1 |
A fluorescence turn-on probe for cysteine and homocysteine based on thiol-triggered benzothiazolidine ring formation |
2014-11-07 |
2 |
High Mobility Field-Effect Thin Film Transistor Using Room-Temperature High-kappa Gate Dielectrics |
2014-10-01 |
3 |
Efficiency improvement of GaN-based ultraviolet light-emitting diodes with reactive plasma deposited AlN nucleation layer on patterned sapphire substrate |
2014-09-16 |
4 |
Amorphous bilayer TiO2-InGaZnO thin film transistors with low drive voltage |
2014-09-01 |
5 |
An Oxygen Gettering Scheme for Improving Device Mobility and Subthreshold Swing of InGaZnO-Based Thin-Film Transistor |
2014-09-01 |
6 |
Effect of the Circle-Grid Electrodes on Concentrated GaAs Solar Cell Efficiency |
2014-09-01 |
7 |
Performance enhancement of GaN-based flip-chip ultraviolet light-emitting diodes with a RPD AlN nucleation layer on patterned sapphire substrate |
2014-08-01 |
8 |
Observation of the high-sensitivity plasmonic dipolar antibonding mode of gold nanoantennas in evanescent waves |
2014-07-21 |
9 |
Increased risk of major depression subsequent to a first-attack and non-infection caused urticaria in adolescence: a nationwide population-based study |
2014-07-11 |
10 |
Enhanced Performance of Organic Thin Film Solar Cells Using Electrodes with Nanoimprinted Light-Diffraction and Light-Diffusion Structures |
2014-05-14 |
11 |
High-Efficiency and Crack-Free InGaN-Based LEDs on a 6-inch Si (111) Substrate With a Composite Buffer Layer Structure and Quaternary Superlattices Electron-Blocking Layers |
2014-05-01 |
12 |
Highly Efficient Polymer Tandem Cells and Semitransparent Cells for Solar Energy |
2014-05-01 |
13 |
Dark current suppression of amorphous selenium based photosensors by the ZnO hole blocking layer |
2014-05-01 |
14 |
Association of Interleukin-16 Polymorphisms with Graves' Disease in a Taiwanese Population |
2014-04-30 |
15 |
Natural substrate lift-off technique for vertical light-emitting diodes |
2014-04-01 |
16 |
Increased Risk of Major Depression in the Three Years following a Femoral Neck Fracture-A National Population-Based Follow-Up Study |
2014-03-13 |
17 |
Structural stability of diffusion barriers in thermoelectric SbTe: From first-principles calculations to experimental results |
2014-03-05 |
18 |
High efficiency InGaN/GaN light emitting diodes with asymmetric triangular multiple quantum wells |
2014-03-03 |
19 |
Improvement of emission uniformity by using micro-cone patterned PDMS film |
2014-02-24 |
20 |
Dependence of the Noise Behavior on the Drain Current for Thin Film Transistors |
2014-02-01 |
21 |
An efficient synthesis of the C27-C45 fragment of lagunamide A, a cyclodepsipeptide with potent cytotoxic and antimalarial properties |
2014-01-31 |
22 |
Resonant modes of 12-fold symmetric defect free photonic quasicrystal |
2014-01-27 |
23 |
Realization of Metal-Insulator Transition and Oxidation in Silver Nanowire Percolating Networks by Terahertz Reflection Spectroscopy |
2014-01-08 |
24 |
High Mobility Bilayer Metal-Oxide Thin Film Transistors Using Titanium-Doped InGaZnO |
2014-01-01 |
25 |
The Time Response of the On-Current for the Amorphous In-Ga-Zn-O Thin Film Transistor to the Illumination Pulse |
2014-01-01 |
26 |
Frequency measurement of the 6P(3/2) -> 7S(1/2) transition of thallium |
2013-12-30 |
27 |
Room temperature ultraviolet GaN metal-coated nanorod laser |
2013-11-04 |
28 |
Fully room-temperature IGZO thin film transistors adopting stacked gate dielectrics on flexible polycarbonate substrate |
2013-11-01 |
29 |
Fluorescence Intrinsic Characterization of Excitation-Emission Matrix Using Multi-Dimensional Ensemble Empirical Mode Decomposition |
2013-11-01 |
30 |
Depth-resolved confocal micro-Raman spectroscopy for characterizing GaN-based light emitting diode structures |
2013-11-01 |
31 |
Electrically driven green, olivine, and amber color nanopyramid light emitting diodes |
2013-10-07 |
32 |
The Post-Resuscitative Urinalysis Associate the Survival of Patients with Non-Traumatic Out-of-Hospital Cardiac Arrest |
2013-10-04 |
33 |
A Versatile Fluoro-Containing Low-Bandgap Polymer for Efficient Semitransparent and Tandem Polymer Solar Cells |
2013-10-01 |
34 |
Temperature-dependent characteristics of junctionless bulk transistor |
2013-09-23 |
35 |
High voltage characteristics of junctionless poly-silicon thin film transistors |
2013-09-16 |
36 |
High performance IGZO/TiO2 thin film transistors using Y2O3 buffer layers on polycarbonate substrate |
2013-09-01 |
37 |
Room-temperature flexible thin film transistor with high mobility |
2013-09-01 |
38 |
Coherent phonon manipulation in coupled mechanical resonators |
2013-08-01 |
39 |
Investigation of Characteristics of Al2O3/n-In (x) Ga1-x As (x=0.53, 0.7, and 1) Metal-Oxide-Semiconductor Structures |
2013-08-01 |
40 |
Fabrication, characterization and simulation of Omega-gate twin poly-Si FinFET nonvolatile memory |
2013-07-22 |
41 |
Absolute frequency measurements of the molecular iodine hyperfine transitions at 535 nm |
2013-07-01 |
42 |
Characteristics of Gate-All-Around Junctionless Poly-Si TFTs With an Ultrathin Channel |
2013-07-01 |
43 |
Study of Nonpolar GaN/ZnO Heterostructures Grown by Molecular Beam Epitaxy |
2013-07-01 |
44 |
Formation of Nanostructured Fullerene Interlayer through Accelerated Self-Assembly and Cross-Linking of Trichlorosilane Moieties Leading to Enhanced Efficiency of Photovoltaic Cells |
2013-06-25 |
45 |
A Flexible IGZO Thin-Film Transistor With Stacked TiO2-Based Dielectrics Fabricated at Room Temperature |
2013-06-01 |
46 |
Device and Circuit Performance Estimation of Junctionless Bulk FinFETs |
2013-06-01 |
47 |
Improving Breakdown Voltage of LDMOS Using a Novel Cost Effective Design |
2013-05-01 |
48 |
Flexible InGaZnO thin film transistors using stacked Y2O3/TiO2/Y2O3 gate dielectrics grown at room temperature |
2013-04-01 |
49 |
A New sp2-sp2 Dialkylethylene-Bridged Heptacyclic Ladder-Type Arene for High Efficiency Polymer Solar Cells |
2013-04-01 |
50 |
Parallel Screening of Wild-Type and Drug-Resistant Targets for Anti-Resistance Neuraminidase Inhibitors |
2013-02-20 |
51 |
Characteristic of p-Type Junctionless Gate-All-Around Nanowire Transistor and Sensitivity Analysis |
2013-02-01 |
52 |
Performance Comparison Between Bulk and SOI Junctionless Transistors |
2013-02-01 |
53 |
A 2-bit/Cell Gate-All-Around Flash Memory of Self-Assembled Silicon Nanocrystals |
2013-02-01 |
54 |
Cost-Effective and Self-Textured Gallium-Doped Zinc Oxide Front Contacts for Hydrogenated Amorphous Silicon Thin-Film Solar Cells |
2013-02-01 |
55 |
Synthesis of a New Ladder-Type Benzodi(cyclopentadithiophene) Arene with Forced Planarization Leading to an Enhanced Efficiency of Organic Photovoltaics |
2012-10-23 |
56 |
Enhanced internal quantum efficiency in graphene/InGaN multiple-quantum-well hybrid structures |
2012-08-06 |
57 |
Light Extraction Enhancement of GaN-Based Light-Emitting Diodes Using Crown-Shaped Patterned Sapphire Substrates |
2012-07-15 |
58 |
Characteristics of Polarized Light Emission in a-Plane GaN-Based Multiple Quantum Wells |
2012-07-01 |
59 |
Fabrication and luminescent properties of core-shell InGaN/GaN multiple quantum wells on GaN nanopillars |
2012-06-25 |
60 |
Ultraviolet emission efficiency enhancement of a-plane AlGaN/GaN multiple-quantum-wells with increasing quantum well thickness |
2012-06-25 |
61 |
Lasing action in gallium nitride quasicrystal nanorod arrays |
2012-05-21 |
62 |
Somatic LMCD1 mutations promoted cell migration and tumor metastasis in hepatocellular carcinoma |
2012-05-01 |
63 |
Dithienocarbazole-Based Ladder-Type Heptacyclic Arenes with Silicon, Carbon, and Nitrogen Bridges: Synthesis, Molecular Properties, Field-Effect Transistors, and Photovoltaic Applications |
2012-04-24 |
64 |
