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公開日期標題作者
1-六月-2004Accuracy analysis of the estimated process treld based onS(pk)Pearn, WL; Chuang, CC; 工業工程與管理學系; Department of Industrial Engineering and Management
1-三月-2003An algorithm for calculating the lower confidence bounds of C-PU and C-PL with application to low-drop-out linear regulatorsPearn, WL; Shu, MH; 工業工程與管理學系; Department of Industrial Engineering and Management
1-八月-2003An algorithm for calculating the lower confidence bounds of C-PU and C-PL with application to low-drop-out linear regulators (vol 43, pg 495, 2003)Pearn, WL; Shu, MH; 工業工程與管理學系; Department of Industrial Engineering and Management
1-十一月-2004Algorithms for the wafer probing scheduling problem with sequence-dependent set-up time and due date restrictionsPearn, WL; Chung, SH; Yang, MH; Chen, YH; 交大名義發表; National Chiao Tung University
18-四月-2005Analytic network process (ANP) approach for product mix planning in semiconductor fabricatorChung, SH; Lee, AHI; Pearn, WL; 工業工程與管理學系; Department of Industrial Engineering and Management
1-十一月-1997An application of non-normal process capability indicesChen, KS; Pearn, WL; 工業工程與管理學系; Department of Industrial Engineering and Management
20-十月-2005Approximate solutions for the Maximum Benefit Chinese Postman ProblemPearn, WL; Chiu, WC; 工業工程與管理學系; Department of Industrial Engineering and Management
1-六月-2005Assessing process performance based on the incapability index C-ppLin, PC; Pearn, WL; 工業工程與管理學系; Department of Industrial Engineering and Management
1997The asymptotic distribution of the estimated process capability index (C)over-tilde(pk)Chen, SM; Pearn, WL; 工業工程與管理學系; Department of Industrial Engineering and Management
16-九月-2005A Bayesian approach for assessing process precision based on multiple samplesPearn, WL; Wu, CW; 工業工程與管理學系; Department of Industrial Engineering and Management
1-十月-2005A Bayesian approach to obtain a lower bound for the C-pm capability indexLin, GH; Pearn, WL; Yang, YS; 工業工程與管理學系; Department of Industrial Engineering and Management
1996A Bayesian-like estimator of C-pkPearn, WL; Chen, KS; 工業工程與管理學系; Department of Industrial Engineering and Management
2003A Bayesian-like estimator of the process capability index C-pmkPearn, WL; Lin, GH; 工業工程與管理學系; Department of Industrial Engineering and Management
2005Bootstrap approach for estimating process quality yield with application to light emitting diodesPearn, WL; Chang, YC; Wu, CW; 工業工程與管理學系; Department of Industrial Engineering and Management
2004The C ''(pk) index for asymmetric tolerances: Implications and inferencePearn, WL; Lin, PC; Chen, KS; 工業工程與管理學系; Department of Industrial Engineering and Management
1-五月-2004C-pm MPPAC for manufacturing quality control applied to precision voltage reference processPearn, WL; Shu, MH; Hsu, BM; 工業工程與管理學系; Department of Industrial Engineering and Management
1-七月-2004C-pm MPPAC for manufacturing quality control applied to the precision voltage reference processPearn, WL; Shu, MH; Hsu, BM; 工業工程與管理學系; Department of Industrial Engineering and Management
1-十二月-1997Capability indices for non-normal distributions with an application in electrolytic capacitor manufacturingPearn, WL; Chen, KS; 工業工程與管理學系; Department of Industrial Engineering and Management
1-九月-2001Capability indices for processes with asymmetric tolerancesChen, KS; Pearn, WL; 工業工程與管理學系; Department of Industrial Engineering and Management
2005Capability measure for asymmetric tolerance non-normal processes applied to speaker driver manufacturingPearn, WL; Wu, CW; Wang, KH; 工業工程與管理學系; Department of Industrial Engineering and Management
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