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公開日期標題作者
2013Dependence of Light-Accelerated Instability on Bias and Environment in Amorphous Indium-Gallium-Zinc-Oxide Thin Film TransistorsChen, Yu-Chun; Chang, Ting-Chang; Li, Hung-Wei; Chung, Wan-Fang; Hsieh, Tien-Yu; Chen, Yi-Hsien; Tsai, Wu-Wei; Chiang, Wen-Jen; Yan, Jing-Yi; 光電工程學系; Department of Photonics
1-九月-2013Investigation of gate-bias stress and hot-carrier stress-induced instability of InGaZnO thin-film transistors under different environmentsHsieh, Tien-Yu; Chang, Ting-Chang; Chen, Te-Chih; Tsai, Ming-Yen; Chen, Yu-Te; Jian, Fu-Yen; Lin, Chia-Sheng; Tsai, Wu-Wei; Chiang, Wen-Jen; Yan, Jing-Yi; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-四月-2009Performance of Organic Thin-Film Transistors Controlled by Electrode and Device StructuresYu, Chien-Hsien; Lei, Tan-Fu; Liao, Jin-Long; Yan, Jing-Yi; Ho, Jia-Chong; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-一月-2009Perylenetetracarboxylic di-imide-based bottom-contact devices: A study on two kinds of source/drain electrodes, ITO and MoWKao, Chia-Chun; Lin, Pang; Shen, Yu-Yuan; Yan, Jing-Yi; Ho, Jia-Chong; Lee, Cheng-Chung; Chan, Li-Hsin; 材料科學與工程學系; Department of Materials Science and Engineering
28-十一月-2013Reduction of defect formation in amorphous indium-gallium-zinc-oxide thin film transistors by N2O plasma treatmentJhu, Jhe-Ciou; Chang, Ting-Chang; Chang, Geng-Wei; Tai, Ya-Hsiang; Tsai, Wu-Wei; Chiang, Wen-Jen; Yan, Jing-Yi; 光電工程學系; Department of Photonics
1-五月-2008Solid-state structure of the naphthalene-based n-type semiconductor, and performance improved with Mo-based source/drain electrodesKao, Chia-Chun; Lin, Pang; Shen, Yu-Yuan; Yan, Jing-Yi; Ho, Jia-Chong; Lee, Cheng-Chung; Chan, Li-Hsin; 材料科學與工程學系; Department of Materials Science and Engineering
顯示 1 到 6 筆資料，總共 6 筆