瀏覽 的方式： 作者 Hsiao, Yi-Li
顯示 1 到 2 筆資料，總共 2 筆
| 公開日期 | 標題 | 作者 |
| 2015 | Electromigration Immortality of Purely Intermetallic Micro -bump for 3D Integration | Chen, Hsiao-Yun; Tung, Chih-Hang; Hsiao, Yi-Li; Wu, Jyun-lin; Yeh, Tung-Ching; Lin, Larry Liang-Chen; Chen, Chih; Yu, Douglas Cheng-Hua; 材料科學與工程學系; Department of Materials Science and Engineering |
| 2013 | Generic Rules to Achieve Bump Electromigration Immortality for 3D IC Integration | Chen, Hsiao-Yun; Shih, Da-Yuan; Wei, Cheng-Chang; Tung, Chih-Hang; Hsiao, Yi-Li; Yu, Douglas Cheng-Hua; Liang, Yu-Chun; Chen, Chih; 材料科學與工程學系; Department of Materials Science and Engineering |
