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公開日期標題作者
1-四月-2019The Effect of Microwave Annealing of Reliability Characteristics on Amorphous IGZO Thin Film TransistorsWu, Chien-Hung; Chang, Kow-Ming; Chen, Yi-Ming; Zhang, Yu-Xin; Cheng, Chia-Yao; 電子工程學系及電子研究所; 國際半導體學院; Department of Electronics Engineering and Institute of Electronics; International College of Semiconductor Technology
2016The Investigation for In-Ga-Zn-O TFTs with Post Deposition of in-situ Ar/H-2 Plasma Treatment by Atmospheric Pressure Plasma JetChang, Kow-Ming; Huang, Bo-Wen; Wu, Chien-Hung; Chen, Hsin-Ying; Zheng, You-Xian; Lee, Ming-Chuan; Zhang, Yu-Xin; Lin, Chuang-Ju; Cheng, Yu-Hsuan; Wang, Shui-Jinn; Hsu, Jui-Mei; Lin, Yu-Li; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
六月-2016The Performance Improvement of N-2 Plasma Treatment on ZrO2 Gate Dielectric Thin-Film Transistors with Atmospheric Pressure Plasma-Enhanced Chemical Vapor Deposition IGZO ChannelWu, Chien-Hung; Huang, Bo-Wen; Chang, Kow-Ming; Wang, Shui-Jinn; Lin, Jian-Hong; Hsu, Jui-Mei; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-七月-2020Study of Atmospheric-Pressure Plasma Enhanced Chemical Vapor Deposition Fabricated Indium Gallium Zinc Oxide Thin Film Transistors with In-Situ Hydrogen Plasma TreatmentChen, Yi-Ming; Wu, Chien-Hung; Chang, Kow-Ming; Zhang, Yu-Xin; Xu, Ni; Yu, Tsung-Ying; Chin, Albert; 電機學院; 電子工程學系及電子研究所; College of Electrical and Computer Engineering; Department of Electronics Engineering and Institute of Electronics
2015微波退火處理對於氧化鑭鋁/二氧化鋯/銦鎵鋅氧化物薄膜電晶體之電特性與可靠度研究鄭家堯; Cheng, Chia-Yao; 張國明; Chang, Kow-Ming; 電子工程學系 電子研究所
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