High-Reliability Trigate Poly-Si Channel Flash Memory Cell With Si-Nanocrystal Embedded Charge-Trapping Layer |
2012-04-01 |
65 |
7,7 ''-Dimethoxyagastisflavone-induced Apoptotic or Autophagic Cell Death in Different Cancer Cells |
2012-04-01 |
66 |
Efficiency and Droop Improvement in InGaN/GaN Light-Emitting Diodes by Selective Carrier Distribution Manipulation |
2012-04-01 |
67 |
Large Area of Ultraviolet GaN-Based Photonic Quasicrystal Laser |
2012-04-01 |
68 |
Light Output Enhancement of GaN-Based Light-Emitting Diodes by Optimizing SiO2 Nanorod-Array Depth Patterned Sapphire Substrate |
2012-04-01 |
69 |
A Novel Cost Effective Double Reduced Surface Field Laterally Diffused Metal Oxide Semiconductor Design for Improving Off-State Breakdown Voltage |
2012-04-01 |
70 |
Wideband high-isolation and perfect-balance microstrip rat-race coupler |
2012-03-29 |
71 |
Electrically driven nanopyramid green light emitting diode |
2012-02-06 |
72 |
High efficiency GaN-based light-emitting diodes with embedded air voids/SiO(2) nanomasks |
2012-02-03 |
73 |
BPR1J-097, a novel FLT3 kinase inhibitor, exerts potent inhibitory activity against AML |
2012-01-31 |
74 |
Combination of Molecular, Morphological, and Interfacial Engineering to Achieve Highly Efficient and Stable Plastic Solar Cells |
2012-01-24 |
75 |
Growth and Characteristics of a-Plane GaN on ZnO Heterostructure |
2012-01-01 |
76 |
A High-throughput Cell-based Screening for L858R/T790M Mutant Epidermal Growth Factor Receptor Inhibitors |
2012-01-01 |
77 |
Diindenothieno[2,3-b]thiophene arene for efficient organic photovoltaics with an extra high open-circuit voltage of 1.14 ev |
2012-01-01 |
78 |
High Improvement in Conversion Efficiency of mu c-SiGe Thin-Film Solar Cells with Field-Enhancement Layers |
2012-01-01 |
79 |
Double-Pattern Textured ZnO:Ga Thin Films Fabricated by an APPJ and an DC Sputtering |
2012-01-01 |
80 |
Ladder-Type Nonacyclic Structure Consisting of Alternate Thiophene and Benzene Units for Efficient Conventional and Inverted Organic Photovoltaics |
2011-11-22 |
81 |
Improved Performance of InGaN/GaN Light-Emitting Diodes With Thin Intermediate Barriers |
2011-11-15 |
82 |
Donor-Acceptor Random Copolymers Based on a Ladder-Type Nonacyclic Unit: Synthesis, Characterization, and Photovoltaic Applications |
2011-11-08 |
83 |
Characteristics of Current-Injected GaN-Based Vertical-Cavity Surface-Emitting Lasers |
2011-11-01 |
84 |
Hole transport improvement in InGaN/GaN light-emitting diodes by graded-composition multiple quantum barriers |
2011-10-24 |
85 |
Study of InGaN-Based Light-Emitting Diodes on a Roughened Backside GaN Substrate by a Chemical Wet-Etching Process |
2011-10-01 |
86 |
Investigation of Emission Polarization and Strain in InGaN-GaN Multiple Quantum Wells on Nanorod Epitaxially Lateral Overgrowth Templates |
2011-09-15 |
87 |
Di(4-methylphenyl)methano-C(60) Bis-Adduct for Efficient and Stable Organic Photovoltaics with Enhanced Open-Circuit Voltage |
2011-09-13 |
88 |
Formation and composition of titanium oxinitride nanocrystals synthesized via nitridizing titanium oxide for nonvolatile memory applications |
2011-09-01 |
89 |
High Q microcavity light emitting diodes with buried AlN current apertures |
2011-07-25 |
90 |
Optical properties of self assembled GaN polarity inversion domain boundary |
2011-07-11 |
91 |
Highly Efficient and Bright LEDs Overgrown on GaN Nanopillar Substrates |
2011-07-01 |
92 |
Design of a HTS Magnet for Application to Resonant X-Ray Scattering |
2011-06-01 |
93 |
Investigation of efficiency droop for InGaN-based UV light-emitting diodes with InAlGaN barrier |
2011-05-23 |
94 |
Carbazole-Based Ladder-Type Heptacylic Arene with Aliphatic Side Chains Leading to Enhanced Efficiency of Organic Photovoltaics |
2011-05-10 |
95 |
Self-aligned contact metallization technology for III-V metal-oxide-semiconductor field effect transistors |
2011-05-01 |
96 |
Alternating Copolymers Incorporating Cyclopenta[2,1-b:3,4-b ']dithiophene Unit and Organic Dyes for Photovoltaic Applications |
2011-04-15 |
97 |
Uniplanar microstrip periodic structure for microwave circuits |
2011-04-14 |
98 |
Crystal Structure and Inhibition Studies of Transglutaminase from Streptomyces mobaraense |
2011-03-04 |
99 |
Enhanced Performance and Stability of a Polymer Solar Cell by Incorporation of Vertically Aligned, Cross-Linked Fullerene Nanorods |
2011-01-01 |
100 |
Inverted Octagonal Surface Defects in a-Plane AlGaN/GaN Multiple Quantum Wells |
2011-01-01 |
101 |
Poly-Si Nanowire Nonvolatile Memory With Nanocrystal Indium-Gallium-Zinc-Oxide Charge-Trapping Layer |
2010-12-01 |
102 |
Crystal Structure and Mutational Analysis of Aminoacylhistidine Dipeptidase from Vibrio alginolyticus Reveal a New Architecture of M20 Metallopeptidases |
2010-12-01 |
103 |
The technical framework of interactive functions for course-management systems: Students' perceptions, uses, and evaluations |
2010-11-01 |
104 |
Effects of Wet Chemical and Trimethyl Aluminum Treatments on the Interface Properties in Atomic Layer Deposition of Al(2)O(3) on InAs |
2010-11-01 |
105 |
Design and Synthesis of Tetrahydropyridothieno[2,3-d]pyrimidine Scaffold Based Epidermal Growth Factor Receptor (EGFR) Kinase Inhibitors: The Role of Side Chain Chirality and Michael Acceptor Group for Maximal Potency |
2010-10-28 |
106 |
Formation of the distributed NiSiGe nanocrystals nonvolatile memory formed by rapidly annealing in N(2) and O(2) ambient |
2010-10-01 |
107 |
Improvement of resistance switching characteristics in a thin FeO(x) transition layer of TiN/SiO(2)/FeO(x)/FePt structure by rapid annealing |
2010-05-31 |
108 |
Temperature-dependent memory characteristics of silicon-oxide-nitride-oxide-silicon thin-film-transistors |
2010-05-03 |
109 |
Treatment of Reactive Black 5 by combined electrocoagulation-granular activated carbon adsorption-microwave regeneration process |
2010-03-15 |
110 |
A study of resistive switching effects on a thin FeO(x) transition layer produced at the oxide/iron interface of TiN/SiO(2)/Fe-contented electrode structures |
2010-02-01 |
111 |
Identification, SAR Studies, and X-ray Co-crystallographic Analysis of a Novel Furanopyrimidine Aurora Kinase A Inhibitor |
2010-02-01 |
112 |
Polymer photodetector with voltage-adjustable photocurrent spectrum |
2010-01-25 |
113 |
Epitaxial Overgrowth of Gallium Nitride Nano-Rods on Silicon (111) Substrates by RF-Plasma-Assisted Molecular Beam Epitaxy |
2010-01-01 |
114 |
Donor-acceptor polymers based on multi-fused heptacyclic structures: synthesis, characterization and photovoltaic applications |
2010-01-01 |
115 |
High birefringence lateral difluoro phenyl tolane liquid crystals |
2010-01-01 |
116 |
Output Power Enhancement of Light Emitting Diodes with Defect Passivation layer |
2010-01-01 |
117 |
Role of germanium in the reduced temperature dependence of Ti-based nanocrystals formation for nonvolatile memory applications |
2009-12-28 |
118 |
Defect selective passivation in GaN epitaxial growth and its application to light emitting diodes |
2009-11-23 |
119 |
Junction and Device Characteristics of Gate-Last Ge p- and n-MOSFETs With ALD-Al(2)O(3) Gate Dielectric |
2009-08-01 |
120 |
High efficiency light emitting diode with anisotropically etched GaN-sapphire interface |
2009-07-27 |
121 |
Size-Dependent Strain Relaxation and Optical Characteristics of InGaN/GaN Nanorod LEDs |
2009-07-01 |
122 |
Effects of Minority-Carrier Response Behavior on Ge MOS Capacitor Characteristics: Experimental Measurements and Theoretical Simulations |
2009-05-01 |
123 |
Adsorption Configurations and Reactions of Nitric Acid on TiO(2) Rutile (110) and Anatase (101) surfaces |
2009-04-16 |
124 |
Growth of free-standing GaN layer on Si(111) substrate |
2009-03-15 |
125 |
