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公開日期標題作者
13-八月-2019Analytics-statistics mixed training and its fitness to semisupervised manufacturingParashar, Parag; Chen, Chun Han; Akbar, Chandni; Fu, Sze Ming; Rawat, Tejender S.; Pratik, Sparsh; Butola, Rajat; Chen, Shih Han; Lin, Albert S.; 電機學院; 電子工程學系及電子研究所; College of Electrical and Computer Engineering; Department of Electronics Engineering and Institute of Electronics
1-一月-2018Intelligent Manufacturing: TCAD-Assisted Adaptive Weighting Neural NetworksHuang, Chien Y.; Fu, Sze M.; Parashar, Parag; Chen, Chun H.; Akbar, Chandni; Lin, Albert S.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-十月-2019Intelligent Photolithography Corrections Using Dimensionality ReductionsParashar, Parag; Akbar, Chandni; Rawat, Tejender S.; Pratik, Sparsh; Butola, Rajat; Chen, Shih H.; Chang, Yung-Sung; Nuannimnoi, Sirapop; Lin, Albert S.; 交大名義發表; 電子工程學系及電子研究所; National Chiao Tung University; Department of Electronics Engineering and Institute of Electronics
1-一月-2019Physics-Prior Bayesian Neural Networks in Semiconductor ProcessingChen, Chun Han; Parashar, Parag; Akbar, Chandni; Fu, Sze Ming; Syu, Ming-Ying; Lin, Albert; 交大名義發表; 電子工程學系及電子研究所; National Chiao Tung University; Department of Electronics Engineering and Institute of Electronics
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