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15-四月-2006The ac effect of vortex pinning in the arrays of defect sites on Nb filmsWu, TC; Horng, L; Wu, JC; Hsiao, CW; Kolacek, J; Yang, TJ; 電子物理學系; Department of Electrophysics
15-五月-2004Impact of air filter material on metal oxide semiconductor (MOS) device characteristics in HF vapor environmentHsiao, CW; Lou, JC; Yeh, CF; Hsieh, CM; Lin, SJ; Kusumi, T; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2002Impact of airborne molecular contamination to nano-device performanceYeh, CF; Hsiao, CW; Lin, SJ; Xie, ZM; Kusumi, T; Aomi, H; Kaneko, H; Da, BT; Tsai, MS; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-五月-2001In the blink of a silicon eyeCheng, CH; Wu, CY; Sheu, B; Lin, LJ; Huang, KH; Jiang, HC; Yen, WC; Hsiao, CW; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
30-六月-2003Novel post CMP cleaning using buffered HF solution and ozone waterYeh, CF; Hsiao, CW; Lee, WS; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-五月-2004The removal of airborne molecular contamination in cleanroom using PTFE and chemical filtersYeh, CF; Hsiao, CW; Lin, SJ; Hsieh, CM; Kusumi, T; Aomi, H; Kaneko, H; Dai, BT; Tsai, MS; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
15-五月-2006Vortex dynamics in spacing-graded array of defects on a niobium filmWu, TC; Horng, L; Wu, JC; Hsiao, CW; Kolacek, J; Yang, TJ; 電子物理學系; Department of Electrophysics
顯示 1 到 7 筆資料，總共 7 筆