Formation and Nonvolatile Memory Application of Ge Nanocrystals by Using Internal Competition Reaction of Si(1.33)Ge(0.67)O(2) and Si(2.67)Ge(1.33)N(2) Layers |
2009-03-01 |
126 |
Purification, crystallization and preliminary X-ray analysis of an aminoacylhistidine dipeptidase (PepD) from Vibrio alginolyticus |
2009-03-01 |
127 |
The Annihilation of Threading Dislocations in the Germanium Epitaxially Grown within the Silicon Nanoscale Trenches |
2009-01-01 |
128 |
Synthesis and mesomorphic properties of -methylstilbene-based liquid crystals |
2009-01-01 |
129 |
Five-element circuit model using linear-regression method to correct the admittance measurement of metal-oxide-semiconductor capacitor |
2009-01-01 |
130 |
Enhancement of NiSi-Based Nanocrystal Formation by Incorporating Ge Elements for Nonvolatile Memory Devices |
2009-01-01 |
131 |
InAs-Channel Metal-Oxide-Semiconductor HEMTs with Atomic-Layer-Deposited Al(2)O(3) Gate Dielectric |
2009-01-01 |
132 |
New Group Shuffled BP Decoding Algorithms for LDPC Codes |
2009-01-01 |
133 |
Application of fluorine doped oxide (SiOF) spacers for improving reliability in low temperature polycrystalline thin film transistors |
2008-12-01 |
134 |
Hierarchical Superstructures with Helical Sense in Self-Assembled Achiral Banana-Shaped Liquid Crystalline Molecules |
2008-11-10 |
135 |
Formation and nonvolatile memory characteristics of multilayer nickel-silicide NCs embedded in nitride layer |
2008-11-01 |
136 |
Expression and characterization of the biofilm-related and carnosine-hydrolyzing aminoacylhistidine dipeptidase from Vibrio alginolyticus |
2008-10-01 |
137 |
AlGaAs/InGaAs high electron mobility transistor grown on Si substrate with Ge/Ge(x)Si(1-x) metamorphic buffer layers |
2008-09-01 |
138 |
GaN growth on Si(111) using simultaneous AlN/alpha-Si(3)N(4) buffer structure |
2008-07-01 |
139 |
Temperature-dependent capacitance characteristics of RF LDMOS transistors with different layout structures |
2008-07-01 |
140 |
Passivation effect of poly-Si thin-film transistors with fluorine-ion-implanted spacers |
2008-06-01 |
141 |
Metamorphic In(0.53)Ga(0.47)As Metal-Oxide-Semiconductor Structure on a GaAs Substrate with ZrO(2) High-k Dielectrics |
2008-05-01 |
142 |
Reliability characteristics of NiSi nanocrystals embedded in oxide and nitride layers for nonvolatile memory application |
2008-04-14 |
143 |
Formation of cobalt-silicide nanocrystals in Ge-doped dielectric layer for the application on nonvolatile memory |
2008-04-14 |
144 |
RF and logic performance improvement of In0.7Ga0.3As/InAs/In0.7Ga0.3As composite-channel HEMT using gate-sinking technology |
2008-04-01 |
145 |
Effects of interfacial sulfidization and thermal annealing on the electrical properties of an atomic-layer-deposited Al(2)O(3) gate dielectric on GaAs substrate |
2008-04-01 |
146 |
Performance enhancement of excimer laser crystallized poly-Si thin film transistors with fluorine implantation technology |
2008-03-31 |
147 |
Nonvolatile memory characteristics influenced by the different crystallization of Ni-Si and Ni-N nanocrystals |
2008-02-11 |
148 |
Synthesis of laterally substituted alpha-methylstilbene-tolane liquid crystals |
2008-01-01 |
149 |
Improved electrical properties of Gd2O3/GaAs capacitor with modified wet-chemical clean and sulfidization procedures |
2008-01-01 |
150 |
Enhancement of charge-storage performance in Ni-silicide nanocrystal devices by thermal annealing a Ni-Si-N thin film |
2008-01-01 |
151 |
Wet mesa etching process in InGaN-based light emitting diodes |
2008-01-01 |
152 |
Formation of Mo silicide nanodot memory by rapid thermal annealing dual electron-gun evaporated Mo-Si layer |
2008-01-01 |
153 |
From virtual environments to physical environments: Exploring interactivity in ubiquitous-learning systems |
2008-01-01 |
154 |
Electrical and material characterization of atomic-layer-deposited Al(2)O(3) gate dielectric on ammonium sulfide treated GaAs substrates |
2008-01-01 |
155 |
Formation and nonvolatile memory effect of nickel-oxygen-silicon nanoparticles |
2007-11-26 |
156 |
Pi-shape gate polycrystalline silicon thin-film transistor for nonvolatile memory applications |
2007-11-19 |
157 |
Nonvolatile Si/SiO2/SiN/SiO2/Si type polycrystalline silicon thin-film-transistor memory with nanowire channels for improvement of erasing characteristics |
2007-11-05 |
158 |
Investigation of impact ionization in InAs-channel HEMT ford high-speed and low-power applications |
2007-10-01 |
159 |
Formation of Ge nanocrystals using Si1.33Ge0.67O2 and Si2.67Ge1.33N2 film for nonvolatile memory application |
2007-09-03 |
160 |
A novel nanowire channel poly-Si TFT functioning as transistor and nonvolatile SONOS memory |
2007-09-01 |
161 |
Performance enhancement by local strain in (110) channel n-channel metal-oxide-semicondiactor field-effect transistors on (111) substrate |
2007-09-01 |
162 |
Highly integrated automotive radar sensor |
2007-08-31 |
163 |
Nonvolatile memory characteristics of nickel-silicon-nitride nanocrystal |
2007-08-20 |
164 |
A location-aware multicasting protocol for Bluetooth Location Networks |
2007-08-01 |
165 |
A delta-doped InGaP/InGaAs pHEMT with different doping profiles for device-linearity improvement |
2007-07-01 |
166 |
High-performance In0.52Al0.48As/In0.6Ga0.4As power metamorphic high electron mobility transistor for Ka-band applications |
2007-06-01 |
167 |
High-speed GaAs metal gate semiconductor field effect transistor structure grown on a composite Ge/Ge(x)Si(1-x)/Si substrate |
2007-04-15 |
168 |
Nonvolatile polycrystalline silicon thin-film-transistor memory with oxide/nitride/oxide stack gate dielectrics and nanowire channels |
2007-03-19 |
169 |
Formation of stacked Ni silicide nanocrystals for nonvolatile memory application |
2007-03-12 |
170 |
Systematical study of reliability issues in plasma-nitrided and thermally nitrided oxides for advanced dual-gate oxide p-channel metal-oxide-semiconductor field-effect transistors |
2007-03-01 |
171 |
Improved performance of F-ions-implanted poly-Si thin-film transistors using solid phase crystallization and excimer laser crystallization |
2007-03-01 |
172 |
Use of Si+ pre-ion-implantation on Si substrate to enhance the strain relaxation of the GexSi1-x metamorphic buffer layer for the growth of Ge layer on Si substrate |
2007-02-19 |
173 |
Effect of gate sinking on the device performance, of the InGaP/AlGaAs/InGaAs enhancement-mode PHEMT |
2007-02-01 |
174 |
Fabrication of 0.15-mu m Gamma-shaped gate In0.52Al0.48As/In0.6Ga0.4As metamorphic HEMTs using DUV lithography and tilt dry-etching technique |
2007-02-01 |
175 |
SPDT GaAs switches with copper metallized interconnects |
2007-02-01 |
176 |
Growth of very-high-mobility AlGaSb/InAs high-electron-mobility transistor structure on si substrate for high speed electronic applications |
2007-01-08 |
177 |
Evaluation of RF and logic performance for 80 nm InAs/InGaAs composite channel HEMTs using gate sinking technology |
2007-01-01 |
178 |
Design for integration of RF power transistors in 0.13 mu m advanced CMOS technology |
2007-01-01 |
179 |
Ultrathin Si capping layer suppresses charge trapping in HfOxNy/Ge metal-insulator-semiconductor capacitors |
2007-01-01 |
180 |
Study of thermal stability of HfOxNy/Ge capacitors using postdeposition annealing and NH3 plasma pretreatment |
2007-01-01 |
181 |
Formation of germanium nanocrystals embedded in a silicon-oxygen-nitride layer |
2007-01-01 |
182 |
Improved memory window for Ge nanocrystals embedded in SiON layer |
2006-10-16 |
183 |
Self-assembled In0.22Ga0.78As quantum dots grown on metamorphic GaAs/Ge/SixGe1-x/Si substrate |
2006-09-15 |
184 |
Small-signal modeling of SiGeHBTs using direct parameter-extraction method |
2006-09-01 |
185 |
Double delta-doped enhancement-mode InGaP/AlGaAs/InGaAs pseudomorphic high electron mobility transistor for linearity application |
