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顯示 1 到 7 筆資料，總共 7 筆
公開日期標題作者
2012Compact and Low-Loss ESD Protection Design for V-Band RF Applications in a 65-nm CMOS TechnologyChu, Li-Wei; Lin, Chun-Yu; Tsai, Shiang-Yu; Ker, Ming-Dou; Song, Ming-Hsiang; Jou, Chewn-Pu; Lu, Tse-Hua; Tseng, Jen-Chou; Tsai, Ming-Hsien; Hsu, Tsun-Lai; Hung, Ping-Fang; Chang, Tzu-Heng; 交大名義發表; National Chiao Tung University
2012Design of ESD Protection Cell for Dual-Band RF Applications in a 65-nm CMOS ProcessChu, Li-Wei; Lin, Chun-Yu; Tsai, Shiang-Yu; Ker, Ming-Dou; Song, Ming-Hsiang; Jou, Chewn-Pu; Lu, Tse-Hua; Tseng, Jen-Chou; Tsai, Ming-Hsien; Hsu, Tsun-Lai; Hung, Ping-Fang; Chang, Tzu-Heng; Wei, Yu-Lin; 交大名義發表; National Chiao Tung University
1-一月-2013ESD Protection Design for Radio-Frequency Integrated Circuits in Nanoscale CMOS TechnologyLin, Chun-Yu; Chu, Li-Wei; Tsai, Shiang-Yu; Ker, Ming-Dou; Song, Ming-Hsiang; Jou, Chewn-Pu; Lu, Tse-Hua; Tseng, Jen-Chou; Tsai, Ming-Hsien; Hsu, Tsun-Lai; Hung, Ping-Fang; Wei, Yu-Lin; Chang, Tzu-Heng; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2014ESD Protection Design for Wideband RF Applications in 65-nm CMOS ProcessChu, Li-Wei; Lin, Chun-Yu; Ker, Ming-Dou; Song, Ming-Hsiang; Tseng, Jen-Chou; Jou, Chewn-Pu; Tsai, Ming-Hsien; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2012ESD Protection Structure with Inductor-Triggered SCR for RF Applications in 65-nm CMOS ProcessLin, Chun-Yu; Chu, Li-Wei; Ker, Ming-Dou; Song, Ming-Hsiang; Jou, Chewn-Pu; Lu, Tse-Hua; Tseng, Jen-Chou; Tsai, Ming-Hsien; Hsu, Tsun-Lai; Hung, Ping-Fang; Chang, Tzu-Heng; 交大名義發表; National Chiao Tung University
1-八月-2008The Linear Combination Model for the Degradation of Amorphous Silicon Thin Film Transistors under Drain AC StressTai, Ya Hsiang; Tsai, Ming-Hsien; Huang, Shih-Che; 工學院; 光電工程學系; 顯示科技研究所; College of Engineering; Department of Photonics; Institute of Display
1997複晶矽薄膜電晶體電漿鈍化效應及可靠度之研究蔡銘憲; Tsai, Ming-Hsien; 祁甡; Chi, Sien; 光電工程學系
顯示 1 到 7 筆資料，總共 7 筆