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Browsing by Author Chung, YH

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Showing results 1 to 8 of 8
Issue DateTitleAuthor(s)
1-May-2002Anomalous variations of OFF-state leakage current in poly-Si TFT under static stressChang, KM; Chung, YH; Lin, GM; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Feb-2005Carrier capture and relaxation of self-assembled ZnTe/ZnSe quantum dots prepared under Volmer-Weber and Stranski-Krastanow growth modesLee, ME; Yeh, YC; Chung, YH; Wu, CL; Yang, CS; Chou, WC; Kuo, CT; Jang, DJ; 電子物理學系; Department of Electrophysics
1-Apr-2002Characterization of the novel polysilicon TFT with a subgate coupling structureChang, KM; Chung, YH; Deng, CG; Chung, YF; Lin, JH; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Oct-2001Enhanced degradation in polycrystalline silicon thin-film transistors under dynamic hot-carrier stressChang, KM; Chung, YH; Lin, GM; Deng, CG; Lin, JH; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Apr-2002Hot carrier induced degradation in the low temperature processed polycrystalline silicon thin film transistors using the dynamic stressChang, KM; Chung, YH; Lin, GM; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Jun-2001A method to characterize n(+)-polysilicon/oxide interface traps in ultrathin oxidesChang, KM; Chung, YH; Lee, TC; Sun, YL; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Oct-2001A novel high-performance poly-silicon thin film transistor with a self-aligned thicker sub-gate oxide near the drain/source regionsChang, KM; Chung, YH; Lin, GM; Lin, JH; Deng, CG; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Oct-2001Thickness and stress polarity effects on the reliability of the low thermal budget polyoixdesChang, KM; Chung, YH; Chen, HY; Lee, TC; Sun, YL; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
Showing results 1 to 8 of 8