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公開日期標題作者
1-三月-2015Criteria for Plasmon-Enhanced Electron Drag in Si Metal-Oxide-Semiconductor DevicesChen, Ming-Jer; Hsieh, Shang-Hsun; Liao, Yu-Chiao; Chen, Chuan-Li; Tsai, Ming-Fu; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
28-七月-2015Plasmon-enhanced phonon and ionized impurity scattering in doped siliconChen, Ming-Jer; Hsieh, Shang-Hsun; Chen, Chuan-Li; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-七月-2014Plasmons-Enhanced Minority-Carrier Injection as a Measure of Potential Fluctuations in Heavily Doped SiliconChen, Ming-Jer; Chen, Chuan-Li; Hsieh, Shang-Hsun; Chang, Li-Ming; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-十二月-2013Probing Long-Range Coulomb Interactions in Nanoscale MOSFETsChen, Ming-Jer; Chang, Li-Ming; Wei, Sih-Yun; Chen, Wan-Li; Yeh, Ting-Hsien; Chen, Chuan-Li; Liao, Yu-Chiao; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-七月-2014A Statistical Model for the Headed and Tail Distributions of Random Telegraph Signal Magnitudes in Nanoscale MOSFETsChen, Ming-Jer; Tu, Kong-Chiang; Wang, Huan-Hsiung; Chen, Chuan-Li; Lai, Shiou-Yi; Liu, You-Sheng; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2014長距庫倫作用於塊材矽之探討陳泉利; Chen, Chuan-Li; 陳明哲; Chen, Ming-Jer; 電子工程學系 電子研究所
顯示 1 到 6 筆資料，總共 6 筆