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公開日期標題作者
1-一月-2013Aging-aware Statistical Soft-Error-Rate Analysis for Nano-Scaled CMOS DesignsLin, Cosette Y. H.; Huang, Ryan H. -M.; Wen, Charles H. -P.; Chang, Austin C. -C.; 電機工程學系; Department of Electrical and Computer Engineering
2013Aging-aware Statistical Soft-Error-Rate Analysis for Nano-Scaled CMOS DesignsLin, Cosette Y. H.; Huang, Ryan H. -M.; Wen, Charles H. -P.; Chang, Austin C. -C.; 電機資訊學士班; Undergraduate Honors Program of Electrical Engineering and Computer Science
1-十月-2013CASSER: A Closed-Form Analysis Framework for Statistical Soft Error RateChang, Austin C. -C.; Huang, Ryan H. -M.; Wen, Charles H. -P.; 電機資訊學士班; Undergraduate Honors Program of Electrical Engineering and Computer Science
1-四月-2015A Determinate Radiation Hardened Technique for Safety-Critical CMOS DesignsHuang, Ryan H. -M.; Hsu, Dennis K. -H.; Wen, Charles H. -P.; 電機資訊學士班; Undergraduate Honors Program of Electrical Engineering and Computer Science
1-一月-2014Suppressing Test Inflation in Shared-Memory Parallel Automatic Test Pattern GenerationKu, Jerry C. Y.; Huang, Ryan H. -M.; Lin, Louis Y. -Z.; Wen, Charles H. -P.; 資訊工程學系; Department of Computer Science
2015TA-FTA: Transition-Aware Functional Timing Analysis with A Four-Valued EncodingChang, Jasper C. C.; Huang, Ryan H. -M.; Lin, Louis Y. -Z.; Wen, Charles H. -P.; 資訊工程學系; Department of Computer Science
1-一月-2014TASSER: A Temperature-Aware Statistical Soft-Error-Rate Analysis Framework for Combinational CircuitsHsueh, Sung S. -Y.; Huang, Ryan H. -M.; Wen, Charles H. -P.; 電機資訊學士班; Undergraduate Honors Program of Electrical Engineering and Computer Science
2015TASSER: A Temperature-Aware Statistical Soft-Error-Rate Analysis Framework for Combinational CircuitsHsueh, Sung S. -Y.; Huang, Ryan H. -M.; Wen, Charles H. -P.; 電機學院; College of Electrical and Computer Engineering
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