國立陽明交通大學機構典藏：瀏覽交通大學機構典藏

瀏覽的方式：作者 Chung, YH

顯示 1 到 8 筆資料，總共 8 筆

公開日期	標題	作者
1-五月-2002	Anomalous variations of OFF-state leakage current in poly-Si TFT under static stress	Chang, KM; Chung, YH; Lin, GM; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-二月-2005	Carrier capture and relaxation of self-assembled ZnTe/ZnSe quantum dots prepared under Volmer-Weber and Stranski-Krastanow growth modes	Lee, ME; Yeh, YC; Chung, YH; Wu, CL; Yang, CS; Chou, WC; Kuo, CT; Jang, DJ; 電子物理學系; Department of Electrophysics
1-四月-2002	Characterization of the novel polysilicon TFT with a subgate coupling structure	Chang, KM; Chung, YH; Deng, CG; Chung, YF; Lin, JH; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-十月-2001	Enhanced degradation in polycrystalline silicon thin-film transistors under dynamic hot-carrier stress	Chang, KM; Chung, YH; Lin, GM; Deng, CG; Lin, JH; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-四月-2002	Hot carrier induced degradation in the low temperature processed polycrystalline silicon thin film transistors using the dynamic stress	Chang, KM; Chung, YH; Lin, GM; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-六月-2001	A method to characterize n(+)-polysilicon/oxide interface traps in ultrathin oxides	Chang, KM; Chung, YH; Lee, TC; Sun, YL; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-十月-2001	A novel high-performance poly-silicon thin film transistor with a self-aligned thicker sub-gate oxide near the drain/source regions	Chang, KM; Chung, YH; Lin, GM; Lin, JH; Deng, CG; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-十月-2001	Thickness and stress polarity effects on the reliability of the low thermal budget polyoixdes	Chang, KM; Chung, YH; Chen, HY; Lee, TC; Sun, YL; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics

顯示 1 到 8 筆資料，總共 8 筆