2006-09-01 |
186 |
Formation of germanium nanocrystals embedded in silicon-oxygen-nitride layer |
2006-07-31 |
187 |
Thermochemical reaction of ZrOx(N-y) interfaces on Ge and Si substrates |
2006-07-03 |
188 |
Device linearity comparison of uniformly doped and delta-doped In0.52Al0.48As/In0.6Ga0.4As metamorphic HEMTs |
2006-07-01 |
189 |
A new class of wideband multisection 180 degrees hybrid rings using vertically installed planar couplers |
2006-06-01 |
190 |
Novel dual-metal gate technology using Mo-MoSix combination |
2006-06-01 |
191 |
An improved parameter-extraction method of SiGe HBTs' substrate network |
2006-06-01 |
192 |
Novel two-bit HfO2 nanocrystal nonvolatile flash memory |
2006-04-01 |
193 |
Improvement of electrical characteristics for fluorine-ion-implanted poly-Si TFTs using ELC |
2006-04-01 |
194 |
Optical characterization of ZnSe epilayers and ZnCdSe/ZnSe quantum wells grown on Ge/Ge0.95Si0.05/Ge0.9Si0.1/Si virtual substrates |
2006-03-15 |
195 |
Optimization of the growth of the InGaP etch-stop layer by MOVPE for InGaP/GaAs HBT device application |
2006-03-15 |
196 |
Formation of silicon germanium nitride layer with distributed charge storage elements |
2006-03-13 |
197 |
An assessment of single-electron effects in multiple-gate SOI MOSFETs with 1.6-nm gate oxide near room temperature |
2006-03-01 |
198 |
Effects of postdeposition annealing on the characteristics of HfOxNy dielectrics on germanium and silicon substrates |
2006-01-01 |
199 |
Electrical enhancement of solid phase crystallized poly-Si thin-film transistors with fluorine ion implantation |
2006-01-01 |
200 |
A fabrication of germanium nanocrystal embedded in silicon-oxygen-nitride layer |
2006-01-01 |
201 |
Modified parallel-coupled filter with two independently controllable upper stopband transmission zeros |
2005-12-01 |
202 |
Lasting effects of instruction guided by the conflict map: Experimental study of learning about the causes of the seasons |
2005-12-01 |
203 |
Suppressing phosphorus diffusion in germanium by carbon incorporation |
2005-11-24 |
204 |
A CMOS low-noise amplifier for ultra wideband wireless applications |
2005-11-01 |
205 |
Mobility enhancement of polycrystalline-Si thin-film transistors using nanowire channels by pattern-dependent metal-induced lateral crystallization |
2005-10-03 |
206 |
Effects of channel width on electrical characteristics of polysilicon TFTs with multiple nanowire channels |
2005-10-01 |
207 |
Reduction of leakage current in metal-induced lateral crystallization polysilicon TFTs with dual-gate and multiple nanowire channels |
2005-09-01 |
208 |
The interplay between different forms of CAI and students' preferences of learning environment in the secondary science class |
2005-09-01 |
209 |
An investigation of Taiwanese early adolescents' views about the nature of science |
2005-09-01 |
210 |
Design of microstrip quadruplet filters with source-load coupling |
2005-07-01 |
211 |
Linearity and power characteristics of SiGeHBTs at high temperatures for RF applications |
2005-07-01 |
212 |
A novel approach for parameter determination of HBT small-signal equivalent circuit |
2005-06-01 |
213 |
Continuous and precise work function adjustment for integratable dual metal gate CMOS technology using Hf-Mo binary alloys |
2005-06-01 |
214 |
Degradation of low-frequency noise in partially depleted silicon-on-insulator metal oxide semiconductor field-effect transistors by hot-carrier stress |
2005-06-01 |
215 |
Reliability of strained SiGe channel p-channel metal-oxide-semiconductor field-effect transistors with ultra-thin (EOT=3.1nm) N(2)O-annealed SiN gate dielectric |
2005-06-01 |
216 |
Dual-band mixer design |
2005-06-01 |
217 |
Extraction of substrate parameters for RF MOSFETs based on four-port measurement |
2005-06-01 |
218 |
Microstrip directional coupler with nearly ideal TEM coupler performance |
2005-05-26 |
219 |
Switching current study: Hysteresis measurement of ferroelectric capacitors using current-voltage measurement method |
2005-04-01 |
220 |
An improved approach for small-signal equivalent-circuit parameter determination of InGaP/GaAs HBT |
2005-03-05 |
221 |
High-perfomance nonvolatile HfO2 nanocrystal memory |
2005-03-01 |
222 |
Miniaturized spurious passband suppression microstrip filter using meandered parallel coupled lines |
2005-02-01 |
223 |
2 V-operated InGaP-AlGaAs-InGaAs enhancement-mode pseudomorphic HEMT |
2005-02-01 |
224 |
Improvement of reliability for polycrystalline thin-film transistors using self-aligned fluorinated silica glass spacers |
2005-01-01 |
225 |
Enhanced performance of poly-Si thin film transistors using fluorine ions implantation |
2005-01-01 |
226 |
Electrical characteristics of thin HfO(2) gate dielectrics prepared using different pre-deposition surface treatments |
2005-01-01 |
227 |
Deep sub-micron strained Si0.85Ge0.15 channel p-channel metal-oxide-semiconductor field-effect transistors (pMOSFETs) with ultra-thin N2O-annealed SiN gate dielectric |
2005-01-01 |
228 |
A GeSi-buffer structure for growth of high-quality GaAs epitaxial layers on a Si substrate |
2005-01-01 |
229 |
Effects of channel width and NH3 plasma passivation on electrical characteristics of polysilicon thin-film transistors by pattern-dependent metal-induced lateral crystallization |
2005-01-01 |
230 |
Basic characteristics of Pt/SrBi2Ta2O9/HfO2/Si structure using layer-by-layer crystallization |
2005-01-01 |
231 |
Hot-electron-induced electron trapping in 0.13 mu m nMOSFETs with ultrathin (EOT=1.6 nm) nitrided gate oxide |
2005-01-01 |
232 |
HfO2 MIS capacitor with copper gate electrode |
2004-12-01 |
233 |
A broadband and low cost monolithic BiCMOS tuner chip |
2004-11-01 |
234 |
Stabilization and elimination of transient unstable mixed convective vortex flow of air in a bottom heated horizontal flat duct by top plate heating |
2004-09-01 |
235 |
Triangular current: Method for measuring hysteresis loops of ferroelectric capacitors |
2004-09-01 |
236 |
ESD protection design to overcome internal damage on interface circuits,of a CMOS IC with multiple separated power pins |
2004-09-01 |
237 |
Finger-gate array quantum pumps: Pumping characteristics and mechanisms |
2004-08-01 |
238 |
Decomposition of 2-mercaptothiazoline in aqueous solution by ozonation |
2004-07-01 |
239 |
Direct measurement of electrical hysteresis of micron-sized Pb(Zr,Ti)O-3 capacitors using the constant current method |
2004-07-01 |
240 |
Composite-channel metamorphic high electron mobility transistor for low-noise and high-linearity applications |
2004-07-01 |
241 |
Growth of ZnSe epilayer on Si using Ge/GexSi1-x buffer structure |
2004-06-15 |
242 |
InGaP/InGaAs PHEMT with high IP3 for low noise applications |
2004-06-10 |
243 |
Low-noise metamorphic HEMTs with reflowed 0.1 mu m T-gate |
2004-06-01 |
244 |
Hot-carrier effects on power characteristics of SiGeHBTs |
2004-06-01 |
245 |
High-performance polycrystalline silicon thin-film transistor with multiple nanowire channels and lightly doped drain structure |
2004-05-10 |
246 |
A new method to extract MOSFET threshold voltage, effective channel length, and channel mobility using S-parameter measurement |
2004-05-01 |
247 |
A dual-gate-controlled single-electron transistor using self-aligned polysilicon sidewall spacer gates on silicon-on-insulator nanowire |
2004-03-01 |
248 |
Short-channel poly-Si thin-film transistors with ultrathin channel and self-aligned tungsten-clad source/drain |
2004-01-01 |
249 |
A novel coupling structure suitable for cross-coupled filters with folded quarter-wave resonators |
2003-12-01 |
250 |
The highlights in the nano world |
2003-11-01 |
251 |
Integrated antennas on Si with over 100 GHz performance, fabricated using an optimized proton implantation process |
2003-11-01 |
252 |
