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收集所有交通大學研究人員與學生個人或團體所發表之各項學術著作，涵蓋期刊論文、教師專書、學位論文等項。;;Collections of Publications of NCTU Researchers and Students Like Journal Papers and Thesis.

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Author: search.filters.author.Chen, W. L.Subject: search.filters.subject.Time domain reflectometry (TDR)

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    Pad Characterization for CMOS Technology Using Time Domain Reflectometry
    (2008)
    Chiu, C. S.
    ;
    Chen, W. L.
    ;
    Liao, K. H.
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    Chen, B. Y.
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    Teng, Y. M.
    The pad structure of CMOS technology is characterized by way of time domain reflectometry measurement. Using the on-wafer TDR measurement system, the capacitance of the pad in the CMOS process was extracted and estimated. Measured and Simulated TDR data are also presented in this study. The capacitance is estimated when the curve is fitted by mathematical tool. This method is simple to use, and furthermore the results agree with data extracted from vector network analyzer.