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公開日期標題作者
1-四月-2002Characterization of the novel polysilicon TFT with a subgate coupling structureChang, KM; Chung, YH; Deng, CG; Chung, YF; Lin, JH; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-十月-2001Enhanced degradation in polycrystalline silicon thin-film transistors under dynamic hot-carrier stressChang, KM; Chung, YH; Lin, GM; Deng, CG; Lin, JH; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-四月-2002Hot carrier induced degradation in the low temperature processed polycrystalline silicon thin film transistors using the dynamic stressChang, KM; Chung, YH; Lin, GM; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-六月-2001A method to characterize n(+)-polysilicon/oxide interface traps in ultrathin oxidesChang, KM; Chung, YH; Lee, TC; Sun, YL; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-十月-2001A novel high-performance poly-silicon thin film transistor with a self-aligned thicker sub-gate oxide near the drain/source regionsChang, KM; Chung, YH; Lin, GM; Lin, JH; Deng, CG; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-十月-2001Thickness and stress polarity effects on the reliability of the low thermal budget polyoixdesChang, KM; Chung, YH; Chen, HY; Lee, TC; Sun, YL; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
顯示 3 到 8 筆資料，總共 8 筆 < 上一頁