瀏覽 的方式： 作者 Shao, Jinhai
顯示 1 到 3 筆資料，總共 3 筆
| 公開日期 | 標題 | 作者 |
| 四月-2016 | Investigation of Traps at MoS2/Al2O3 Interface in nMOSFETs by Low-Frequency Noise | Yuan, Hui-Wen; Shen, Hui; Li, Jun-Jie; Shao, Jinhai; Huang, Daming; Chen, Yi-Fang; Wang, P. F.; Ding, S. J.; Liu, W. J.; Chin, Albert; Li, Ming-Fu; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 1-五月-2017 | PBTI Investigation of MoS2 n-MOSFET With Al2O3 Gate Dielectric | Yuan, Hui-Wen; Shen, Hui; Li, Jun-Jie; Shao, Jinhai; Huang, Daming; Chen, Yi-Fang; Wang, P. F.; Ding, S. J.; Chin, Albert; Li, Ming-Fu; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 1-一月-2016 | Trapping and Detrapping of Oxide Border Traps in Al2O3 Gate Dielectric in MOS2 n-MOSFETs under PBTI Stress | Yuan, Hui-Wen; Shen, Hui; Li, Jun-Jie; Shao, Jinhai; Huang, Daming; Chen, Yi-Fang; Wang, P. F.; Ding, S. J.; Chin, Albert; Li, Ming-Fu; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
