交流操作下的劣化行為研究
 2007
34 低溫複晶矽薄膜電晶體之溫度效應用於溫度感測器之研究
 2007
35 低溫複晶矽薄膜電晶體應用於光感測之可行性研究
 2007
36 低溫複晶矽薄膜電晶體藉由直流偏壓製造缺陷態之光漏電特性分析
 2007
37 Study on the Uniformity Improvement of Low-Temperature Polycrystalline-Silicon Thin Film Transistors with the Device Structures and Compensated Circuits
 2006
38 低溫多晶矽薄膜電晶體直流偏壓下電容-電壓特性之研究
 2006
39 低溫複晶矽薄膜電晶體在閘極交流電壓下的劣化研究
 2006
40 低溫多晶矽薄膜電晶體微觀變動行為之通道寬度相關性之研究
 2006
41 N型複晶矽薄膜電晶體在閘極負電壓脈波汲極直流偏壓下的劣化研究
 2006
42 介面信號相位鎖定之低溫多晶矽電晶體電路之研究
 2006
43 高穩定度積體式非晶矽薄膜電晶體之閘極驅動電路
 2006
44 鍺鋯合金非揮發性記憶體之製作及研究
 2006
45 N型低溫多晶矽薄膜電晶體元件特性及可靠度之統計性研究
 2005
46 對應低溫多晶矽薄膜電晶體變動性之電路模擬技術之研究
 2005
47 相位量測與三維掃描及其實驗驗證 2005
48 N型低溫複晶矽薄膜電晶體在閘極交流電壓下的劣化研究
 2005
49 低溫多晶矽薄膜電晶體元件C-V特性劣化行為之研究
 2005
50 低溫多晶矽薄膜電晶體元件特性分布於用電路模擬之研究
 2005
51 主動式X光感測器用複晶矽薄膜電晶體電路之研究
 2005
52 低溫多晶矽薄膜電晶體非匹配效應之研究
 2005
53 利用環型震盪器探討元件變異對低溫多晶矽薄膜電晶體電路效能之研究
 2005
54 低溫多晶矽薄膜電晶體溫度效應統計性研究
 2004
55 低溫多晶矽薄膜電晶體的均勻度統計性研究
 2004
56 低溫多晶矽薄膜電晶體變動性之可靠度的研究
 2004
57 主動式顯示器用複晶矽薄膜電晶體補償電路之研究
 2004
58 低溫多晶矽薄膜電晶體數位電路變動性之模擬研究
 2004
59 非晶矽薄膜電晶體特性及可靠度之研究 1995
電機學院