Realization of transmission zeros in combline filters using an auxiliary inductively coupled ground plane |
2003-10-01 |
253 |
High-performance microwave coplanar bandpass and bandstop filters on Si substrates |
2003-09-01 |
254 |
Study of nickel silicide contact on Si/Si1-xGex |
2003-09-01 |
255 |
High-performance Pt/SrBi2Ta2O9/HfO2/Si structure for nondestructive readout memory |
2003-09-01 |
256 |
Broadband tapered microstrip leaky-wave antenna |
2003-08-01 |
257 |
A study of parasitic resistance effects in thin-channel polycrystalline silicon TFTs with tungsten-clad source/drain |
2003-08-01 |
258 |
Stability investigation of single-wafer process by using a spin etcher |
2003-07-01 |
259 |
High-current characterization of polysilicon diode for electrostatic discharge protection in sub-quarter-micron complementary metal oxide semiconductor technology |
2003-06-01 |
260 |
Dynamic behavior of ozonation with pollutant in a countercurrent bubble column with oxygen mass transfer |
2003-06-01 |
261 |
Growth of high-quality Ge epitaxial layers on Si(100) |
2003-05-15 |
262 |
Low-pressure crystallization of sol-gel-derived PbZr0.52Ti0.48O3 thin films at low temperature for low-voltage operation |
2003-05-01 |
263 |
Enhanced negative substrate bias degradation in nMOSFETs with ultrathin plasma nitrided oxide |
2003-05-01 |
264 |
A novel SiGe raised source/drain polycrystalline silicon thin-film transistor with improved on-current and larger breakdown voltage |
2003-03-01 |
265 |
Characteristics and stress-induced degradation of laser-activated low temperature polycrystalline silicon thin-film transistors |
2003-02-15 |
266 |
Miniaturized microstrip cross-coupled filters using quarter-wave or quasi-quarter-wave resonators |
2003-01-01 |
267 |
Analysis of narrow width effects in polycrystalline silicon thin film transistors |
2003-01-01 |
268 |
Polycrystalline silicon thin-film transistor with self-aligned SiGe raised source/drain |
2002-12-16 |
269 |
New nanometer T-gate fabricated by thermally reflowed resist technique |
2002-12-15 |
270 |
Dynamic model of ozone contacting process with oxygen mass transfer in bubble columns |
2002-11-01 |
271 |
Analysis of low-frequency noise in boron-doped polycrystalline silicon-germanium resistors |
2002-09-30 |
272 |
Decomposition of 2-naphthalenesulfonate in aqueous solution by ozonation with UV radiation |
2002-09-01 |
273 |
High power Al0.3Ga0.7As/In0.2Ga0.8As enhancement-mode PHEMT for low-voltage wireless communication systems |
2002-08-29 |
274 |
Impacts of gate structure on dynamic threshold SOI nMOSFETs |
2002-08-01 |
275 |
The extraction of MOSFET gate capacitance from S-parameter measurements |
2002-08-01 |
276 |
Using buried capacitor in LTCC-MLC balun |
2002-07-18 |
277 |
Reliability of laser-activated low-temperature polycrystalline silicon thin-film transistors |
2002-06-24 |
278 |
ESD protection design for CMOS RF integrated circuits using polysilicon diodes |
2002-06-01 |
279 |
LTCC-MLC chip-type balun realised by LC resonance method |
2002-05-23 |
280 |
A macro model of silicon spiral inductor |
2002-05-01 |
281 |
A dynamic model of ozone disinfection in a bubble column with oxygen mass transfer |
2002-05-01 |
282 |
An investigation on RF CMOS stability related to bias and scaling |
2002-04-01 |
283 |
RF CMOS technology for MMIC |
2002-04-01 |
284 |
Photonic bandgap dielectric waveguide filter |
2002-04-01 |
285 |
Impact of thermal stability on the characteristics of complementary metal oxide semiconductor transistors with TiN metal gate |
2002-02-01 |
286 |
Low-voltage-operation high-power-density AlGaAs/InGaAs enhancement-mode pseudomorphic high-electron-mobility transistor for personal handy-phone handset application |
2002-01-15 |
287 |
Design on the low-capacitance bond pad for high-frequency I/O circuits in CMOS technology |
2001-12-01 |
288 |
An automatic macro program for radio frequency MOSFET characteristics analysis |
2001-10-01 |
289 |
Improving the RF performance of 0.18 mu m CMOS with deep n-well implantation |
2001-10-01 |
290 |
Kinetics of decomposition of polyethylene glycol in electroplating solution by ozonation with UV radiation |
2001-10-01 |
291 |
Optimization of short channel effect with arsenic halo implant through polysilicon gate |
2001-09-01 |
292 |
Modeling ozone mass transfer with combined effects of ozone decomposition and reaction with pollutants in a bubble column |
2001-09-01 |
293 |
Improved low temperature characteristics of p-channel MOSFETs with Si1-xGex raised source and drain |
2001-08-01 |
294 |
Ultra-broad-band doubly balanced star mixers using planar Mouw's hybrid junction |
2001-06-01 |
295 |
Electrical properties of shallow p(+)-n junction using boron-doped Si1-xGex layer deposited by ultrahigh vacuum chemical molecular epitaxy |
2001-05-01 |
296 |
The reaction of Co and Si1-xGex for MOSFET with poly-Si1-xGex gate |
2001-03-01 |
297 |
Electrical and compositional properties of co-silicided shallow p(+)-n junction using Si-capped/boron-doped Si1-xGex layer deposited by UHVCME |
2001-03-01 |
298 |
Microstructure effects on quantum efficiency in PtSi/p-Si(100) Schottky barrier detector |
2001-02-15 |
299 |
Oxygen- and growth rate-dependent regulation of Escherichia coli fumarase (FumA, FumB, and FumC) activity |
2001-01-01 |
300 |
The effects of super-steep-retrograde indium channel profile on deep submicron n-channel metal-oxide-semiconductor field-effect transistor |
2001-01-01 |
301 |
High-performance and high-reliability 80-nm gate-length DTMOS with indium super steep retrograde channel |
2000-12-01 |
302 |
Improved electrical properties of shallow p(+)-n junction using selectively grown graded Si1-xGex epitaxial structure |
2000-12-01 |
303 |
The effects of growth temperature on the microstructure and electrical barrier height in PtSi/p-Si(100) Schottky barrier detector |
2000-10-03 |
304 |
Effects of an interposed Mo layer on the interfacial reactions of Ti/Si0.76Ge0.24 by rapid thermal annealing and pulsed laser annealing |
2000-10-01 |
305 |
Characterization and reliability of lightly-doped-drain polysilicon thin-film transistors with oxide sidewall spacer formed by one-step selective liquid phase deposition |
2000-10-01 |
306 |
Reduced reverse narrow channel effect in thin SOI nMOSFETs |
2000-09-01 |
307 |
An anomalous crossover in Vth roll-off for indium-doped nMOSFETs |
2000-09-01 |
308 |
Reduction of source/drain series resistance and its impact on device performance for PMOS transistors with raised Si1-xGex source/drain |
2000-09-01 |
309 |
Study on Ge/Si ratio, silicidation, and strain relaxation of high temperature sputtered Co/Si1-xGex structures |
2000-08-15 |
310 |
Plasma-process-induced damage in sputtered TiN metal-gate capacitors with ultrathin nitrided oxides |
2000-08-01 |
311 |
Effect of coplanar probe pad design on noise figures of 0.35 mu m MOSFETs |
2000-07-20 |
312 |
Plasma-induced charging damage in ultrathin (3-nm) gate oxides |
2000-07-01 |
313 |
Dimensional effects on the drain current of n- and p-channel polycrystalline silicon thin film transistors |
2000-07-01 |
314 |
Improved ultrathin gate oxide integrity in p(+)-polysilicon-gate p-channel metal oxide semiconductor with medium-dose fluorine implantation |
2000-06-01 |
315 |
Improvements of amorphous-silicon inverted-staggered thin-film transistors using high-temperature-deposited Al gate with chemical mechanical polishing |
2000-05-01 |
316 |
High performance 0.1 mu m dynamic threshold MOSFET using indium channel implantation |
2000-03-01 |
317 |
Shallow-trench isolation with raised-field-oxide structure |
2000-03-01 |
318 |
CMOS RFIC: Application to wireless transceiver design |
2000-02-01 |
319 |
Effects of polysilicon gate doping concentration on plasma charging damage in ultrathin gate oxides |
2000-02-01 |
320 |
