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學術出版;;Publications
會議論文;;Conferences Paper
THE ELLIPSOMETRIC MEASUREMENTS ON SIO2 BY INTENSITY RATIO TECHNIQUE
THE ELLIPSOMETRIC MEASUREMENTS ON SIO2 BY INTENSITY RATIO TECHNIQUE
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A1994BB96Z00019.pdf
(611.48 KB)
Date
1994
Authors
CHAO, YF
WEI, CS
LEE, WC
LIN, SC
Journal Title
Journal ISSN
Volume Title
Publisher
DOI
10.1117/12.186666
Abstract
Description
Keywords
ELLIPSOMETRY
,
THIN FILM
Citation
URI
http://dx.doi.org/10.1117/12.186666
https://ir.lib.nycu.edu.tw/handle/11536/20125
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會議論文;;Conferences Paper
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