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公開日期標題作者
2012Alternate Hammering Test for Application-Specific DRAMs and an Industrial Case StudyHuang, Rei-Fu; Yang, Hao-Yu; Chao, Mango C. -T.; Lin, Shih-Chin; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2010Fault Models and Test Methods for Subthreshold SRAMsLin, Chen-Wei; Chen, Hung-Hsin; Yang, Hao-Yu; Chao, Mango C-T; Huang, Rei-Fu; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-三月-2013Fault Models and Test Methods for Subthreshold SRAMsLin, Chen-Wei; Chen, Hung-Hsin; Yang, Hao-Yu; Huang, Chin-Yuan; Chao, Mango C. -T.; Huang, Rei-Fu; 交大名義發表; 電子工程學系及電子研究所; National Chiao Tung University; Department of Electronics Engineering and Institute of Electronics
2009Fault Models for Embedded-DRAM MacrosChao, Mango C. -T.; Yang, Hao-Yu; Huang, Rei-Fu; Lin, Shih-Chin; Chin, Ching-Yu; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-九月-2012Testing Methodology of Embedded DRAMsYang, Hao-Yu; Chang, Chi-Min; Chao, Mango C. -T.; Huang, Rei-Fu; Lin, Shih-Chin; 交大名義發表; 電子工程學系及電子研究所; National Chiao Tung University; Department of Electronics Engineering and Institute of Electronics
2008Testing Methodology of Embedded DRAMsChang, Chi-Min; Chao, Mango C. -T.; Huang, Rei-Fu; Chen, Ding-Yuan; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2014Testing Methods for a Write-Assist Disturbance-Free Dual-Port SRAMYang, Hao-Yu; Lin, Chen-Wei; Huang, Chao-Ying; Lu, Ching-Ho; Lai, Chen-An; Chao, Mango C. -T.; Huang, Rei-Fu; 交大名義發表; 電子工程學系及電子研究所; National Chiao Tung University; Department of Electronics Engineering and Institute of Electronics
2015Testing Methods for Quaternary Content Addressable Memory Using Charge-Sharing Sensing SchemeYang, Hao-Yu; Huang, Rei-Fu; Su, Chin-Lung; Lin, Kuan-Hong; Shu, Hang-Kaung; Peng, Chi-Wei; Chao, Mango C. -T.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
顯示 1 到 8 筆資料，總共 8 筆