The effects of microcrystalline silicon film structure on low-high-low band-gap thin film transistor |
2000-01-29 |
321 |
Improved immunity to plasma damage in ultrathin nitrided oxides |
2000-01-01 |
322 |
Annealing effects on the interfacial reactions of Ni on Si0.76Ge0.24 and Si1-x-yGexCy |
2000-01-01 |
323 |
The combined effects of nitrogen implantation at S/D extension and N2O oxide on 0.18 mu m N- and P-metal oxide field effect transistors (MOSFETs) |
1999-12-01 |
324 |
Effects of Mo-free C40Ti(Si1-xGex)(2) precursors and the thickness of an interposed Mo layer on the enhanced formation of C54Ti(Si1-xGex)(2) |
1999-11-29 |
325 |
A multilevel interconnect technology with intrametal air gap for high-performance 0.25-mu m-and-beyond devices manufacturing |
1999-11-01 |
326 |
The novel improvement of low dielectric constant methylsilsesquioxane by N2O plasma treatment |
1999-10-01 |
327 |
A novel lightly doped drain polysilicon thin-film transistor with oxide sidewall spacer formed by one-step selective liquid phase deposition |
1999-08-01 |
328 |
Interfacial reactions of Co/Si0.76Ge0.24 and Co(Si0.76Ge0.24)/Si0.76Ge0.24 by pulsed KrF laser annealing |
1999-08-01 |
329 |
Characteristics of SiC-based thin-film LED fabricated using plasma-enhanced CVD system with stainless steel mesh |
1999-07-22 |
330 |
Characterization of Si1-x-yGexCy films grown by C+ implantation and subsequent pulsed laser annealing |
1999-07-15 |
331 |
Electrical properties of multiple high-dose Si implantation in p-GaN |
1999-07-15 |
332 |
Microstrip cascade trisection filter |
1999-07-01 |
333 |
Effects of O-2- and N2O-plasma treatments on properties of plasma-enhanced-chemical-vapor-deposition tetraethylorthosilicate oxide |
1999-07-01 |
334 |
Temperature-accelerated dielectric breakdown in ultrathin gate oxides |
1999-06-14 |
335 |
Room temperature oxidation of Cu/Si0.76Ge0.24 annealed at 200 to 300 degrees C |
1999-06-01 |
336 |
A novel broad-band Chebyshev-response rat-race ring coupler |
1999-04-01 |
337 |
Leakage current reduction of chemical-vapor-deposited Ta2O5 films on rugged polycrystalline silicon electrode for dynamic random access memory application |
1999-04-01 |
338 |
Oxide thickness dependence of plasma charging damage |
1999-03-01 |
339 |
The effects of shallow germanium halo doping on N-channel metal oxide semiconductor field effect transistors |
1999-01-15 |
340 |
A multioctave bandwidth rat-race singly balanced mixer |
1999-01-01 |
341 |
Epitaxial growth of the GaN film by remote-plasma metalorganic chemical vapor deposition |
1998-10-01 |
342 |
Improvement of reliability of metal-oxide semiconductor field-effect transistors with N2O nitrided gate oxide and N2O polysilicon gate reoxidation |
1998-10-01 |
343 |
Interfacial reactions of Pd/Si0.76Ge0.24 by pulsed KrF laser annealing |
1998-09-07 |
344 |
Persistent photoconductivity in SiGe/Si quantum wells |
1998-07-15 |
345 |
Optoelectronic characteristics of a-SiC : H-based pin thin film LEDs having a thin Mo buffer layer in contact with p-type a-Si : H |
1998-07-09 |
346 |
Comparison of N-2 and NH3 plasma passivation effects on polycrystalline silicon thin-film transistors |
1998-07-01 |
347 |
Rugged surface polycrystalline silicon film formed by rapid thermal chemical vapor deposition for dynamic random access memory stacked capacitor application |
1998-06-01 |
348 |
Evaluation of plasma charging damage in ultrathin gate oxides |
1998-03-01 |
349 |
Effects of N2O-annealed sacrificial oxide on the short-channel effects of nMOSFETs |
1998-02-19 |
350 |
Direct oxidation of Si1-xGex layers using Vacuum-Ultra-Violet light radiation in oxygen |
1998-02-01 |
351 |
Suppression of boron penetration in p(+) polysilicon gate using Si-B diffusion source |
1998-01-08 |
352 |
Catalytic decomposition of ozone in the presence of water vapor |
1998-01-01 |
353 |
A refined model for ozone mass transfer in a bubble column |
1998-01-01 |
354 |
Effects of isolation materials on facet formation for silicon selective epitaxial growth |
1997-10-20 |
355 |
Pulsed KrF laser annealing of Ni/Si0.76Ge0.24 films |
1997-10-01 |
356 |
Optoelectronic characteristics of alpha-SiC:H-based P-I-N thin-film light-emitting diodes with low-resistance and high-reflectance N+-alpha-SiCGe:H layer |
1997-09-01 |
357 |
High-efficiency and low-distortion directly-ion-implanted GaAs power MESFET's for digital personal handy-phone applications |
1997-09-01 |
358 |
Interfacial abruptness in Si/SiGe heteroepitaxy grown by ultrahigh vacuum chemical vapor deposition |
1997-09-01 |
359 |
2-V-operation delta-doped power HEMT's for personal handy-phone systems |
1997-08-01 |
360 |
Effects of isolation oxides on undercut formation and electrical characteristics for silicon selective epitaxial growth |
1997-06-01 |
361 |
Porous silicon light-emitting diode with tunable color |
1997-05-01 |
362 |
The role of resist for ultrathin gate oxide degradation during O-2 plasma ashing |
1997-05-01 |
363 |
Interfacial reactions of the Co/Si1-xGex system |
1997-04-01 |
364 |
A novel thin-film transistor with vertical offset structure |
1997-04-01 |
365 |
Electrical and luminescent characteristics of alpha-SiC:H p-i-n thin-film LED's with graded-gap junctions |
1997-04-01 |
366 |
Very high hole mobility in p-type Si/SiGe modulation-doped heterostructures |
1997-03-15 |
367 |
Resist-related damage on ultrathin gate oxide during plasma ashing |
1997-02-01 |
368 |
Low temperature epitaxy of Si and Si1-xGex by utrahigh vacuum-chemical molecular epitaxy |
1997-01-01 |
369 |
A high-performance thin-film transistor with a vertical offset structure |
1996-12-01 |
370 |
Au/Ge/Pd ohmic contacts to n-GaAs with the Mo/Ti diffusion barrier |
1996-12-01 |
371 |
Characterization of boron silicide layer deposited by ultrahigh-vacuum chemical-vapor deposition |
1996-11-01 |
372 |
Low-temperature and low thermal budget fabrication of polycrystalline silicon thin-film transistors |
1996-11-01 |
373 |
Mechanism of nitrogen coimplant for suppressing boron penetration in p(+)-polycrystalline silicon gate of p metal-oxide semiconductor field effect transistor |
1996-09-16 |
374 |
A novel structure for three-dimensional silicon magnetic transducers to improve the sensitivity symmetry |
1996-09-01 |
375 |
Schottky contact and the thermal stability of Ni on n-type GaN |
1996-08-01 |
376 |
Growth and electrical characterization of Si delta-doped GaInP by low pressure metalorganic chemical vapor deposition |
1996-05-15 |
377 |
Effect of Ge incorporation on the performance of p-channel polycrystalline Si1-xGex thin-film transistors |
1996-05-01 |
378 |
5 mm high-power-density dual-delta-doped power HEMT's for 3 V L-band applications |
1996-05-01 |
379 |
Combined absorption and self-decomposition of ozone in aqueous solutions with interfacial resistance |
1996-05-01 |
380 |
Uniformity of epilayer grown by ultrahigh-vacuum chemical vapor deposition |
1996-04-01 |
381 |
Excellent Au/Ge/Pd ohmic contacts to n-type GaAs using Mo/Ti as the diffusion barrier |
1996-04-01 |
382 |
High-performance An/Ti/Ge/Pd ohmic contacts on n-Type In0.5Ga0.5P |
1996-04-01 |
383 |
Phosphorus doping of Si and Si1-xGex grown by ultrahigh vacuum chemical vapor deposition using Si2H6 and GeH4 |
1996-03-11 |
384 |
Fabrication of thin film transistors by chemical mechanical polished polycrystalline silicon films |
1996-03-01 |
385 |
Studies on damage removing efficiency of B-11(+) and BF2+ implanted Si0.84Ge0.16 epilayers by rapid thermal annealing |
1996-01-08 |
386 |
Analysis of high-field hole transport characteristics in Si1-xGex alloys with a bond orbital band structure |
1996-01-01 |
387 |
CHARACTERISTICS OF POLYCRYSTALLINE FILMS GROWN BY ULTRAHIGH-VACUUM CHEMICAL-VAPOR-DEPOSITION SYSTEM |
1995-12-01 |
388 |
A COMPREHENSIVE STUDY OF SUPPRESSION OF BORON PENETRATION BY AMORPHOUS-SI GATE IN P+-GATE PMOS DEVICES |
