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公開日期標題作者
2005Analysis of silicon nanocrystals in silicon-rich SiO2 synthesized by CO2 laser annealing - art. no. 602020Lin, CJ; Lin, GR; Chueh, YL; Chou, LJ; 光電工程學系; Department of Photonics
13-三月-2006Anomalous electrical performance of nanoscaled interfacial oxides for bonded n-GaAs wafersHao, OY; Wu, YCS; Chiou, HH; Liu, CC; Cheng, JH; Wen, OY; Chiou, SH; Shiue, ST; Chueh, YL; Chou, LJ; 材料科學與工程學系; Department of Materials Science and Engineering
1-五月-2004Characterization of interfacial layer of ultrathin Zr silicate on Si(100) using spectroscopic ellipsometry and HRTEMAhn, H; Chen, HW; Landheer, D; Wu, X; Chou, LJ; Chao, TS; 電子物理學系; 電子工程學系及電子研究所; Department of Electrophysics; Department of Electronics Engineering and Institute of Electronics
2005CO2 laser annealing synthesis of silicon nanocrystals buried in Si-rich SiO2Lin, CJ; Chueh, YL; Chou, LJ; Kuo, HC; Lin, GR; 光電工程學系; Department of Photonics
2005Effects of N2O fluence on the PECVD-grown Si-rich SiOx with buried Si nanocrystalsLin, CJ; Kuo, HC; Chen, CY; Chueh, YL; Chou, LJ; Chang, CW; Diau, EWG; Lin, GR; 光電工程學系; Department of Photonics
2005Improved near-infrared luminescence of si-rich SiO2 with buried Si nanocrystals grown by PECVD at optimized N2O fluenceChen, CY; Lin, CJ; Kuo, HC; Lin, GR; Chueh, YL; Chou, LJ; Chang, CW; Diau, EWG; 光電工程學系; Department of Photonics
1-五月-2005Oxygen defect and Si nanocrystal dependent white-light and near-infrared electroluminescence of Si-implanted and plasma-enhanced chemical-vapor deposition-grown Si-rich SiO2Lin, GR; Lin, CJ; Lin, CK; Chou, LJ; Chueh, YL; 光電工程學系; Department of Photonics
1-二月-2006Photoluminescence of plasma enhanced chemical vapor deposition amorphous silicon oxide with silicon nanocrystals grown at different fluence ratios and substrate temperaturesLin, CJ; Lin, CK; Chang, CW; Chueh, YL; Kuo, HC; Diau, EWG; Chou, LJ; Lin, GR; 材料科學與工程學系; 應用化學系; 光電工程學系; Department of Materials Science and Engineering; Department of Applied Chemistry; Department of Photonics
2005Synthesis of silicon nanocrystals in silicon-rich SiO2 by rapid CO2 laser annealingLin, CJ; Lin, GR; Chueh, YL; Chou, LJ; 光電工程學系; Department of Photonics
1-八月-2003Thickness dependence of microstructure of laterally crystallized poly-Si thin films and electrical characteristics of low-temperature poly-Si TFTsChang, TK; Lin, CW; Chang, YH; Tseng, CH; Chu, FT; Cheng, HC; Chou, LJ; 材料科學與工程學系; 電子工程學系及電子研究所; Department of Materials Science and Engineering; Department of Electronics Engineering and Institute of Electronics
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