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Photogeneration of coherent shear phonons in orientated wurtzite semiconductors by piezoelectric coupling
(2009-11-01)
Wen, Yu-Chieh
;
Ko, Tsung-Shine
;
Lu, Tien-Chang
;
Kuo, Hao-Chung
;
Chyi, Jen-Inn
Using piezoelectric wurtzite semiconductor with accurate control of the crystal cut, we investigate the photogeneration of coherent shear acoustic phonons through anisotropic piezoelectric coupling. Theoretical study suggests the dominant contribution of the piezoelectric effect to the shear phonon generation in a-plane wurtzite GaN, which is also confirmed by the picosecond ultrasonic experiments with different dopant and excitation conditions. Piezoelectric transduction thus explains the observed remarkable coherent shear phonon signal. The influence of the ultrafast screening of surface electric field by photocarriers on the intensity and waveform of the generated shear acoustic pulse are discussed.
Continuous wave operation of current injected GaN vertical cavity surface emitting lasers at room temperature
(2010-08-16)
Lu, Tien-Chang
;
Chen, Shih-Wei
;
Wu, Tzeng-Tsong
;
Tu, Po-Min
;
Chen, Chien-Kang
We report the demonstration of the continuous wave laser action on GaN-based vertical cavity surface emitting lasers at room temperature. The laser structure consists of a ten-pair Ta(2)O(5)/SiO(2) distributed Bragg reflector (DBR), a 7 lambda-thick optical cavity, ten-pairs InGaN/GaN multiquantum wells with an AlGaN electron blocking layer, and a 29-pair AlN/GaN DBR. The laser has a threshold current of about 9.7 mA corresponding to the current density of about 12.4 kA/cm(2) and a turn-on voltage about 4.3 V at 300 K. The lasing wavelength was 412 nm with a linewidth of about 0.5 nm. A spontaneous emission coupling efficiency factor of about 5x10(-3) and the degree of polarization of about 55% were measured, respectively. The laser beam has a narrow divergence angle of about 8 degrees. (C) 2010 American Institute of Physics. [doi:10.1063/1.3483133]
High-gain complementary inverter with InGaZnO/pentacene hybrid ambipolar thin film transistors
(2010-08-23)
Liu, Po-Tsun
;
Chou, Yi-Teh
;
Teng, Li-Feng
;
Fuh, Chur-Shyang
;
光電工程學系
Ambipolar thin film transistors (TFTs) with InGaZnO/pentacene heterostructure channels are demonstrated for a high-voltage-gain complementary metal oxide semiconductor (CMOS) inverter. The ambipolar TFT exhibits a electron mobility of 23.8 cm(2)/V s and hole mobility of 0.15 cm(2)/V s for the InGaZnO and pentacene, respectively. The thermal annealing process was also studied to adjust electron concentration reducing operating voltage of the CMOS inverter. The voltage gain achieves as high as 60 obtained in the first and third quadrants of the voltage transfer characteristic. The high performance and simple manufacture of the heterostructure CMOS inverter show promise as critical components in various electrical applications. (C) 2010 American Institute of Physics. [doi:10.1063/1.3483616]
Characteristics of emission polarization in a-plane nanorods embedded with InGaN/GaN multiple quantum wells
(2010-09-15)
Li, J. C.
;
Lu, T. C.
;
Huang, H. M.
;
Chan, W. W.
;
Kuo, H. C.
Nonpolar (a-plane) GaN nanorod arrays with embedded In(x)Ga(1-x)N/GaN (x=0.09, 0.14, 0.24, and 0.30) multiple quantum wells (MQWs) grown on r-plane sapphire have been fabricated successfully by self-assembled Ni nanomasks and subsequent inductively coupled plasma reactive-ion etching. After nanorod fabrications, the polarization ratio of the emission from MQWs with lower indium composition (x=0.09 and 0.14) slightly decreases but apparently increases by at most 79% for the samples with higher indium composition (x=0.24 and 0.30). Competition between the effect of multiple scattering, strain relaxation and reduction in localized centers, expected in a-plane MQW samples, are attributed to the variations in the polarization ratios after the nanorod formation. (c) 2010 American Institute of Physics. [doi:10.1063/1.3483239]
Regrowth of High Quality Heavily Si-Doped nGaN Utilizing Nano-Rod GaN Template
(2011)
Kuo, Cheng-Huang
;
Chang, Li-Chuan
;
Chou, Hsiu-Mei
;
照明與能源光電研究所
;
Institute of Lighting and Energy Photonics
In this study, heavily Si-doped n-type GaN (n-GaN) epitaxial layers with and without nanorod GaN (NR GaN) template were grown by metal organic chemical vapor deposition (MOCVD) system. It was found that we could achieve high-qulaity heavily Si-doped n-GaN layers by using the NR GaN template. It was also found that we can reduce etching pits density in n-GaN (1.5E19 cm(-3)) epitaxial layer by a factor of 2.82 using the NR GaN template, as compared to the conventional sapphire substrate. (C) 2011 The Electrochemical Society. [DOI: 10.1149/1.3617533] All rights reserved.
