1. You are Here：

Browsing by Subject dynamic stress

Jump to: 0-9 A B C D E F G H I J K L M N O P Q R S T U V W X Y Z
or enter first few letters:  
Showing results 1 to 8 of 8
Issue DateTitleAuthor(s)
1-Dec-2006Analysis of poly-Si TFT degradation under gate pulse stress using the slicing modelTai, Ya-Hsiang; Huang, Shih-Che; Chen, Chien-Kwen; 光電工程學系; 顯示科技研究所; Department of Photonics; Institute of Display
2008Characterization of device degradation of poly-Si TFTs under dynamic operation with drain biasedTai, Ya-Hsiang; Huang, Shih-Che; Chan, Chang-Lung; 光電工程學系; Department of Photonics
1-Mar-2009Degradation Mechanism of Poly-Si TFTs Dynamically Operated in OFF RegionTai, Ya-Hsiang; Huang, Shih-Che; Chen, Po-Ting; 光電工程學系; 顯示科技研究所; Department of Photonics; Institute of Display
1-May-2004An endurance evaluation method for flash EEPROMZous, NK; Chen, YJ; Chin, CY; Tsai, WJ; Lu, TC; Chen, MS; Lu, WP; Wang, TH; Pan, SC; Lu, CY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Mar-2011Generalized Hot-Carrier Degradation and Its Mechanism in Poly-Si TFTs Under DC/AC OperationsTai, Ya-Hsiang; Huang, Shih-Che; Chen, Po-Ting; Lin, Chih-Jung; 光電工程學系; 顯示科技研究所; Department of Photonics; Institute of Display
1-Apr-2002Hot carrier induced degradation in the low temperature processed polycrystalline silicon thin film transistors using the dynamic stressChang, KM; Chung, YH; Lin, GM; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2005低溫多晶矽薄膜電晶體在動態操作下之可靠度研究李逸哲; 劉柏村; Po-Tsun Liu; 光電工程學系
2008超薄氧化鉿及氧化鋯鉿介電層之可靠度研究林玉喬; Lin, Yu-Chiao; 趙天生; Chao, Tien-Sheng; 電子物理系所
Showing results 1 to 8 of 8