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1-十月-2018A Model-Based-Random-Forest Framework for Predicting V-t Mean and Variance Based on Parallel I-d MeasurementLin, Chien-Hsueh; Tsai, Chih-Ying; Lee, Kao-Chi; Yu, Sung-Chu; Liau, Wen-Rong; Hou, Alex Chun-Liang; Chen, Ying-Yen; Kuo, Chun-Yi; Lee, Jih-Nung; Chao, Mango C. T.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2016Predicting V-t Mean and Variance from Parallel I-d Measurement with Model-Fitting TechniqueTsai, Chih-Ying; Lee, Kao-Chi; Lin, Chien-Hsueh; Yu, Sung-Chu; Liau, Wen-Rong; Hou, Alex Chun-Liang; Chen, Ying-Yen; Kuo, Chun-Yi; Lee, Jih-Nung; Chao, Mango C. -T.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-一月-2017Predicting Vt Variation and Static IR Drop of Ring Oscillators Using Model-Fitting TechniquesHuang, Tzu-Hsuan; Hung, Wei-Tse; Yang, Hao-Yu; Chang, Wen-Hsiang; Chen, Ying-Yen; Kuo, Chun-Yi; Lee, Jih-Nung; Chao, Mango C. -T.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2012以作業序染色體表達法結合維修指派法則求解DFJSP排程問題郭俊儀; Kuo, Chun-Yi; 巫木誠; Wu, Muh-Cherng; 工業工程與管理系所
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