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收集所有交通大學研究人員與學生個人或團體所發表之各項學術著作,涵蓋期刊論文、教師專書、學位論文等項。;;Collections of Publications of NCTU Researchers and Students Like Journal Papers and Thesis.
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Item type:Item, Single-crystalline aluminum film for ultraviolet plasmonic nanolasers(2016-01-27) ;Chou, Bo-Tsun ;Chou, Yu-Hsun ;Wu, Yen-Mo ;Chung, Yi-ChengHsueh, Wei-JenSignificant advances have been made in the development of plasmonic devices in the past decade. Plasmonic nanolasers, which display interesting properties, have come to play an important role in biomedicine, chemical sensors, information technology, and optical integrated circuits. However, nanoscale plasmonic devices, particularly those operating in the ultraviolet regime, are extremely sensitive to the metal and interface quality. Thus, these factors have a significant bearing on the development of ultraviolet plasmonic devices. Here, by addressing these material-related issues, we demonstrate a low-threshold, high-characteristic-temperature metal-oxide-semiconductor ZnO nanolaser that operates at room temperature. The template for the ZnO nanowires consists of a flat single-crystalline Al film grown by molecular beam epitaxy and an ultrasmooth Al2O3 spacer layer synthesized by atomic layer deposition. By effectively reducing the surface plasmon scattering and metal intrinsic absorption losses, the high-quality metal film and the sharp interfaces formed between the layers boost the device performance. This work should pave the way for the use of ultraviolet plasmonic nanolasers and related devices in a wider range of applications.Item type:Item, Surface roughness effects on aluminium-based ultraviolet plasmonic nanolasers(2017-01-03) ;Chung, Yi-Cheng ;Cheng, Pi-Ju ;Chou, Yu-Hsun ;Chou, Bo-TsunHong, Kuo-BinWe systematically investigate the effects of surface roughness on the characteristics of ultraviolet zinc oxide plasmonic nanolasers fabricated on aluminium films with two different degrees of surface roughness. We demonstrate that the effective dielectric functions of aluminium interfaces with distinct roughness can be analysed from reflectivity measurements. By considering the scattering losses, including Rayleigh scattering, electron scattering, and grain boundary scattering, we adopt the modified Drude-Lorentz model to describe the scattering effect caused by surface roughness and obtain the effective dielectric functions of different Al samples. The sample with higher surface roughness induces more electron scattering and light scattering for SPP modes, leading to a higher threshold gain for the plasmonic nanolaser. By considering the pumping efficiency, our theoretical analysis shows that diminishing the detrimental optical losses caused by the roughness of the metallic interface could effectively lower (-33.1%) the pumping threshold of the plasmonic nanolasers, which is consistent with the experimental results.Item type:Item, Single-crystalline silver film grown on Si (100) substrate by using electron-gun evaporation and thermal treatment(2014-05-01) ;Chou, Bo-Tsun ;Lin, Sheng-Di ;Huang, Bo-Hao ;Lu, Tien-Chang電子工程學系及電子研究所The authors demonstrate a simple method to fabricate ultrasmooth single-crystalline silver (Ag) films with high reflectivity and low plasmonic damping. The single-crystalline Ag thin film on the clean Si (100) substrate is first deposited by electron-gun evaporator and then treated by rapid thermal annealing (RTA) to improve its quality. The crystal structure and surface morphology are characterized by x-ray diffraction, transmission electron microscopy, and atomic force microscopy. Optical constants of the prepared films are extracted by fitting the measured reflectivity spectra with the Drude model. These results show that the Ag film with 340 degrees C RTA has the best film quality, including small surface roughness of 0.46 nm, a sharp x-ray diffraction peak with FWHM of 0.3 degrees, and lowest damping in the visible and near-infrared wavelength regime. Therefore, our method is not only cost-effective but also useful for fabricating metal-based plasmonic and nanophotonic devices. (C) 2014 American Vacuum Society.