Effects of Laser Sources on Damage Mechanisms and Reverse-Bias Leakages of Laser Lift-Off GaN-Based LEDs
(2009)
Cheng, Ji-Hao
;
Wu, YewChung Sermon
;
Peng, Wei Chih
;
Ouyang, Hao
;
材料科學與工程學系
The frequency-tripled neodymium-doped yttrium aluminum garnet laser (355 nm) and the KrF pulsed excimer laser (248 nm) were employed to separate GaN thin films from sapphire substrates and to transfer the films to bond with other substrates. The different laser lift-off processes would generate the dislocation density on different regions. In this study, the effects of these two laser sources on structural damage mechanisms and reverse-bias leakages of InGaN-GaN light-emitting diodes (LEDs) were studied.
Size-dependent strain relaxation in InN islands grown on GaN by metalorganic chemical vapor deposition
(2009-02-09)
Tsai, Wen-Che
;
Lin, Feng-Yi
;
Ke, Wen-Cheng
;
Lu, Shu-Kai
;
Cheng, Shun-Jen
We report Raman measurements on InN islands grown on GaN by metalorganic chemical vapor deposition. The Raman frequency of the InN E(2) mode is found to decrease exponentially with the island's aspect ratio, indicating a size dependent strain relaxation during the island formation. Our results suggest that most of the strain at the InN-GaN interface have been released plastically during the initial stage of island formations. After that, the residual strain of only -3.5x10(-3) is further relaxed elastically via surface islanding. The experimental data are in agreement with the strain relaxation predicted from a simplified model analysis as well as three-dimensional finite-element simulations.
Effects of thermal annealing on the emission properties of type-II InAs/GaAsSb quantum dots
(2009-02-02)
Liao, Yu-An
;
Hsu, Wei-Ting
;
Chiu, Pei-Chin
;
Chyi, Jen-Inn
;
Chang, Wen-Hao
We report the effects of thermal annealing on the emission properties of type-II InAs quantum dots (QDs) covered by a thin GaAs(1-x)Sb(x) layer. Apart from large blueshifts and a pronounced narrowing of the QD emission peak, the annealing induced alloy intermixing also leads to enhanced radiative recombination rates and reduced localized states in the GaAsSb layer. Evidences of the evolution from type-II to type-I band alignments are obtained from time-resolved and power-dependent photoluminescence measurements. We demonstrate that postgrowth thermal annealing can be used to tailor the band alignment, the wave function overlaps, and hence the recombination dynamics in the InAs/GaAsSb type-II QDs.
Large vacuum Rabi splitting in ZnO-based hybrid microcavities observed at room temperature
(2009-02-09)
Chen, Jun-Rong
;
Lu, Tien-Chang
;
Wu, Yung-Chi
;
Lin, Shiang-Chi
;
Liu, Wei-Rein
Wide-band gap ZnO semiconductors are attractive materials for the investigation of microcavity exciton polaritons due to the large exciton binding energy and oscillator strength. We report the growth and characterization of bulk ZnO-based hybrid microcavity. The phenomenon of strong exciton-photon coupling at room temperature has been observed in the ZnO-based hybrid microcavity structure, which consists of 30 pair epitaxially grown AlN/AlGaN distributed Bragg reflector (DBR) on the bottom side of the 3/2 lambda thick ZnO cavity and 9 pair SiO(2)/HfO(2) DBR as the top mirror. The cavity quality factor is about 221. The experimental results show good agreement with theoretically calculated exciton-polariton dispersion curves based on transfer matrix method. From the theoretical and experimental exciton-polariton dispersion curves with two different cavity-exciton detuning values, the large vacuum Rabi splitting is estimated to be about 58 meV in the ZnO-based hybrid microcavity.
Optical properties of a-plane InGaN/GaN multiple quantum wells on r-plane sapphire substrates with different indium compositions
(2009-03-15)
Chiu, C. H.
;
Kuo, S. Y.
;
Lo, M. H.
;
Ke, C. C.
;
Wang, T. C.
A-plane In(x)Ga(1-x)N/GaN (x=0.09, 0.14, 0.24, and 0.3) multiple-quantum-wells (MQWs) samples, with a well width of about 4.5 nm, were achieved by utilizing r-plane sapphire substrates. Optical quality was investigated by means of photoluminescence (PL), cathodoluminescence, and time resolved PL measurements (TRPL). Two distinguishable emission peaks were examined from the low temperature PL spectra, where the high- and low-energy peaks were ascribed to quantum wells and localized states, respectively. Due to an increase in the localized energy states and absence of quantum confined Stark effect, the quantum efficiency was increased with increasing indium composition up to 24%. As the indium composition reached 30%, however, pronounced deterioration in luminescence efficiency was observed. The phenomenon could be attributed to the high defect densities in the MQWs resulted from the increased accumulation of strain between the InGaN well and GaN barrier. This argument was verified from the much shorter carrier lifetime at 15 K and smaller activation energy for In(0.3)Ga(0.7)N/GaN MQWs. In addition, the polarization-dependent PL revealed that the degree of polarization decreased with increasing indium compositions because of the enhancement of zero-dimensional nature of the localizing centers. Our detailed investigations indicate that the indium content in a-plane InGaN/GaN MQWs not only has an influence on optical performance, but is also important for further application of nitride semiconductors.

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