1995-12-01 |
389 |
LOW-TEMPERATURE GROWTH OF SILICON-BORON LAYER AS SOLID DIFFUSION SOURCE FOR POLYSILICON CONTACTED P(+)-N SHALLOW JUNCTION |
1995-12-01 |
390 |
Effects of rapid thermal annealing on Si delta-doped GaInP grown by low pressure metalorganic chemical vapor deposition |
1995-12-01 |
391 |
BALUN DESIGN FOR UNIPLANAR BROAD-BAND DOUBLE BALANCED MIXER |
1995-11-23 |
392 |
BORON INCORPORATION IN SI1-XGEX FILMS GROWN BY ULTRAHIGH-VACUUM CHEMICAL-VAPOR-DEPOSITION USING SI2H6 AND GEH4 |
1995-11-13 |
393 |
STUDY OF SCHOTTKY BARRIERS ON N-TYPE GAN GROWN BY LOW-PRESSURE METALORGANIC CHEMICAL-VAPOR-DEPOSITION |
1995-10-30 |
394 |
EFFECTS OF DRY-ETCHING DAMAGE REMOVAL ON LOW-TEMPERATURE SILICON SELECTIVE EPITAXIAL-GROWTH |
1995-10-01 |
395 |
SILICON DELTA-DOPING OF GAINP GROWN BY LOW-PRESSURE METALORGANIC CHEMICAL-VAPOR-DEPOSITION |
1995-09-01 |
396 |
ABRUPTNESS OF GE COMPOSITION AT THE SI/SIGE INTERFACE GROWN BY ULTRAHIGH-VACUUM CHEMICAL-VAPOR-DEPOSITION |
1995-08-21 |
397 |
SUPPRESSION OF BORON PENETRATION IN BF2-IMPLANTED P-TYPE GATE MOSFET BY TRAPPING OF FLUORINES IN AMORPHOUS GATE |
1995-08-01 |
398 |
EPITAXY OF SI1-XGEX BY ULTRAHIGH-VACUUM CHEMICAL-VAPOR-DEPOSITION USING SI2H6 AND GEH4 |
1995-07-15 |
399 |
ORIENTATION DEPENDENCE OF COHERENT HOLE OSCILLATIONS IN GAAS/ALGAAS COUPLED QUANTUM-WELLS |
1995-07-01 |
400 |
EFFECT OF OXYGEN IMPURITY ON MICROSTRUCTURE AND BORON PENETRATION IN A BF2+ IMPLANTED LPCVD STACKED AMORPHOUS-SILICON P(+) GATED PMOS CAPACITOR |
1995-07-01 |
401 |
BACK-GATING EFFECTS ON THE GA0.1IN0.8P/INP/INGAAS HIGH-ELECTRON-MOBILITY TRANSISTOR |
1995-07-01 |
402 |
CALCULATION OF THE STRUCTURAL DEPENDENCE OF INFRARED-ABSORPTION IN P-TYPE STRAINED-LAYER SIGE/SI QUANTUM-WELLS |
1995-06-15 |
403 |
THE LONG-TERM RELAXATION AND BUILDUP TRANSIENT OF PHOTOCONDUCTIVITY IN SI1-XGEX/SI QUANTUM-WELLS |
1995-06-05 |
404 |
INVESTIGATION ON THE DISTRIBUTION OF FLUORINE AND BORON IN POLYCRYSTALLINE SILICON SILICON SYSTEMS |
1995-06-01 |
405 |
CHARACTERISTICS OF GRADED-LIKE MULTIPLE-DELTA-DOPED GAAS FIELD-EFFECT TRANSISTORS |
1995-05-08 |
406 |
LUMINESCENCE OF LOW-TEMPERATURE GAAS IN A GAAS/IN0.2GA0.8AS MULTIPLE-QUANTUM-WELL STRUCTURE |
1995-04-17 |
407 |
REACTIVE ION ETCHING OF GAINP, GAAS, AND ALGAAS |
1995-04-01 |
408 |
THE THERMAL-STABILITY OF OHMIC CONTACT TO N-TYPE INGAAS LAYER |
1995-02-01 |
409 |
CHARACTERISTICS OF BORON-DIFFUSION IN POLYSILICON SILICON SYSTEMS WITH A THIN SI-B LAYER AS DIFFUSION SOURCE |
1995-02-01 |
410 |
SUBSTRATE ORIENTATION DEPENDENCE OF LOW-TEMPERATURE GAAS GROWN BY MOLECULAR-BEAM EPITAXY |
1995-01-02 |
411 |
HIGH CARRIER DENSITY AND MOBILITY IN GAAS/INGAAS/GAAS DOUBLE DELTA-DOPED CHANNELS HETEROSTRUCTURES |
1995-01-01 |
412 |
APPLICATION OF A FLUORINATED SOLVENT TO THE CONVENTIONAL OZONATION PROCESS FOR THE DESTRUCTION OF 2,4-DICHLOROPHENOL |
1995-01-01 |
413 |
QUANTUM CONFINEMENT EFFECTS OF SI/SIGE STRAINED-LAYER SUPERLATTICES GROWN BY AN ULTRAHIGH-VACUUM CHEMICAL-VAPOR-DEPOSITION TECHNIQUE |
1994-12-01 |
414 |
AS PRECIPITATE REDISTRIBUTION IN SI DELTA-DOPED LOW-TEMPERATURE GAAS |
1994-11-15 |
415 |
A NOVEL DIAC-LIKE SWITCH USING DOUBLE TRIANGULAR BARRIERS |
1994-11-01 |
416 |
ANOMALOUS REVERSE SHORT-CHANNEL EFFECT IN P+ POLYSILICON GATED P-CHANNEL MOSFET |
1994-11-01 |
417 |
SELECTIVE EPITAXIAL-GROWTH OF GAINP BY LOW-PRESSURE METAL-ORGANIC CHEMICAL-VAPOR-DEPOSITION USING ETHYLDIMETHYLINDIUM AS IN-SOURCE |
1994-10-24 |
418 |
CALCULATION OF HOLE MOBILITY IN DOPED SIGE ALLOYS USING A MONTE-CARLO METHOD WITH A BOND ORBITAL BAND-STRUCTURE |
1994-10-15 |
419 |
ELECTROLUMINESCENCE CHARACTERISTICS AND CURRENT-CONDUCTION MECHANISM OF A SI-C-H-P-I-N THIN-FILM LIGHT-EMITTING-DIODES WITH BARRIER LAYER INSERTED AT P-I INTERFACE |
1994-10-01 |
420 |
FABRICATION OF P-CHANNEL POLYCRYSTALLINE SI1-XGEX THIN-FILM TRANSISTORS BY ULTRAHIGH-VACUUM CHEMICAL-VAPOR-DEPOSITION |
1994-09-26 |
421 |
PROPERTIES OF PLASMA-ENHANCED CHEMICAL-VAPOR-DEPOSITED A-SINX-H BY VARIOUS DILUTION GASES |
1994-09-15 |
422 |
MAGNESIUM DOPING OF INGAALP GROWN BY LOW-PRESSURE METALORGANIC CHEMICAL-VAPOR-DEPOSITION |
1994-09-05 |
423 |
ELECTROLUMINESCENCE OF A-SIC-H P-I-N THIN-FILM LIGHT-EMITTING-DIODES WITH QUANTUM-WELL-INJECTION STRUCTURES |
1994-09-01 |
424 |
EFFECTS OF SIH4, GEH4, AND B2H6 ON THE NUCLEATION AND DEPOSITION OF POLYCRYSTALLINE SI1-XGEX FILMS |
1994-09-01 |
425 |
INFLUENCE OF METALORGANIC SOURCES ON THE COMPOSITION UNIFORMITY OF SELECTIVELY GROWN GAXIN1-XP |
1994-09-01 |
426 |
EFFECT OF BORON DOPING ON THE STRUCTURAL-PROPERTIES OF POLYCRYSTALLINE SILICON FILMS GROWN AT REDUCED PRESSURES |
1994-08-01 |
427 |
ANALYTICAL MODELING OF POLYCRYSTALLINE SILICON EMITTER BIPOLAR-TRANSISTORS UNDER HIGH-LEVEL INJECTION |
1994-08-01 |
428 |
HIGH-LEVEL INJECTION INFLUENCE ON THE HIGH-FREQUENCY PERFORMANCE OF POLYCRYSTALLINE SILICON EMITTER BIPOLAR-TRANSISTORS |
1994-08-01 |
429 |
SUBMICRON T-SHAPED GATE HEMT FABRICATION USING DEEP-UV LITHOGRAPHY |
1994-08-01 |
430 |
HETEROJUNCTION BIPOLAR-TRANSISTORS WITH EMITTER BARRIER LOWERED BY DELTA-DOPING |
1994-08-01 |
431 |
TIWN SCHOTTKY CONTACTS TO N-GA(0.51)IN(0.49)P |
1994-08-01 |
432 |
EFFECTS OF N2O-PLASMA TREATMENT OF A-SIOXNY/A-SINX GATE INSULATORS ON ELECTRICAL STABILITY OF A-SIH THIN-FILM TRANSISTORS |
1994-07-15 |
433 |
ANALYSIS OF DIFFERENTIAL GAIN IN GAAS/ALGAAS QUANTUM-WELL LASERS |
1994-07-01 |
434 |
NEW LARGE-ANGLE TILT IMPLANTED DRAIN STRUCTURE - SURFACE COUNTER-DOPED-LIGHTLY DOPED DRAIN FOR HIGH HOT-CARRIER RELIABILITY |
1994-07-01 |
435 |
HIGH-RESOLUTION X-RAY CHARACTERIZATION OF LOW-TEMPERATURE GAAS/AS SUPERLATTICE GROWN BY MOLECULAR-BEAM EPITAXY |
1994-06-27 |
436 |
CATION SOURCE DEPENDENCE OF GA0.5IN0.5P GROWTH-RATE BY LOW-PRESSURE METALORGANIC CHEMICAL-VAPOR-DEPOSITION |
1994-06-15 |
437 |
INVESTIGATION OF NEW NARROW-BANDWIDTH A-SI-H PHOTODETECTOR |
1994-06-01 |
438 |
2-DIMENSIONAL ARSENIC PRECIPITATION BY IN DELTA-DOPING DURING LOW-TEMPERATURE MOLECULAR-BEAM EPITAXY GROWTH OF GAAS OR ALGAAS |
1994-05-09 |
439 |
EFFECT OF INTERFACIAL OXIDE ON STATIC AND HIGH-FREQUENCY PERFORMANCE IN POLYEMITTER BIPOLAR-TRANSISTORS UNDER HIGH-LEVEL INJECTION |
1994-05-01 |
440 |
NEW POLYSILICON-OXIDE-NITRIDE-OXIDE-SILICON ELECTRICALLY ERASABLE PROGRAMMABLE READ-ONLY MEMORY DEVICE APPROACH FOR ELIMINATING OFF-CELL LEAKAGE CURRENT |
1994-05-01 |
441 |
TEMPERATURE INFLUENCE ON THE GENERALIZED EINSTEIN RELATION FOR DEGENERATE SEMICONDUCTORS WITH ARBITRARY BAND STRUCTURES |
1994-05-01 |
442 |
LOW-TEMPERATURE GROWTH OF SILICON-BORON LAYER BY ULTRAHIGH-VACUUM CHEMICAL-VAPOR-DEPOSITION |
1994-04-04 |
443 |
NANOMETER THICK SI/SIGE STRAINED-LAYER SUPERLATTICES GROWN BY AN ULTRAHIGH-VACUUM CHEMICAL-VAPOR-DEPOSITION TECHNIQUE |
1994-04-01 |
444 |
EFFECT OF GE CONCENTRATION ON STATIC AND MICROWAVE PERFORMANCES IN GEXSI1-X HETEROJUNCTION BIPOLAR-TRANSISTORS UNDER HIGH-LEVEL INJECTION |
1994-04-01 |
445 |
CHARACTERIZATION OF SI/SIGE STRAINED-LAYER SUPERLATTICES GROWN BY AN ULTRAHIGH-VACUUM CHEMICAL-VAPOR-DEPOSITION TECHNIQUE |
1994-04-01 |
446 |
MEASUREMENT OF THIN OXIDE-FILMS ON IMPLANTED SI-SUBSTRATE BY ELLIPSOMETRY |
1994-04-01 |
447 |
STRONG ACCUMULATION OF AS PRECIPITATES IN LOW-TEMPERATURE INGAAS QUANTUM-WELLS GROWN BY MOLECULAR-BEAM EPITAXY |
1994-03-21 |
448 |
GAAS BIDIRECTIONAL BISTABILITY SWITCH USING DOUBLE TRIANGULAR BARRIER STRUCTURES |
1994-03-01 |
449 |
DEPOSITION OF IN-SITU BORON-DOPED POLYCRYSTALLINE SILICON FILMS AT REDUCED PRESSURES |
1994-02-07 |
450 |
AN EFFICIENT APPROACH TO REAL-TIME TRAFFIC ROUTEING FOR TELEPHONE NETWORK MANAGEMENT |
1994-02-01 |
451 |
LOW-TEMPERATURE EPITAXIAL-GROWTH OF SILICON AND SILICON-GERMANIUM ALLOY BY ULTRAHIGH-VACUUM CHEMICAL-VAPOR-DEPOSITION |
1994-01-01 |
452 |
A STUDY ON BILATERAL LATCH-UP SELF-TRIGGERING IN COMPLEMENTARY METAL-OXIDE-SEMICONDUCTOR PROTECTION CIRCUITS |
1994-01-01 |
453 |
