瀏覽 的方式： 作者 Tsai, Chih-Ying
顯示 1 到 4 筆資料，總共 4 筆
| 公開日期 | 標題 | 作者 |
| 1-一月-2017 | Fast WAT Test Structure for Measuring Vt Variance Based on Latch-based Comparators | Lee, Kao-Chi; Wu, Kai-Chiang; Tsai, Chih-Ying; Chao, Mango Chia-Tso; 資訊工程學系; 電子工程學系及電子研究所; Department of Computer Science; Department of Electronics Engineering and Institute of Electronics |
| 1-十月-2018 | A Model-Based-Random-Forest Framework for Predicting V-t Mean and Variance Based on Parallel I-d Measurement | Lin, Chien-Hsueh; Tsai, Chih-Ying; Lee, Kao-Chi; Yu, Sung-Chu; Liau, Wen-Rong; Hou, Alex Chun-Liang; Chen, Ying-Yen; Kuo, Chun-Yi; Lee, Jih-Nung; Chao, Mango C. T.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 2016 | Predicting V-t Mean and Variance from Parallel I-d Measurement with Model-Fitting Technique | Tsai, Chih-Ying; Lee, Kao-Chi; Lin, Chien-Hsueh; Yu, Sung-Chu; Liau, Wen-Rong; Hou, Alex Chun-Liang; Chen, Ying-Yen; Kuo, Chun-Yi; Lee, Jih-Nung; Chao, Mango C. -T.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 2015 | 利用平行測量與模型化隨機森林預測臨界電壓平均數與變異數 | 蔡知螢; Tsai, Chih-Ying; 趙家佐; Chao, Mango Chia-Tso; 電子工程學系 電子研究所 |
