THE ELLIPSOMETRIC MEASUREMENTS ON SIO2 BY INTENSITY RATIO TECHNIQUE
| dc.citation.epage | 180 | en_US |
| dc.citation.spage | 171 | en_US |
| dc.citation.volume | 2265 | en_US |
| dc.contributor.author | CHAO, YF | en_US |
| dc.contributor.author | WEI, CS | en_US |
| dc.contributor.author | LEE, WC | en_US |
| dc.contributor.author | LIN, SC | en_US |
| dc.contributor.department | 交大名義發表 | zh_TW |
| dc.contributor.department | National Chiao Tung University | en_US |
| dc.date.accessioned | 2014-12-08T15:27:52Z | |
| dc.date.available | 2014-12-08T15:27:52Z | |
| dc.date.issued | 1994 | en_US |
| dc.identifier.doi | 10.1117/12.186666 | en_US |
| dc.identifier.isbn | 0-8194-1589-8 | en_US |
| dc.identifier.journal | POLARIZATION ANALYSIS AND MEASUREMENT II | en_US |
| dc.identifier.uri | http://dx.doi.org/10.1117/12.186666 | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/20125 | |
| dc.identifier.wosnumber | WOS:A1994BB96Z00019 | |
| dc.language.iso | en_US | en_US |
| dc.subject | ELLIPSOMETRY | en_US |
| dc.subject | THIN FILM | en_US |
| dc.title | THE ELLIPSOMETRIC MEASUREMENTS ON SIO2 BY INTENSITY RATIO TECHNIQUE | en_US |
| dc.type | Proceedings Paper | en_US |