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Browsing by Author Li, L. C.

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Showing results 1 to 8 of 8
Issue DateTitleAuthor(s)
1-Feb-2009Correlated Electric Fluctuations in GaN Nanowire DevicesLi, L. C.; Huang, S. Y.; Wei, J. A.; Suen, Y. W.; Lee, M. W.; Hsieh, W. H.; Liu, T. W.; Chen, C. C.; 奈米科技中心; Center for Nanoscience and Technology
1-Mar-2008Edge magnetoplasma excitations in quantum wire arraysHsieh, W. H.; Suen, Y. W.; Lee, B. C.; Li, L. C.; Lee, C. P.; 電子工程學系及電子研究所; 奈米科技中心; Department of Electronics Engineering and Institute of Electronics; Center for Nanoscience and Technology
15-Dec-2010Electron delocalization of tensily strained GaAs quantum dots in GaSb matrixLin, T. C.; Wu, Y. H.; Li, L. C.; Sung, Y. T.; Lin, S. D.; Chang, L.; Suen, Y. W.; Lee, C. P.; 材料科學與工程學系; 電子工程學系及電子研究所; 奈米科技中心; Department of Materials Science and Engineering; Department of Electronics Engineering and Institute of Electronics; Center for Nanoscience and Technology
1-Jul-2016Low-Frequency Noise Characterization of CoFeB/MgO/CoFeB MTJ-Based Perpendicular Field SensorDas, Bipul; Lee, Y. C.; Li, L. C.; Yi-Shiou, Liu; Suen, Y. W.; Horng, Lance; Wu, Te-Ho; Chang, C. R.; Wu, Jong-Ching; 奈米科技中心; Center for Nanoscience and Technology
Jul-2016Low-Frequency Noise Characterization of CoFeB/MgO/CoFeB MTJ-Based Perpendicular Field SensorDas, Bipul; Lee, Y. C.; Li, L. C.; Yi-Shiou, Liu; Suen, Y. W.; Horng, Lance; Wu, Te-Ho; Chang, C. R.; Wu, Jong-Ching; 奈米科技中心; Center for Nanoscience and Technology
7-May-2015Magnetic tunnel junction based out-of-plane field sensor with perpendicular magnetic anisotropy in reference layerLee, Y. C.; Chao, C. T.; Li, L. C.; Suen, Y. W.; Horng, Lance; Wu, Te-Ho; Chang, C. R.; Wu, J. C.; 奈米科技中心; Center for Nanoscience and Technology
1-Feb-2010Microwave-induced DC currents in mesoscopic structuresLi, L. C.; Sung, Y. T.; Chang, C. W.; Suen, Y. W.; Chen, K. Y.; Liang, C. T.; Chen, Y. F.; Lee, B. C.; Lee, C. P.; 電子工程學系及電子研究所; 奈米科技中心; Department of Electronics Engineering and Institute of Electronics; Center for Nanoscience and Technology
2007Temperature dependence of the excess noise of a GaN nanowire deviceLi, L. C.; Huang, S. Y.; Wei, J. A.; Suen, Y. W.; Lee, M. W.; Hsieh, W. H.; Liu, T. W.; Chen, C. C.; 奈米科技中心; Center for Nanoscience and Technology
Showing results 1 to 8 of 8