A KNOWLEDGE-BASED OPERATION SUPPORT SYSTEM FOR NETWORK TRAFFIC MANAGEMENT |
1994-01-01 |
454 |
COMPRESSIVE AND TENSILE STRAIN EFFECTS ON HOLE TUNNELING IN AN INGAAS/ALLNAS ASYMMETRICAL COUPLED-QUANTUM-WELL |
1993-12-15 |
455 |
ENHANCEMENT OF BAND-EDGE LUMINESCENCE IN HYDROGENATED STRAINED SI(0.84)GE(0.16)/SI QUANTUM-WELLS BY PHOTOCHEMICAL VAPOR-DEPOSITION |
1993-12-01 |
456 |
STUDY OF SCHOTTKY CONTACTS ON N-GA0.51IN0.49P BY LOW-PRESSURE METAL-ORGANIC CHEMICAL-VAPOR-DEPOSITION |
1993-11-01 |
457 |
THE BEHAVIOR OF BILATERAL LATCH-UP TRIGGERING IN VLSI ELECTROSTATIC DISCHARGE DAMAGE PROTECTION CIRCUITS |
1993-11-01 |
458 |
STRONG LUMINESCENCE INTENSITIES IN AL0.22GA0.78AS GROWN ON MISORIENTED (111)B GAAS |
1993-10-25 |
459 |
CURRENT GAINS OF ALAS/GAAS TUNNELING EMITTER BIPOLAR-TRANSISTORS WITH 25-500-ANGSTROM BARRIER THICKNESS |
1993-10-14 |
460 |
CARRIER-INDUCED ENERGY SHIFT IN GAAS/ALGAAS MULTIPLE-QUANTUM-WELL LASER-DIODES |
1993-10-01 |
461 |
EVIDENCE OF ZERO POTENTIAL SPIKE ENERGY IN ALGAAS GAAS HETEROSTRUCTURE EMITTER BIPOLAR-TRANSISTORS |
1993-10-01 |
462 |
ANOMALOUS DOPING BEHAVIOR OF IN-SITU BORON-DOPED POLYCRYSTALLINE SILICON DEPOSITED BY ULTRAHIGH-VACUUM CHEMICAL-VAPOR-DEPOSITION |
1993-09-13 |
463 |
GROWTH OF UNDOPED POLYCRYSTALLINE SI BY AN ULTRAHIGH-VACUUM CHEMICAL-VAPOR-DEPOSITION SYSTEM |
1993-09-06 |
464 |
HYDROGENATED AMORPHOUS-SILICON CARBIDE DOUBLE GRADED-GAP P-I-N THIN-FILM LIGHT-EMITTING-DIODES |
1993-09-01 |
465 |
CHARGE LOSS DUE TO AC PROGRAM DISTURBANCE STRESSES IN EPROMS |
1993-09-01 |
466 |
A NEW DRAIN ENGINEERING STRUCTURE-SCD-LDD (SURFACE COUNTER DOPED LDD) FOR IMPROVED HOT-CARRIER RELIABILITY |
1993-09-01 |
467 |
CHARACTERISTICS OF LOW-TEMPERATURE AND LOW-ENERGY PLASMA-ENHANCED CHEMICAL-VAPOR-DEPOSITED SIO2 |
1993-08-15 |
468 |
AMBIPOLAR PERFORMANCES OF NOVEL AMORPHOUS SILICON-GERMANIUM ALLOY THIN-FILM TRANSISTORS |
1993-08-01 |
469 |
THE STUDY OF EMITTER THICKNESS EFFECT ON THE HETEROSTRUCTURE EMITTER BIPOLAR-TRANSISTORS |
1993-07-15 |
470 |
NEW PHYSICAL FORMULATION OF THE THERMIONIC EMISSION CURRENT AT THE HETEROJUNCTION INTERFACE |
1993-07-01 |
471 |
DOPING OF INGAP EPITAXIAL LAYERS GROWN BY LOW-PRESSURE METAL-ORGANIC CHEMICAL-VAPOR-DEPOSITION |
1993-06-20 |
472 |
CARBON INCORPORATION DURING GROWTH OF GAAS BY TEGA-ASH3 BASE LOW-PRESSURE METALORGANIC CHEMICAL-VAPOR-DEPOSITION |
1993-06-01 |
473 |
TRANSIENT AND STEADY-STATE CARRIER TRANSPORT UNDER HIGH-FIELD STRESSES IN SONOS EEPROM DEVICE |
1993-06-01 |
474 |
OBSERVATION OF QUANTUM CONFINEMENT EFFECTS IN STRAINED SI0.84GE0.16/SI QUANTUM-WELLS AT ROOM-TEMPERATURE |
1993-05-24 |
475 |
HYDROGENATED AMORPHOUS SILICON-CARBIDE THIN-FILM LIGHT-EMITTING DIODE WITH QUANTUM-WELL-INJECTION STRUCTURE |
1993-04-15 |
476 |
NOVEL ALGAAS/GAAS HETEROJUNCTION BIPOLAR-TRANSISTORS FABRICATED BY 2-STAGE MOLECULAR-BEAM EPITAXY |
1993-04-01 |
477 |
SEMIINSULATING IRON-DOPED INDIUM-PHOSPHIDE GROWN BY LOW-PRESSURE METAL ORGANIC-CHEMICAL VAPOR-DEPOSITION |
1993-03-01 |
478 |
VALENCE-BAND MIXING EFFECTS ON HOLE OSCILLATIONS IN COUPLED QUANTUM-WELLS |
1993-02-15 |
479 |
FIELD INVERSION GENERATED IN THE CMOS DOUBLE-METAL PROCESS DUE TO PETEOS AND SOG INTERACTIONS |
1993-01-01 |
480 |
BOLOMETRIC RESPONSE OF SUPERCONDUCTING YBA2CU3O7-X MICROBRIDGES |
1992-12-15 |
481 |
GRADED-GAP A-SIC-H P-I-N THIN-FILM LIGHT-EMITTING-DIODES |
1992-07-01 |
482 |
EFFECTS OF POLYSILICON GATE ON CHARACTERISTICS OF ONO CAPACITORS |
1992-05-01 |
483 |
INTRINSIC AND EXTRINSIC EFFECTS ON PERFORMANCE LIMITATION OF ALGAAS/GAAS DOUBLE-BARRIER RESONANT TUNNELING STRUCTURES |
1992-05-01 |
484 |
DIRECT EVIDENCE OF GATE OXIDE THICKNESS INCREASE IN TUNGSTEN POLYCIDE PROCESSES |
1991-11-01 |
485 |
BOLOMETRIC YBA2CU3O7-X INFRARED DETECTOR |
1991-09-12 |
486 |
QUANTUM EFFECT IN THE ACCUMULATION LAYER ON FIELD-INDUCED PHOTOLUMINESCENCE OF DOUBLE-BARRIER RESONANT TUNNELING STRUCTURES |
1991-07-01 |
487 |
2-DIMENSIONAL ELECTRON GASES IN DELTA-DOPED GAAS/IN0.25GA0.75AS/GAAS HETEROSTRUCTURES |
1991-06-10 |
488 |
THE DELTA-DOPED IN0.25GA0.75AS/GAAS PSEUDOMORPHIC HIGH ELECTRON-MOBILITY TRANSISTOR STRUCTURES PREPARED BY LOW-PRESSURE METAL ORGANIC-CHEMICAL VAPOR-DEPOSITION |
1991-06-01 |
489 |
AMORPHOUS SI/SIC PHOTOTRANSISTORS AND AVALANCHE PHOTODIODES |
1991-06-01 |
490 |
ENERGY-STATES OF FINITE-BARRIER QUANTUM WIRES IN THE PRESENCE OF AN EXTERNAL ELECTRIC-FIELD |
1991-04-08 |
491 |
ELECTRICAL CHARACTERISTICS OF DOUBLE-BARRIER RESONANT TUNNELING STRUCTURES WITH DIFFERENT ELECTRODE DOPING CONCENTRATIONS |
1991-04-01 |
492 |
INVESTIGATION OF INDIUM DOPING AND INCORPORATION IN ALGAAS/GAAS DOUBLE-BARRIER RESONANT TUNNELING STRUCTURES |
1991-02-28 |
493 |
HYDROGENATED AMORPHOUS SI/SIC SUPERLATTICE PHOTOTRANSISTORS |
1991-02-01 |
494 |
CHARACTERIZATION OF IMPROVED ALGAAS/GAAS RESONANT TUNNELING HETEROSTRUCTURE BIPOLAR-TRANSISTORS |
1991-02-01 |
495 |
RESONANT TUNNELING OF ELECTRONS FROM QUANTIZED LEVELS IN THE ACCUMULATION LAYER OF DOUBLE-BARRIER HETEROSTRUCTURES |
1990-11-26 |
496 |
CHARACTERIZATION OF A GAAS CURRENT-CONTROLLED BIPOLAR-UNIPOLAR TRANSITION NEGATIVE DIFFERENTIAL RESISTANCE TRANSISTOR |
1990-08-20 |
497 |
OPTICAL AND NOISE CHARACTERISTICS OF AMORPHOUS SI/SIC SUPERLATTICE REACH-THROUGH AVALANCHE PHOTODIODES |
1990-08-01 |
498 |
ELECTRICAL AND OPTICAL CHARACTERISTICS OF AN A-SI-H/C-SI HETEROJUNCTION SWITCH |
1990-08-01 |
499 |
A NOVEL GAAS CURRENT-CONTROLLED BIPOLAR UNIPOLAR TRANSITION NEGATIVE DIFFERENTIAL RESISTANCE TRANSISTOR PREPARED BY MOLECULAR-BEAM EPITAXY |
1990-06-01 |
500 |
ROOM-TEMPERATURE OPERATION OF A NOVEL NEGATIVE DIFFERENTIAL RESISTANCE DEVICE PREPARED BY MOLECULAR-BEAM EPITAXY |
1990-06-01 |
501 |
VOLTAGE-CONTROLLED 3 TERMINAL GAAS NEGATIVE DIFFERENTIAL RESISTANCE DEVICE USING N+-I-P+-I-N+ STRUCTURE |
1990-06-01 |
502 |
CURRENT-INJECTION 3-TERMINAL GAAS REGENERATIVE SWITCHES |
1990-05-01 |
503 |
REPETITION OF NEGATIVE DIFFERENTIAL RESISTANCE IN VERTICALLY INTEGRATED DOUBLE-BARRIER RESONANT TUNNELING STRUCTURES |
1990-05-01 |
504 |
INVESTIGATION OF 3-TERMINAL VOLTAGE-CONTROLLED SWITCHING DEVICES PREPARED BY MOLECULAR-BEAM EPITAXY |
1990-05-01 |
505 |
THRESHOLD SWITCHING TRANSIENT IN METAL A-SI-H C-SI(P-N) (MASS) HETEROJUNCTION DEVICE |
1990-04-01 |
506 |
A TRISTATE SWITCH USING TRIANGULAR BARRIERS |
1990-02-01 |
507 |
THE HYDROGENATED AMORPHOUS-SILICON REACH-THROUGH AVALANCHE PHOTODIODES (A-SI-H RAPDS) |
1990-02-01 |
508 |
A NOVEL 3-TERMINAL VOLTAGE-CONTROLLED SWITCHING DEVICE PREPARED BY MOLECULAR-BEAM EPITAXY |
1989-12-20 |
509 |
A HYDROGENATED AMORPHOUS SI/SIC HETEROJUNCTION PHOTOTRANSISTOR |
1989-10-01 |
510 |
APPLICATION OF SUPERLATTICE GATE AND MODULATION-DOPED BUFFER FOR GAAS POWER MESFET GROWN BY MBE |
1989-09-01 |
511 |
GEOMETRY-EFFECTS ON THE GAAS BIPOLAR UNIPOLAR NEGATIVE DIFFERENTIAL RESISTANCE TRANSISTOR |
1989-09-01 |
512 |
ORIGIN OF THE ENHANCEMENT OF NEGATIVE DIFFERENTIAL RESISTANCE AT LOW-TEMPERATURES IN DOUBLE-BARRIER RESONANT TUNNELING STRUCTURES |
1989-07-01 |
513 |
NOVEL GAAS VOLTAGE-CONTROLLABLE NEGATIVE DIFFERENTIAL RESISTANCE TRANSISTOR PREPARED BY MOLECULAR-BEAM EPITAXY |
1989-03-20 |
514 |
THE DOPED QUANTUM WELL GATE FET FABRICATED BY LOW-PRESSURE MOCVD |
1988-12-01 |
515 |
HIGH-TEMPERATURE BEHAVIOR OF PD-N-GAAS CONTACTS |
1988-11-01 |
516 |
AMORPHOUS-SILICON SILICON-CARBIDE SUPERLATTICE AVALANCHE PHOTODIODES |
1988-08-01 |
517 |
AN IMPROVED MO/N-GAAS CONTACT BY INTERPOSITION OF A THIN PD LAYER |
1988-06-01 |
518 |
STUDY OF ELECTRICAL CHARACTERISTICS ON THERMALLY NITRIDED SIO2 (NITROXIDE) FILMS |
1984-01-01 |
519 |
AN INVESTIGATION OF MINORITY-CARRIER LIFETIME IN SILICON DOPED EITHER WITH ZINC OR COBALT |
1980-01-01 |
520 |
METAL-N-GAP SCHOTTKY-BARRIER HEIGHTS |
1979-01-01 |
521 |
SPECIFIC CONTACT RESISTANCE OF NI-AU-GE-NGAP SYSTEM |
1978-01-01 |
522 |
TI-TIO2 GATED MOS DIODE LIGHT SENSOR |
1978-01-01 |
523 |
STUDY OF CHARACTERISTICS OF A MG-SI DIODE |
1974-01-01 |