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公開日期標題作者
1-三月-2003An algorithm for calculating the lower confidence bounds of C-PU and C-PL with application to low-drop-out linear regulatorsPearn, WL; Shu, MH; 工業工程與管理學系; Department of Industrial Engineering and Management
1-八月-2003An algorithm for calculating the lower confidence bounds of C-PU and C-PL with application to low-drop-out linear regulators (vol 43, pg 495, 2003)Pearn, WL; Shu, MH; 工業工程與管理學系; Department of Industrial Engineering and Management
1-五月-2004C-pm MPPAC for manufacturing quality control applied to precision voltage reference processPearn, WL; Shu, MH; Hsu, BM; 工業工程與管理學系; Department of Industrial Engineering and Management
1-七月-2004C-pm MPPAC for manufacturing quality control applied to the precision voltage reference processPearn, WL; Shu, MH; Hsu, BM; 工業工程與管理學系; Department of Industrial Engineering and Management
15-六月-2004Lower confidence bounds for C-PU and C-PL based on multiple samples with application to production yield assurancePearn, WL; Shu, MH; Hsu, BM; 工業工程與管理學系; Department of Industrial Engineering and Management
15-十月-2003Lower confidence bounds with sample size information for C-pm applied to production yield assurancePearn, WL; Shu, MH; 工業工程與管理學系; Department of Industrial Engineering and Management
1-六月-2003Manufacturing capability control for multiple power-distribution switch processes based on modified C-pk MPPACPearn, WL; Shu, MH; 工業工程與管理學系; Department of Industrial Engineering and Management
1-一月-2004Measuring manufacturing capability based on lower confidence bounds of C-pmk applied to current transmitter processPearn, WL; Shu, MH; 工業工程與管理學系; Department of Industrial Engineering and Management
15-六月-2005Monitoring manufacturing quality for multiple Li-BPIC processes based on capability index C-pmkPearn, WL; Shu, MH; Hsu, BM; 工業工程與管理學系; Department of Industrial Engineering and Management
1-十二月-2005Testing process capability based on C-pm in the presence of random measurement errorsPearn, WL; Shu, MH; Hsu, BM; 工業工程與管理學系; Department of Industrial Engineering and Management
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