瀏覽 的方式: 作者 Kuo, Chuan-Wei

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公開日期標題作者
30-九月-2020Abnormal hysteresis formation in hump region after positive gate bias stress in low-temperature poly-silicon thin film transistorsTu, Hong-Yi; Chang, Ting-Chang; Tsao, Yu-Ching; Tai, Mao-Chou; Tsai, Yu-Lin; Huang, Shin-Ping; Zheng, Yu-Zhe; Wang, Yu-Xuan; Lin, Chih-Chih; Kuo, Chuan-Wei; Tsai, Tsung-Ming; Wu, Chia-Chuan; Chien, Ya-Ting; Huang, Hui-Chun; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-六月-2019An Energy-Band Model for Dual-Gate-Voltage Sweeping in Hydrogenated Amorphous Silicon Thin-Film TransistorsChen, Guan-Fu; Chen, Hong-Chih; Chang, Ting-Chang; Huang, Shin-Ping; Chen, Hua-Mao; Liao, Po-Yung; Chen, Jian-Jie; Kuo, Chuan-Wei; Lai, Wei-Chih; Chu, Ann-Kuo; Lin, Sung-Chun; Yeh, Cheng-Yen; Chang, Chia-Sen; Tsai, Cheng-Ming; Yu, Ming-Chang; Zhang, Shengdong; 光電工程學系; Department of Photonics
30-十月-2019Investigation of the Capacitance-Voltage Electrical Characteristics of Thin-Film Transistors Caused by Hydrogen Diffusion under Negative Bias Stress in a Moist EnvironmentChen, Hong-Chih; Kuo, Chuan-Wei; Chang, Ting-Chang; Lai, Wei-Chih; Chen, Po-Hsun; Chen, Guan-Fu; Huang, Shin-Ping; Chen, Jian-Jie; Zhou, Kuan-Ju; Shih, Chih-Cheng; Tsao, Yu-Ching; Huang, Hui-Chun; Sze, Simon M.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics