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Browsing by Author Bin, Shu-Yung

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Issue DateTitleAuthor(s)
1-Feb-2016Predicting Shot-Level SRAM Read/Write Margin Based on Measured Transistor CharacteristicsBin, Shu-Yung; Lin, Shih-Feng; Cheng, Ya-Ching; Liau, Wen-Rong; Hou, Alex; Chao, Mango C. -T.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2014基於量測電晶體特性之預測曝光層級靜態隨機存取記憶體讀寫容限賓恕雍; Bin, Shu-Yung; 趙家佐; Mango Chia-Tso Chao; 電子工程學系 電子研究所
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