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顯示 1 到 6 筆資料，總共 6 筆
公開日期標題作者
1-四月-20133D surface profile measurement of unsymmetrical microstructure using Fizeau interferometric microscopeYang, Shih-Wei; Lin, Chern-Sheng; Lin, Shir-Kuan; 電控工程研究所; Institute of Electrical and Control Engineering
2014Automatic defect recognition of TFT array process using gray level co-occurrence matrixYang, Shih-Wei; Lin, Chern-Sheng; Lin, Shir-Kuan; Chiang, Hsien-Te; 電控工程研究所; Institute of Electrical and Control Engineering
2-一月-2014AUTOMATIC INSPECTION SYSTEM FOR DEFECTS OF PRINTED ART TILE BASED ON TEXTURE FEATURE ANALYSISYang, Shih-Wei; Lin, Chern-Sheng; Lin, Shir-Kuan; Tseng, Yung-Chin; 電控工程研究所; Institute of Electrical and Control Engineering
2013An automatic optical inspection system for measuring a microlens array with an optical interferometric microscope and genetic algorithmYang, Shih-Wei; Lin, Chern-Sheng; Lin, Shir-Kuan; Fu, Shu-Hsien; Yeh, Mau-Shiun; 電控工程研究所; Institute of Electrical and Control Engineering
1-八月-2013THE CHEMICAL STAIN INSPECTION OF POLYSILICON SOLAR CELL WAFER BY THE FUZZY THEORY METHODLin, Chern-Sheng; Lin, Chih-Wei; Yang, Shih-Wei; Lin, Shir-Kuan; Chiu, Chuang-Chien; 電控工程研究所; Institute of Electrical and Control Engineering
1-八月-2013Design of virtual keyboard using blink control method for the severely disabledYang, Shih-Wei; Lin, Chern-Sheng; Lin, Shir-Kuan; Lee, Chi-Hung; 電控工程研究所; Institute of Electrical and Control Engineering
顯示 1 到 6 筆資料，總共 6 筆