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顯示 1 到 13 筆資料，總共 13 筆
公開日期標題作者
24-九月-2012Abnormal interface state generation under positive bias stress in TiN/HfO2 p-channel metal-oxide-semiconductor field effect transistorsLo, Wen-Hung; Chang, Ting-Chang; Tsai, Jyun-Yu; Dai, Chih-Hao; Chen, Ching-En; Ho, Szu-Han; Chen, Hua-Mao; Cheng, Osbert; Huang, Cheng-Tung; 電子工程學系及電子研究所; 光電工程學系; Department of Electronics Engineering and Institute of Electronics; Department of Photonics
9-四月-2012Charge trapping induced drain-induced-barrier-lowering in HfO2/TiN p-channel metal-oxide-semiconductor-field-effect-transistors under hot carrier stressLo, Wen-Hung; Chang, Ting-Chang; Tsai, Jyun-Yu; Dai, Chih-Hao; Chen, Ching-En; Ho, Szu-Han; Chen, Hua-Mao; Cheng, Osbert; Huang, Cheng-Tung; 電子工程學系及電子研究所; 光電工程學系; Department of Electronics Engineering and Institute of Electronics; Department of Photonics
30-十二月-2011Charge trapping induced frequency-dependence degradation in n-MOSFETs with high-k/metal gate stacksDai, Chih-Hao; Chang, Ting-Chang; Chu, Ann-Kuo; Kuo, Yuan-Jui; Hung, Ya-Chi; Lo, Wen-Hung; Ho, Szu-Han; Chen, Ching-En; Shih, Jou-Miao; Chung, Wan-Lin; Chen, Hua-Mao; Dai, Bai-Shan; Tsai, Tsung-Ming; Xia, Guangrui; Cheng, Osbert; Huang, Cheng Tung; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
25-十一月-2010Enhanced gate-induced floating-body effect in PD SOI MOSFET under external mechanical strainDai, Chih-Hao; Chang, Ting-Chang; Chu, Ann-Kuo; Kuo, Yuan-Jui; Chen, Shih-Ching; Tsai, Chih-Tsung; Lo, Wen-Hung; Ho, Szu-Han; Xia, Guangrui; Cheng, Osbert; Huang, Cheng Tung; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
4-七月-2011Hot carrier effect on gate-induced drain leakage current in high-k/metal gate n-channel metal-oxide-semiconductor field-effect transistorsDai, Chih-Hao; Chang, Ting-Chang; Chu, Ann-Kuo; Kuo, Yuan-Jui; Ho, Szu-Han; Hsieh, Tien-Yu; Lo, Wen-Hung; Chen, Ching-En; Shih, Jou-Miao; Chung, Wan-Lin; Dai, Bai-Shan; Chen, Hua-Mao; Xia, Guangrui; Cheng, Osbert; Huang, Cheng Tung; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2012Hot Carrier Effect on Gate-Induced Drain Leakage Current in n-MOSFETs with HfO2/Ti1-xNx Gate StacksDai, Chih-Hao; Chang, Ting-Chang; Chu, Ann-Kuo; Kuo, Yuan-Jui; Ho, Szu-Han; Hsieh, Tien-Yu; Lo, Wen-Hung; Chen, Ching-En; Shih, Jou-Miao; Chung, Wan-Lin; Dai, Bai-Shan; Chen, Hua-Mao; Xia, Guangrui; Cheng, Osbert; Huang, Cheng Tung; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-三月-2012Impact of Mechanical Strain on GIFBE in PD SOI p-MOSFETs as Indicated From NBTI DegradationLo, Wen-hung; Chang, Ting-Chang; Dai, Chih-Hao; Chung, Wan-Lin; Chen, Ching-En; Ho, Szu-Han; Cheng, Osbert; Huang, Cheng Tung; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
28-二月-2011Impact of static and dynamic stress on threshold voltage instability in high-k/metal gate n-channel metal-oxide-semiconductor field-effect transistorsDai, Chih-Hao; Chang, Ting-Chang; Chu, Ann-Kuo; Kuo, Yuan-Jui; Lo, Wen-Hung; Ho, Szu-Han; Chen, Ching-En; Shih, Jou-Miao; Chen, Hua-Mao; Dai, Bai-Shan; Xia, Guangrui; Cheng, Osbert; Huang, Cheng Tung; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
15-一月-2013Impact of strain on gate-induced floating body effect for partially depleted silicon-on-insulator p-type metal-oxide-semiconductor-field-effect-transistorsLo, Wen-Hung; Chang, Ting-Chang; Dai, Chih-Hao; Chung, Wan-Lin; Chen, Ching-En; Ho, Szu-Han; Tsai, Jyun-Yu; Chen, Hua-Mao; Liu, Guan-Ru; Cheng, Osbert; Huang, Cheng-Tung; 電子工程學系及電子研究所; 光電工程學系; Department of Electronics Engineering and Institute of Electronics; Department of Photonics
2013Investigation of Lateral Trap Position by Random Telegraph Signal Analysis in Moderate Inversion in n-Channel MOSFETsChen, Ching-En; Chang, Ting-Chang; You, Bo; Lo, Wen-Hung; Ho, Szu-Han; Dai, Chih-Hao; Tsai, Jyun-Yu; Chen, Hua-Mao; Liu, Guan-Ru; Tai, Ya-Hsiang; Tseng, Tseung-Yuen; 電機學院; 電子工程學系及電子研究所; 光電工程學系; College of Electrical and Computer Engineering; Department of Electronics Engineering and Institute of Electronics; Department of Photonics
1-七月-2011NBTI Degradation in LTPS TFTs Under Mechanical Tensile StrainLin, Chia-Sheng; Chen, Ying-Chung; Chang, Ting-Chang; Jian, Fu-Yen; Hsu, Wei-Che; Kuo, Yuan-Jui; Dai, Chih-Hao; Chen, Te-Chih; Lo, Wen-Hung; Hsieh, Tien-Yu; Shih, Jou-Miao; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-七月-2011On the Origin of Gate-Induced Floating-Body Effect in PD SOI p-MOSFETsDai, Chih-Hao; Chang, Ting-Chang; Chu, An-Kuo; Kuo, Yuan-Jui; Jian, Fu-Yen; Lo, Wen-Hung; Ho, Szu-Han; Chen, Ching-En; Chung, Wan-Lin; Shih, Jou-Miao; Xia, Guangrui; Cheng, Osbert; Huang, Cheng-Tung; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-六月-2010On the Origin of Hole Valence Band Injection on GIFBE in PD SOI n-MOSFETsDai, Chih-Hao; Chang, Ting-Chang; Chu, Ann-Kuo; Kuo, Yuan-Jui; Chen, Shih-Ching; Tsai, Chih-Chung; Ho, Szu-Han; Lo, Wen-Hung; Xia, Guangrui; Cheng, Osbert; Huang, Cheng Tung; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
顯示 1 到 13 筆資料，總共 13 筆