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Browsing by Author Wen, Charles H-P

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Showing results 1 to 8 of 8
Issue DateTitleAuthor(s)
1-Jan-2014Advanced Soft-Error-Rate (SER) Estimation with Striking-Time and Multi-Cycle EffectsHuang, Ryan H-M; Wen, Charles H-P; 電機資訊學士班; Undergraduate Honors Program of Electrical Engineering and Computer Science
1-Jan-2017Coupling-Aware Functional Timing Analysis for Tighter Bounds: How Much Margin Can We Relax?Lin, Jack S-Y; Lin, Louis Y-Z; Huang, Ryan H-M; Wen, Charles H-P; 電機工程學系; Department of Electrical and Computer Engineering
1-Jan-2019FAE: Autoencoder-Based Failure Binning of RTL Designs for Verification and DebuggingShen, Cheng-Hsien; Liang, Aaron C-W; Hsu, Charles C-H; Wen, Charles H-P; 電機工程學系; Department of Electrical and Computer Engineering
1-Jan-2018Improving Quality of Experience of Service-Chain Deployment for Multiple UsersWang, I-Chih; Wen, Charles H-P; Chao, H. Jonathan; 電機工程學系; Department of Electrical and Computer Engineering
1-Jan-2019P4-TPG: Accelerating Deterministic Parallel Test Pattern Generation by Preemptive, Proactive, and Preventive SchedulingsLin, Louis Y-Z; Hsu, Charles Chia-Hao; Wen, Charles H-P; 電機工程學系; Department of Electrical and Computer Engineering
1-Jan-2017Radiation-Hardened Designs for Soft-Error-Rate Reduction by Delay-Adjustable D-Flip-FlopsLin, Yuwen (Dave); Wen, Charles H-P; Chiueh, Herming; 電機工程學系; Department of Electrical and Computer Engineering
1-Jan-2017TVM: Tabular VM Migration for Reducing Hop Violations of Service Chains in Cloud DatacentersWu, Ying-Feng; Su, Yu-Lun; Wen, Charles H-P; 電機工程學系; Department of Electrical and Computer Engineering
1-Jan-2018Unleashing Parallelism With Minimal Test Inflation in Multi-Threaded Test Pattern GenerationLin, Louis Y-Z; Wen, Charles H-P; 電機工程學系; Department of Electrical and Computer Engineering
Showing results 1 to 8 of 8