Browsing by Author "CHAO, YF"
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Item type:Item, CHARGE-COUPLED DEVICE POLARIMETRY AND ITS MEASUREMENT OF THE STOKES VECTOR OF LIGHT TRANSMITTED BY A POLYMER PLATE(1991-10-01) ;CHAO, YF ;HSIEH, WF ;交大名義發表 ;光電工程學系National Chiao Tung UniversityThe Stokes vector of light transmitted by a polycarbonate plate is studied by a modified charge-coupled device polarimeter. A sheet polarizer is measured for comparison.Item type:Item, DOUBLE-RESONANCE-ENHANCED RAMAN-SCATTERING IN LASER-RECRYSTALLIZED AMORPHOUS-SILICON FILM(1989-11-15) ;LEE, MC ;HUANG, CR ;CHANG, YS ;CHAO, YF電子物理學系Item type:Item, ELLIPSOMETRIC MEASUREMENTS AND ITS ALIGNMENT - USING THE INTENSITY RATIO TECHNIQUE(1995-09-01) ;CHAO, YF ;WEI, CS ;LEE, WC ;LIN, SCCHAO, TSUsing first-order treatment on azimuth errors of the polarizer (P) and analyzer (A) with respect to the plane of incidence (POI), we construct two intensity ratios around a certain configuration: such as P = +/- pi/4 and A = 0 as compared to A = pi/2. These expressions can be used not only to align the azimuths of the polarizer and analyzer to the POI, hut also to obtain the ellipsometric parameter phi without locating the minimum intensity, BK7 glass and SiO2/Si thin film are ultilized to evaluate this technique.Item type:Item, OPTICAL AND RAMAN CORRELATION OF LASER RECRYSTALLIZED AND QUENCHED AMORPHOUS-SILICON FILM - A MICROPROBE STUDY(1990-06-14) ;HUANG, CR ;LEE, MC ;CHANG, YS ;LIN, CCCHAO, YFItem type:Item, THE ELLIPSOMETRIC MEASUREMENTS ON SIO2 BY INTENSITY RATIO TECHNIQUE(1994) ;CHAO, YF ;WEI, CS ;LEE, WC ;LIN, SC交大名義發表Item type:Item, THE SCATTERED SPECTRUM IN A HOMOGENEOUS ISOTROPIC TURBULENT MEDIUM(1984) ;CHAO, YF ;交大名義發表 ;電子物理學系 ;National Chiao Tung UniversityDepartment of Electrophysics