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Showing results 1 to 10 of 10
Issue DateTitleAuthor(s)
2007Analysis of P-type poly-Si TFT degradation under dynamic gate voltage stress using the slicing modelHuang, Shih-Che; Tsao, Hung-Chuan; Tai, Ya-Hsiang; 光電工程學系; Department of Photonics
1-Dec-2006Analysis of poly-Si TFT degradation under gate pulse stress using the slicing modelTai, Ya-Hsiang; Huang, Shih-Che; Chen, Chien-Kwen; 光電工程學系; 顯示科技研究所; Department of Photonics; Institute of Display
1-Mar-2010Characterization of the Channel-Shortening Effect on P-Type Poly-Si TFTsTai, Ya-Hsiang; Huang, Shih-Che; Chen, Po-Ting; 光電工程學系; 顯示科技研究所; Department of Photonics; Institute of Display
1-Mar-2009Degradation Mechanism of Poly-Si TFTs Dynamically Operated in OFF RegionTai, Ya-Hsiang; Huang, Shih-Che; Chen, Po-Ting; 光電工程學系; 顯示科技研究所; Department of Photonics; Institute of Display
2007Electrical degradation of N-channel poly-Si TFT under AC stress by C-V measurementLu, Hau-Yan; Liu, Po-Tsun; Chang, Ting-Chang; Chi, Sein; 光電工程學系; Department of Photonics
1-Mar-2011Generalized Hot-Carrier Degradation and Its Mechanism in Poly-Si TFTs Under DC/AC OperationsTai, Ya-Hsiang; Huang, Shih-Che; Chen, Po-Ting; Lin, Chih-Jung; 光電工程學系; 顯示科技研究所; Department of Photonics; Institute of Display
2005N型低溫複晶矽薄膜電晶體在閘極交流電壓下的劣化研究陳建焜; Chien-Kun Chen; 戴亞翔; Ya-Hsiang Tai; 顯示科技研究所
2004低溫複晶矽薄膜電晶體在閘極交流訊號下之可靠度研究江可玉; 鄭晃忠; 電子研究所
2006複晶矽薄膜電晶體中漏電流及可靠度課題之研究李明賢; Ming-Hsien Lee; 林鴻志; 黃調元; Horng-Chih Lin; Tiao-Yuan Huang; 電子研究所
2008超薄氧化鉿及氧化鋯鉿介電層之可靠度研究林玉喬; Lin, Yu-Chiao; 趙天生; Chao, Tien-Sheng; 電子物理系所
Showing results 1 to 10 of 10